JPS63135171U - - Google Patents

Info

Publication number
JPS63135171U
JPS63135171U JP2680887U JP2680887U JPS63135171U JP S63135171 U JPS63135171 U JP S63135171U JP 2680887 U JP2680887 U JP 2680887U JP 2680887 U JP2680887 U JP 2680887U JP S63135171 U JPS63135171 U JP S63135171U
Authority
JP
Japan
Prior art keywords
electrode
circular
electrodes
pair
resistance measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2680887U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2680887U priority Critical patent/JPS63135171U/ja
Publication of JPS63135171U publication Critical patent/JPS63135171U/ja
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aは本考案の一実施例装置の構造を示す
平面図、第1図bは第1図aのX―X′線に沿う
平面で切断した断面図、第2図a及びbはそれぞ
れ従来装置の構造例を示す平面図及び断面図であ
る。 1……オーミツク接触した電極(小電極)、2
……オーミツク接触した電極、3……絶縁膜、4
……半導体基板、A……電極2の外部引き出し用
パツド金属層、B……オーミツク電極1を連絡す
る金属層。
Fig. 1a is a plan view showing the structure of an embodiment of the device of the present invention, Fig. 1b is a cross-sectional view taken along the line XX' of Fig. 1a, and Figs. FIG. 2 is a plan view and a cross-sectional view, respectively, showing a structural example of a conventional device. 1... Electrode in ohmic contact (small electrode), 2
...Electrode in ohmic contact, 3...Insulating film, 4
. . . Semiconductor substrate, A . . . Pad metal layer for external extraction of electrode 2, B . . . Metal layer connecting ohmic electrode 1.

Claims (1)

【実用新案登録請求の範囲】 接触比抵抗測定の対象となる半導体基板上に形
成した抵抗測定用の1対の電極を備え、 該1対の電極の一方の電極は円形または矩形に
し、他方の電極は上記円形または矩形電極の外側
に該電極をとり囲むように配置された複数個の電
極を、金属によつて連結して構成したことを特徴
とする接触比抵抗測定装置。
[Claims for Utility Model Registration] A device comprising a pair of electrodes for resistance measurement formed on a semiconductor substrate to be subjected to contact specific resistance measurement, one electrode of the pair of electrodes having a circular or rectangular shape, and the other electrode having a circular or rectangular shape. A contact resistivity measuring device characterized in that the electrode is constituted by a plurality of electrodes arranged outside the circular or rectangular electrode so as to surround the electrode and connected by metal.
JP2680887U 1987-02-24 1987-02-24 Pending JPS63135171U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2680887U JPS63135171U (en) 1987-02-24 1987-02-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2680887U JPS63135171U (en) 1987-02-24 1987-02-24

Publications (1)

Publication Number Publication Date
JPS63135171U true JPS63135171U (en) 1988-09-05

Family

ID=30828239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2680887U Pending JPS63135171U (en) 1987-02-24 1987-02-24

Country Status (1)

Country Link
JP (1) JPS63135171U (en)

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