JPS63117226A - Infrared ray detector - Google Patents

Infrared ray detector

Info

Publication number
JPS63117226A
JPS63117226A JP61262364A JP26236486A JPS63117226A JP S63117226 A JPS63117226 A JP S63117226A JP 61262364 A JP61262364 A JP 61262364A JP 26236486 A JP26236486 A JP 26236486A JP S63117226 A JPS63117226 A JP S63117226A
Authority
JP
Japan
Prior art keywords
infrared
reflecting member
infrared rays
detection element
dewar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61262364A
Other languages
Japanese (ja)
Inventor
Satoshi Wakabayashi
諭 若林
Toru Tajime
田治米 徹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61262364A priority Critical patent/JPS63117226A/en
Publication of JPS63117226A publication Critical patent/JPS63117226A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To dispense with a cold shield and to shorten the time required in cooling, by setting a spherical infrared ray reflecting member having an opening part introducing infrared rays to be measured to that the center of the curvature thereof is positioned in the vicinity of a detection element. CONSTITUTION:A spherical infrared ray reflecting member 8 has a Dewar window 2 for introducing infrared rays 7 to be measured. Since the unnecessary infrared rays 9 incident from the circumferential background of Dewar 1 is blocked by the reflecting member 8, the increase in noise can be suppressed. Since a detection element 3 is positioned in the vicinity of the center of the curvature of the reflecting member 8, the image due to the reflection of the reflecting member 8 is generated on the element 3 and the mount substrate 6 in the vicinity thereof. Therefore, only the unnecessary infrared rays 10 emitted from the element 3 and from the vicinity thereof are incident to the element 3 by the reflection of the reflecting member 8 and unnecessary infrared rays from other part are not incident thereto. Moreover, since the radiation quantity of infrared rays from the element 3 and the substrate 6 is sufficiently little, the increase in noise can be suppressed. By this constitution, since this detector has the same noise reducing action as the case using a cold shield and the cold shield becomes unnecessary, a cooling time can be reduced.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は例えば赤外線撮像装置などに用いられる赤外
線検出器に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an infrared detector used, for example, in an infrared imaging device.

[従来の技術] 第3図は例えばミシガンのエンバイロメンタル・リサー
チ・インステチュート(The Environmen
talResaach In5titute of M
ichigan)から1978年発行のオルソ・ジシイ
ス著(Id、L、lN0LFE、G、J、ZISSIS
) r赤外線ハンドブックJ(The Infrare
d Handbook)のP15〜18に示された従来
の赤外線検出器の断面図である。図において(1)は二
重壁でできた容器で。
[Prior Art] FIG. 3 shows, for example, the environmental research institute in Michigan.
talResaach In5titude of M
Id, L, lN0LFE, G, J, ZISSIS, published in 1978 by
) r Infrared Handbook J (The Infrare
d) is a sectional view of a conventional infrared detector shown in pages 15 to 18 of Handbook. In the figure, (1) is a container made of double walls.

以下これをデユワ−(Dewar)という。(2)はデ
ユワ−窓、(3)は量子形赤外線検出素子(以下これを
検出素子という)、 (4)はコールドシールド、(5
)は冷媒が満たされる容器、(6)は前記検出素子(3
)の取り付は基板、(7)は被測定赤外線である。なお
、上記容器(5)はこれに注入された冷媒で冷却されて
おり、これにより検出素子(3)の検出感度を増大して
いる。また、コールドシールド(4)は取り付は基板(
6)に固着され、そして上記検出素子(3)と同様に冷
却される。なお、デユワ−(1)の壁と壁との間は検出
素子(3)、コールドシールド(4)の冷却を効率よく
行うために排気され、そして真空に面した壁面は熱線を
反射するようにされている。
Hereinafter, this will be referred to as Dewar. (2) is a dewar window, (3) is a quantum infrared detection element (hereinafter referred to as the detection element), (4) is a cold shield, (5)
) is a container filled with refrigerant, and (6) is the detection element (3).
) is attached to the board, and (7) is the infrared ray to be measured. Note that the container (5) is cooled by a refrigerant injected into it, thereby increasing the detection sensitivity of the detection element (3). Also, the cold shield (4) is attached to the board (
6) and cooled in the same manner as the detection element (3) described above. The space between the walls of the dewar (1) is evacuated to efficiently cool the detection element (3) and cold shield (4), and the wall surface facing the vacuum is designed to reflect heat rays. has been done.

従来の赤外線検出器は上記のように構成され、そして被
測定赤外線(7)はデユワ−窓(2)、コールドシール
ド(4)の開口部を通して検出素子(3)に入射され、
これが検出される。ここで、前記コールドシールド(4
)は常温の周囲背景から放射される不要赤外線が検出素
子(3)に入射するのを防ぎ、これにより検出素子(3
)の雑音を低減するものである。したがって、前記コー
ルドシールド(4)は表面の放射率を高くするとともに
低温に冷却されているので、前記コールドシールド(4
)の表面から放射される不要の赤外線放射量は前記被測
定赤外線(7)に比して無視できるほどに低減される。
A conventional infrared detector is constructed as described above, and the infrared rays to be measured (7) are incident on the detection element (3) through the dewar window (2) and the opening of the cold shield (4).
This is detected. Here, the cold shield (4
) prevents unnecessary infrared rays emitted from the ambient background at room temperature from entering the detection element (3).
) to reduce noise. Therefore, the cold shield (4) has a high surface emissivity and is cooled to a low temperature.
The amount of unnecessary infrared radiation emitted from the surface of ) is reduced to a negligible level compared to the infrared radiation to be measured (7).

[発明が解決しようとする問題点コ 上記のような従来の赤外線検出器では、雑音の低減を図
るために検出素子のみならず、コールドシールドも冷却
する必要があった。このため、冷媒に対する熱負荷が大
きくなるので、検出素子、コールドシールドを所定の温
度に冷却するのに要する時間が長くなるという問題点が
あった。特に赤外線誘導ミサイルに用いられる赤外線検
出器では数秒で所定の温度まで冷却する必要があり、そ
のため冷却に要する時間が長いということを致命的な問
題点であった。
[Problems to be Solved by the Invention] In the conventional infrared detector as described above, it was necessary to cool not only the detection element but also the cold shield in order to reduce noise. This increases the thermal load on the refrigerant, resulting in a problem that the time required to cool the detection element and the cold shield to a predetermined temperature increases. Infrared detectors used in infrared guided missiles in particular need to be cooled down to a predetermined temperature within a few seconds, and the long time it takes to cool them down is a fatal problem.

この発明は、かかる問題点を解消するためになされたも
ので、コールドシールドを省略するとともに、これを用
いたときと同等の雑音低減作用をもたせたまま、冷却に
要する時間を大幅に短縮することを目的とする。
This invention was made to solve these problems, and it is possible to omit the cold shield and significantly shorten the time required for cooling while maintaining the same noise reduction effect as when using the cold shield. With the goal.

[問題点を解決するための手段] この発明に係る赤外線検出器は、被測定赤外線を導入す
るための開口部を有する球面状の赤外線反射部材を、そ
の曲率中心が検出素子近傍に位置するように設定したも
のである。
[Means for Solving the Problems] The infrared detector according to the present invention includes a spherical infrared reflecting member having an opening for introducing infrared rays to be measured so that its center of curvature is located near the detection element. It is set to .

[作 用コ この発明においては、赤外線反射部材によって反射され
検出素子に入射する赤外線は検出素子、及びその近傍か
ら放射される少ない赤外線のみであり、他の部分からの
不要赤外線は検出素子に入射しないので、コールドシー
ルドを用いたと同等の雑音低減作用をもつ。また、コー
ルドシールドが不要となるので冷却に要する時間が短縮
される。
[Function] In this invention, only a small amount of infrared rays reflected by the infrared reflecting member and incident on the detection element is emitted from the detection element and its vicinity, and unnecessary infrared rays from other parts are not incident on the detection element. Therefore, it has the same noise reduction effect as using a cold shield. Furthermore, since a cold shield is not required, the time required for cooling is shortened.

[実施例コ 第1図はこの発明の一実施例を示す構成図であり、(1
)〜(3) (5)〜(7)は上記第3図に示した従来
装置の素子とほぼ同一の素子である。(8)は赤外線反
射部材、(9)(10)は不要な赤外線である。ここで
、前記赤外線反射部材(8)は球面状をしており、そし
て被測定赤外線(7)を導入するためのデユワ−窓(2
)をもっている。まお、前記赤外線反射部材(8)はそ
の曲率中心が検出素子(3)の近傍に位置するよう取り
付は基板(6)上に設置されていることは勿論である。
[Embodiment FIG. 1 is a block diagram showing an embodiment of the present invention, and (1
) to (3) and (5) to (7) are substantially the same elements as those of the conventional device shown in FIG. 3 above. (8) is an infrared reflecting member, and (9) and (10) are unnecessary infrared rays. Here, the infrared reflecting member (8) has a spherical shape, and a dewar window (2) for introducing the infrared ray to be measured (7).
). Of course, the infrared reflecting member (8) is mounted on the substrate (6) so that its center of curvature is located near the detecting element (3).

上記のように構成された赤外線検出器においては、デユ
ワ−(1)の周囲背景から入射される不要赤外線(9)
が赤外線反射部材(8)で遮断されるので、雑音の増加
が抑制できる。次にデユワ−(1)内から放射した不要
赤外線(10)の影響について説明する。まず、検出素
子(3)が検外線反射部材(8)の曲率中心近傍に位置
しているので、赤外線反射部材(8)の反射による検出
素子(3)の像は、検出素子(3)及びその近傍の取り
付は基板(6)上に生じる。このことは検出素子(3)
及びその近傍から放射された不要赤外線(10)だけが
赤外線反射部材(8)の反射によって検出素子(3)に
入射し、他からの不要反射赤外線は入射しないことを意
味する。しかも、これら検出素子(3)及び取り付は基
板(6)からの赤外線放射量は充分小さいので、雑音の
増加が抑制できる。
In the infrared detector configured as above, unnecessary infrared rays (9) incident from the background surrounding the dewar (1)
Since the infrared rays are blocked by the infrared reflecting member (8), an increase in noise can be suppressed. Next, the influence of unnecessary infrared rays (10) radiated from inside the dewar (1) will be explained. First, since the detection element (3) is located near the center of curvature of the detection line reflecting member (8), the image of the detection element (3) due to reflection by the infrared reflection member (8) is the same as that of the detection element (3) and Mounting in its vicinity occurs on the substrate (6). This means that the detection element (3)
This means that only unnecessary infrared rays (10) emitted from the vicinity thereof enter the detection element (3) by reflection by the infrared reflecting member (8), and unnecessary reflected infrared rays from other sources do not enter. Moreover, since the amount of infrared radiation from the substrate (6) in these detection elements (3) and their mounting is sufficiently small, an increase in noise can be suppressed.

ここで、前記赤外線反射部材(8)の放射率は小さいの
で、赤外線反射部材(8)自身からの不要赤外線放射量
は小さく、この影響による雑音の増加は無視できる。ま
た、検出素子(3)の近傍の取り付は基板(6)上に電
極等の高反射率部分が設けられた場合、デユワ−(1)
内外の常温部分から放射された不要赤外線のデユワ−(
1)内における多重反射により、前記高反射率部分の電
極等に入射し、これが反射された後、赤外線反射部材(
8)で再反射されて、検出素子(3)に入射する可能性
がある。
Here, since the emissivity of the infrared reflecting member (8) is small, the amount of unnecessary infrared radiation from the infrared reflecting member (8) itself is small, and the increase in noise due to this influence can be ignored. In addition, when mounting near the detection element (3), if a high reflectivity part such as an electrode is provided on the substrate (6), the dewar (1)
Dewars unnecessary infrared rays emitted from normal temperature parts inside and outside (
1) Due to multiple reflections within the infrared reflecting member (
8) and may enter the detection element (3).

この場合、前記高反射部分の電極等を例えばペンキ等の
絶縁性赤外線吸収層で被覆するとその影響を除去するこ
とができる。
In this case, the effect can be removed by covering the electrodes and the like in the highly reflective portions with an insulating infrared absorbing layer such as paint.

第2図はこの発明による他の実施例を示す断面図である
。デユワ−窓(2)は球面状をしており、そしてデユワ
−窓(2)の内面は被測定赤外線(7)を導入する開口
部分を残して赤外線反射部材(8)で被覆されている。
FIG. 2 is a sectional view showing another embodiment of the present invention. The dewar window (2) has a spherical shape, and the inner surface of the dewar window (2) is covered with an infrared reflecting member (8), leaving an opening for introducing the infrared rays (7) to be measured.

なお、赤外線反射部材(8)の曲率中心が検出素子(3
)の近傍に位置するように取り付けることにより、上記
第1実施例と同様の動作をなす。
Note that the center of curvature of the infrared reflecting member (8) is located at the detection element (3).
), the same operation as in the first embodiment can be achieved.

なお、上記説明ではデユワ−窓(2)の内面を赤外線反
射部材(8)で被覆した場合について述べたが、デユワ
−創(2)の外面を赤外線反射部材(8)で被覆しても
同様の動作をなす。ただしこの場合、赤外線反射部材(
8)で被覆された部分のデユワ−窓(2)自身の内面か
ら放射する不要赤外線が雑音源に加わるので、その分だ
け雑音は増加する。しかしデユワ−窓(2)の放射率は
小さいので、雑音増加量は小さく実用上問題はない。
Although the above explanation deals with the case where the inner surface of the dewar window (2) is covered with the infrared reflecting member (8), the same effect can be obtained even if the outer surface of the dewar window (2) is covered with the infrared reflecting member (8). perform the following actions. However, in this case, the infrared reflective member (
Since unnecessary infrared rays emitted from the inner surface of the dewar window (2) itself in the portion covered by 8) is added to the noise source, the noise increases accordingly. However, since the emissivity of the dewar window (2) is small, the increase in noise is small and poses no problem in practice.

[発明の効果コ この発明は以上説明したとおり、球面状の赤外線反射部
材を取り付けるという簡単な構造により、コールドシー
ルドと同等の雑音低減を行うので。
[Effects of the Invention] As explained above, this invention achieves the same noise reduction as a cold shield through a simple structure of attaching a spherical infrared reflecting member.

コールドシールドが不要となり、そのため冷却に要する
時間が大幅に短縮される。
A cold shield is not required, which greatly reduces the time required for cooling.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例を示す断面図、第2図はこ
の発明の他の実施例を示す断面図、第3図は従来の赤外
線検出器を示す断面図である。 図中、(1)はデユワ−1(2)はデユワ−窓、(3)
は址子形赤外線検出素子、(5)は冷媒容器(冷却手段
)、(6)は取り付は基板、(7)は被測定赤外線、(
8)は赤外線反射部材、(9) (10)は不要赤外線
である。 なお、図中同一符号は同−或は相当部分を示す。
FIG. 1 is a sectional view showing one embodiment of the present invention, FIG. 2 is a sectional view showing another embodiment of the invention, and FIG. 3 is a sectional view showing a conventional infrared detector. In the figure, (1) is a dewar window, (2) is a dewar window, and (3) is a dewar window.
(5) is a refrigerant container (cooling means), (6) is mounted on a board, (7) is an infrared ray to be measured, (
8) is an infrared reflecting member, and (9) and (10) are unnecessary infrared rays. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (2)

【特許請求の範囲】[Claims] (1)内部が真空状態にされたデュワー窓をもつデュワ
ーと、このデュワー内部に設置された量子形赤外線検出
素子と、この量子形赤外線検出素子の冷却手段とを備え
た赤外線検出器において、被測定赤外線を上記量子形赤
外線検出素子に導入するための開口部をもつ球面状の赤
外線反射部材を備え、そしてその曲率中心が上記量子形
赤外線検出素子の近傍に位置するよう前記量子形赤外線
検出器を基板上に設置したことを特徴とする赤外線検出
器。
(1) In an infrared detector equipped with a dewar having a dewar window whose interior is in a vacuum state, a quantum infrared detection element installed inside the dewar, and cooling means for the quantum infrared detection element, The quantum infrared detector includes a spherical infrared reflecting member having an opening for introducing measurement infrared rays into the quantum infrared detecting element, and the center of curvature of the infrared reflecting member is located near the quantum infrared detecting element. An infrared detector characterized in that the is installed on a substrate.
(2)量子形赤外線検出素子を取り付けた基板近傍にお
ける高反射率部分を、絶縁性赤外線吸収層で被覆したこ
とを特徴とする特許請求の範囲第1項記載の赤外線検出
器。
(2) The infrared detector according to claim 1, characterized in that a high reflectance portion in the vicinity of the substrate to which the quantum infrared detecting element is attached is coated with an insulating infrared absorbing layer.
JP61262364A 1986-11-04 1986-11-04 Infrared ray detector Pending JPS63117226A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61262364A JPS63117226A (en) 1986-11-04 1986-11-04 Infrared ray detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61262364A JPS63117226A (en) 1986-11-04 1986-11-04 Infrared ray detector

Publications (1)

Publication Number Publication Date
JPS63117226A true JPS63117226A (en) 1988-05-21

Family

ID=17374714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61262364A Pending JPS63117226A (en) 1986-11-04 1986-11-04 Infrared ray detector

Country Status (1)

Country Link
JP (1) JPS63117226A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111551263A (en) * 2020-04-02 2020-08-18 武汉高芯科技有限公司 Dewar assembly of detector and focal plane detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111551263A (en) * 2020-04-02 2020-08-18 武汉高芯科技有限公司 Dewar assembly of detector and focal plane detector

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