JPS63111682A - Submount for optical semiconductor element - Google Patents

Submount for optical semiconductor element

Info

Publication number
JPS63111682A
JPS63111682A JP61259023A JP25902386A JPS63111682A JP S63111682 A JPS63111682 A JP S63111682A JP 61259023 A JP61259023 A JP 61259023A JP 25902386 A JP25902386 A JP 25902386A JP S63111682 A JPS63111682 A JP S63111682A
Authority
JP
Japan
Prior art keywords
optical semiconductor
submount
semiconductor element
wire
bonding part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61259023A
Other languages
Japanese (ja)
Other versions
JPH0459791B2 (en
Inventor
Yasuo Nakajima
康雄 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61259023A priority Critical patent/JPS63111682A/en
Publication of JPS63111682A publication Critical patent/JPS63111682A/en
Publication of JPH0459791B2 publication Critical patent/JPH0459791B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48464Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area also being a ball bond, i.e. ball-to-ball

Landscapes

  • Led Device Packages (AREA)
  • Semiconductor Lasers (AREA)
  • Light Receiving Elements (AREA)

Abstract

PURPOSE:To make an optical semiconductor element operated stably by an incorporated driving circuit and to enable the miniaturization of a device by the incorporation of the driving circuit in a package, by using a submount prepared by a method wherein the driving circuit driving the optical semiconductor element is formed in a semiconductor insulated substrate and a conductive element-bonding part whereon the optical semiconductor element is bonded and a conductive wire-bonding part whereto a wire is bonded are provided thereon. CONSTITUTION:A submount 20 is constructed of a semiconductor insulated substrate 10, an element bonding part 11, a wire bonding part 12 and a driving circuit 13 for driving an optical semiconductor element 3 which is integrated monolithically by using techniques of diffusion, ion implantation, epitaxial growth, etc. On the submount 20, the optical semiconductor element 3 is bonded on the element bonding part 11, and the optical semiconductor element 3 and the driving circuit 13 are connected by a wire 8 by using the wire bonding part 12. Moreover, this submount 20 is bonded on a stem 1.

Description

【発明の詳細な説明】 〔産業−1この利用分野〕 この発明は、光半導体素子をマウントするのに用いる光
半導体素子用サブマウントに関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industry-1 Field of Application] The present invention relates to a submount for an optical semiconductor element used for mounting an optical semiconductor element.

〔従来の技術〕[Conventional technology]

第3図は、例えば特開昭57−93591号公報に示さ
れた従来のサブマウントを用いた光半導体装置を示す断
面図で゛あり、また、第4図は特開昭58−58785
号公報に示された従来のサブマウントを用いた光半導体
装置を示す断面図である。第3図において、1はステム
、2は前記ステム1上に接着されたサブマウント、3は
前記サブマウント2」二に接着された光半導体素子、4
は同じくサブマウント2上に接着された保護回路、8は
前記光半導体素子3と保護回路4とを接続するワイヤで
ある。
FIG. 3 is a sectional view showing an optical semiconductor device using a conventional submount disclosed in, for example, Japanese Patent Laid-Open No. 57-93591, and FIG.
1 is a cross-sectional view showing an optical semiconductor device using a conventional submount disclosed in the publication. In FIG. 3, 1 is a stem, 2 is a submount bonded on the stem 1, 3 is an optical semiconductor element bonded to the submount 2'', and 4
Similarly, numeral 8 represents a protection circuit bonded on the submount 2, and 8 represents a wire connecting the optical semiconductor element 3 and the protection circuit 4.

また、第4図におけるサブマウント2は、P型領域5.
N型領域6を有し、PN接合7を形成している。
Further, the submount 2 in FIG. 4 has a P-type region 5.
It has an N-type region 6 and forms a PN junction 7.

半導体レーザダイオード(LD)や発光ダイオード(L
ED)あるいはフォトダイオード(PD)等の光半導体
素子3はサブマウント2に接着され、さらに、サブマウ
ント2がステム]に接着される。また、光半導体素子3
に電流が流れるようにワイヤ8が接着され、ステム1本
体の電気的特性が■となる。第3図に示した例はサブマ
ウント2に保護回路4を接着し、光半導体素子3と保護
回路4をワイヤ8で接着して、電流が保護回路4を通っ
て光半導体素子3に流れるようになっている。
Semiconductor laser diode (LD) and light emitting diode (L)
An optical semiconductor element 3 such as an optical diode (ED) or a photodiode (PD) is bonded to a submount 2, and the submount 2 is further bonded to a stem. In addition, the optical semiconductor element 3
The wire 8 is bonded so that a current flows through the stem 1, and the electrical characteristics of the stem 1 body become ■. In the example shown in FIG. 3, a protection circuit 4 is bonded to the submount 2, and the optical semiconductor element 3 and the protection circuit 4 are bonded with a wire 8, so that current flows through the protection circuit 4 to the optical semiconductor element 3. It has become.

また、第4図に示した例は、PN接合7を有したサブマ
ウント2に光半導体素子3を接着し、電流を光半導体素
子3に流して動作させるとともに、独立にサブマウント
2のPN接合7にも電流を流して、ベルチェ効果を利用
して放熱効果を高めている。第3図に示した例では、サ
ブマウント2には主に熱伝導性の良い絶縁材料(Si、
BeO,SiC,ダイヤモンド等)が用いられている。
In addition, in the example shown in FIG. 4, an optical semiconductor element 3 is bonded to a submount 2 having a PN junction 7, a current is applied to the optical semiconductor element 3 to operate it, and the PN junction of the submount 2 is independently connected. A current is also passed through 7 to enhance the heat dissipation effect by utilizing the Beltier effect. In the example shown in Fig. 3, the submount 2 is mainly made of an insulating material (Si,
BeO, SiC, diamond, etc.) are used.

〔発明が解決しようとする問題点〕 上記のように構成された従来のサブマウントは、光半導
体素子3から生じる熱を放出させることにより熱抵抗を
下げるのと、接着部に生じる線膨張係数のずれからの機
械的歪を緩和する目的で用いている。光半導体素子3を
動作させるために、駆動回路(図示せず)をパッケージ
の外部もしくは内部に設ける必要がある。外部に設けた
場合、システム全体が大きくなってしまう。駆動回路を
モノリシックに集積して第3図においてサブマウント2
」二に接着した場合、パッケージが大型化する。また、
第4図のように、サブマウント2にPN接合7を設けた
ものもあるが、これは駆動回路ではなく、光半導体素子
3の放熱効果を図るために用いられているものであり、
光半導体素子3とは独立に動作される。したがって、こ
の例においてもパッケージが大型化するという問題点が
あった。
[Problems to be Solved by the Invention] The conventional submount configured as described above lowers thermal resistance by releasing heat generated from the optical semiconductor element 3, and lowers the coefficient of linear expansion generated at the adhesive part. It is used to alleviate mechanical strain caused by misalignment. In order to operate the optical semiconductor element 3, it is necessary to provide a drive circuit (not shown) outside or inside the package. If it is provided externally, the entire system will become larger. The drive circuit is monolithically integrated into the submount 2 in Figure 3.
” If it is glued to the second layer, the package will become larger. Also,
As shown in FIG. 4, there is a submount 2 with a PN junction 7, but this is used not for the drive circuit but for the purpose of improving the heat dissipation effect of the optical semiconductor element 3.
It is operated independently of the optical semiconductor element 3. Therefore, this example also has the problem that the package becomes large.

この発明は、上記のような問題点を解消するためになさ
れたもので、光半導体素子が安定に動作するとともに、
小型化が実現できる光半導体素子用サブマウントを得る
ことを目的とする。
This invention was made to solve the above-mentioned problems, and allows the optical semiconductor device to operate stably, and
The purpose of this invention is to obtain a submount for optical semiconductor devices that can be miniaturized.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る光半導体素子用サブマウントは、半導体
絶縁基板に光半導体素子を駆動する駆動回路を形成し、
その面上に光半導体素子を接着する導電性の素子接着部
と、ワイヤを接着する導電性のワイヤ接着部を備えたも
のである。
A submount for an optical semiconductor element according to the present invention forms a drive circuit for driving an optical semiconductor element on a semiconductor insulating substrate,
It is provided with a conductive element bonding part for bonding an optical semiconductor element on the surface and a conductive wire bonding part for bonding a wire.

〔作用〕[Effect]

この発明においては、半導体絶縁基板に光半導体素子を
駆動するための駆動回路を集積化してサブマウントを形
成したことから、素子接着部に接着された光半導体素子
は、ワイヤが接続されていない状態では、絶縁された状
態である。これに、適当にワイヤを接続することにより
、光半導体素子および駆動回路を直列および並列、さら
に個々に独立に動作させることが可能となる。また、外
部に駆動回路を設けなくてもよいことから、小型化でき
る。
In this invention, since a submount is formed by integrating a drive circuit for driving an optical semiconductor element on a semiconductor insulating substrate, the optical semiconductor element bonded to the element adhesive part is in a state where no wire is connected. Now, it is in an insulated state. By appropriately connecting wires to this, it becomes possible to operate the optical semiconductor element and the drive circuit in series, in parallel, and even independently. Further, since there is no need to provide an external drive circuit, the size can be reduced.

〔実施例〕〔Example〕

第1図(a)、(b)はこの発明の一実施例を示す図で
、第1図(a)はサブマウントの斜視図であり、第1図
(b)は第1図(a)のサブマウント上に光半導体素子
を組み立てた状態を示す正面図である。
FIGS. 1(a) and 1(b) are views showing one embodiment of the present invention, FIG. 1(a) is a perspective view of a submount, and FIG. 1(b) is a perspective view of a submount. FIG. 3 is a front view showing a state in which the optical semiconductor device is assembled on the submount of the device.

これらの図において、第3図と同一符号は同一部分を示
し、1oは半導体絶縁基板、11は素子接着部、12は
ワイヤ接着部、13は前記半導体絶縁基板10に拡散、
イオン注入、エピタキシャル成長等の技術を用いてモノ
リシックに集積化された光半導体素子3を駆動するため
の駆動回路である。以上でこの発明のサブマウント20
が構成される。このサブマウント20上に第1図(b)
のように、光半導体素子3を素子接着部11に接着し、
ワイヤ8により光半導体素子3と駆動回路13とをワイ
ヤ接着部12を用いて接着し、゛さらに、このサブマウ
ント20をステム1上に接着し、組立てが行われる。
In these figures, the same reference numerals as in FIG. 3 indicate the same parts, 1o is the semiconductor insulating substrate, 11 is the element bonding part, 12 is the wire bonding part, 13 is the diffusion into the semiconductor insulating substrate 10,
This is a drive circuit for driving an optical semiconductor element 3 monolithically integrated using techniques such as ion implantation and epitaxial growth. This concludes the submount 20 of this invention.
is configured. On this submount 20, as shown in FIG.
The optical semiconductor element 3 is adhered to the element adhesive part 11 as shown in FIG.
The optical semiconductor element 3 and the drive circuit 13 are bonded together using the wire bonding portion 12 using the wire 8, and then the submount 20 is bonded onto the stem 1 to complete the assembly.

駆動回路13としては、光半導体素子3がLDの場合、
変調回路、バイアス回路、APC回路など、LEDの場
合、変調回路、バイアス回路。
As the drive circuit 13, when the optical semiconductor element 3 is an LD,
For LEDs, modulation circuits, bias circuits, APC circuits, etc.

ACC回路など、PDの場合、バイアス回路などが用い
られるが、一般に使用する光半導体素子3により駆動回
路13が異なるため、特に限定しない。
In the case of a PD such as an ACC circuit, a bias circuit or the like is used, but since the drive circuit 13 generally differs depending on the optical semiconductor element 3 used, it is not particularly limited.

また、第1図(b)に示すように、光半導体素子3は半
導体絶縁基板1o上にモノリシックに集積化された駆動
回路13とワイヤ接着部12および素子接着部11から
なるサブマウント20の素子接着部11に接着され、さ
らにステム(またはパッケージ)1に接着される。光半
導体素子3に駆動回路13を通して電流が流れるように
ワイヤ8が接着される。駆動回路]3にバイアスをかけ
ることにより駆動回路13が動作し、駆動回路13のも
つ機能に応じて光半導体素子3が動作する。サブマウン
)20本体は半導体絶縁基板10からなり、光半導体素
子3に用いられている半導体基板と同一材料を用いるこ
とにより熱伝導性が良くなり、光半導体素子3の放熱性
が良くなる。
Further, as shown in FIG. 1(b), the optical semiconductor element 3 is an element of a submount 20 consisting of a drive circuit 13 monolithically integrated on a semiconductor insulating substrate 1o, a wire bonding part 12, and an element bonding part 11. It is adhered to the adhesive part 11 and further to the stem (or package) 1. A wire 8 is bonded to the optical semiconductor element 3 so that a current flows through the drive circuit 13. The drive circuit 13 operates by applying a bias to the drive circuit 3, and the optical semiconductor element 3 operates according to the function of the drive circuit 13. The main body of the sub-mount) 20 is made of a semiconductor insulating substrate 10, and by using the same material as the semiconductor substrate used for the optical semiconductor element 3, thermal conductivity is improved, and the heat dissipation of the optical semiconductor element 3 is improved.

なお、上記実施例においては、素子接着部11が光半導
体素子3を駆動するための駆動回路13とは独立して形
成されているが、第2図に示すように、あらかじめ駆動
回路13の領域上の一部に素子接着部11を設けてもよ
い。
In the above embodiment, the element adhesive part 11 is formed independently of the drive circuit 13 for driving the optical semiconductor element 3, but as shown in FIG. The element adhesive part 11 may be provided in a part of the upper part.

〔発明の効果〕〔Effect of the invention〕

この発明は以上説明したとおり、半導体絶縁基板に光半
導体素子を駆動する駆動回路を形成し、その面上に光半
導体素子を接着する導電性の素子接着部と、ワイヤを接
着する導電性のワイヤ接着部を形成してサブマウントを
構成したので、このサブマウントを用いることにより内
蔵された駆動回路により光半導体素子が安定に動作する
とともに、駆動回路をパッケージ内に内蔵していること
により小型化できる。さらに、光半導体素子と駆動回路
とをモノリシックに集積化した0EICと同等の性能が
得られるハイブリッドタイプの0EICが可能となるた
め、光半導体素子と駆動回路とをモノリシックに集積化
した0EICに比べ安価にできる等の利点がある。
As explained above, the present invention includes a drive circuit for driving an optical semiconductor element formed on a semiconductor insulating substrate, a conductive element bonding part for bonding the optical semiconductor element on the surface thereof, and a conductive wire for bonding the wire. Since the submount is constructed by forming an adhesive part, by using this submount, the optical semiconductor element can operate stably due to the built-in drive circuit, and it can also be miniaturized by incorporating the drive circuit inside the package. can. Furthermore, it is possible to create a hybrid type 0EIC that can achieve the same performance as an 0EIC that monolithically integrates an optical semiconductor element and a drive circuit, which is cheaper than an 0EIC that monolithically integrates an optical semiconductor element and a drive circuit. There are advantages such as being able to

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)、(b)はこの発明の一実施例を示す図で
あり、第1図(a)はサブマウントの斜視図、第1図(
b)は第1図(a)のサブマウントを用いた組立て状態
を示す正面図、第2図はこの発明の他の実施例を示す斜
視図、第3図および第4図は従来のサブマウントとその
サブマウントを用いた組立て状態を示す正面図である。 図において、1はステム、3は光半導体素子、8はワイ
ヤ、10は半導体絶縁基板、11は素子接着部、12は
ワイヤ接着部、13は駆動回路である。 なお、各図中の同一符号は同一または相当部分を示す。 代理人  大 岩 増 雄    (外2名)第1図 Q 〜 手続補正書(自発) ] 日 3、補正をする者 3号 3号 5、補正の対象 明細書の発明の詳細な説明の欄および図面6、補正の内
容 (1)明細書第4頁3行の「サブマウント」を、「サブ
マウント2」と補正する。 (2)第1図(b)、第2図を別紙のように補正する。 以」ニ
FIGS. 1(a) and 1(b) are views showing one embodiment of the present invention, FIG. 1(a) is a perspective view of a submount, and FIG.
b) is a front view showing an assembled state using the submount of Fig. 1(a), Fig. 2 is a perspective view showing another embodiment of the present invention, and Figs. 3 and 4 are conventional submounts. FIG. 3 is a front view showing an assembled state using a submount and a submount thereof. In the figure, 1 is a stem, 3 is an optical semiconductor element, 8 is a wire, 10 is a semiconductor insulating substrate, 11 is an element bonding part, 12 is a wire bonding part, and 13 is a drive circuit. Note that the same reference numerals in each figure indicate the same or corresponding parts. Agent Masuo Oiwa (2 others) Figure 1 Q - Procedural amendment (voluntary)] Day 3, person making the amendment No. 3, No. 3, No. 5, column for detailed explanation of the invention in the specification to be amended, and Drawing 6, Contents of correction (1) "Submount" on page 4, line 3 of the specification is corrected to "submount 2." (2) Correct Fig. 1(b) and Fig. 2 as shown in the attached sheet. I”d

Claims (4)

【特許請求の範囲】[Claims] (1)半導体絶縁基板に光半導体素子を駆動する駆動回
路を形成し、その面上に前記光半導体素子を接着する導
電性の素子接着部と、ワイヤを接着する導電性のワイヤ
接着部を備えたことを特徴とする光半導体素子用サブマ
ウント。
(1) A drive circuit for driving an optical semiconductor element is formed on a semiconductor insulating substrate, and a conductive element bonding part for bonding the optical semiconductor element and a conductive wire bonding part for bonding a wire are provided on the surface of the drive circuit. A submount for optical semiconductor devices characterized by:
(2)半導体絶縁基板は、光半導体素子に用いられてい
る半導体基板と同一材料であることを特徴とする特許請
求の範囲第(1)項記載の光半導体素子用サブマウント
(2) The submount for an optical semiconductor device according to claim (1), wherein the semiconductor insulating substrate is made of the same material as the semiconductor substrate used in the optical semiconductor device.
(3)駆動回路は、半導体絶縁基板上にモノリシックに
形成されていることを特徴とする特許請求の範囲第(1
)項記載の光半導体素子用サブマウント。
(3) The drive circuit is monolithically formed on a semiconductor insulating substrate.
) A submount for optical semiconductor devices as described in item 2.
(4)導電性の素子接着部は、駆動回路の領域上の一部
に設けられていることを特徴とする特許請求の範囲第(
1)項記載の光半導体素子用サブマウント。
(4) The conductive element adhesive portion is provided in a part of the region of the drive circuit,
1) Submount for optical semiconductor devices as described in item 1).
JP61259023A 1986-10-29 1986-10-29 Submount for optical semiconductor element Granted JPS63111682A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61259023A JPS63111682A (en) 1986-10-29 1986-10-29 Submount for optical semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61259023A JPS63111682A (en) 1986-10-29 1986-10-29 Submount for optical semiconductor element

Publications (2)

Publication Number Publication Date
JPS63111682A true JPS63111682A (en) 1988-05-16
JPH0459791B2 JPH0459791B2 (en) 1992-09-24

Family

ID=17328273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61259023A Granted JPS63111682A (en) 1986-10-29 1986-10-29 Submount for optical semiconductor element

Country Status (1)

Country Link
JP (1) JPS63111682A (en)

Cited By (6)

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Publication number Priority date Publication date Assignee Title
JP2007129188A (en) * 2005-10-07 2007-05-24 Hitachi Maxell Ltd Semiconductor device, semiconductor module, and method of manufacturing the semiconductor module
JP2009510732A (en) * 2005-09-30 2009-03-12 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング Detector device and detector element
JP2010533975A (en) * 2007-07-17 2010-10-28 クリー インコーポレイテッド LED with integrated constant current drive circuit
JP2012060133A (en) * 2010-09-10 2012-03-22 Samsung Led Co Ltd Light-emitting device, illumination apparatus, and backlight
US8791645B2 (en) 2006-02-10 2014-07-29 Honeywell International Inc. Systems and methods for controlling light sources
US8803313B2 (en) 2003-01-02 2014-08-12 Cree, Inc. Group III nitride based flip-chip integrated circuit and method for fabricating

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US8803313B2 (en) 2003-01-02 2014-08-12 Cree, Inc. Group III nitride based flip-chip integrated circuit and method for fabricating
US9226383B2 (en) 2003-01-02 2015-12-29 Cree, Inc. Group III nitride based flip-chip integrated circuit and method for fabricating
JP2009510732A (en) * 2005-09-30 2009-03-12 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング Detector device and detector element
DE102005061206B4 (en) 2005-09-30 2019-10-17 Osram Opto Semiconductors Gmbh Use of a detector arrangement as ambient light sensor
JP2007129188A (en) * 2005-10-07 2007-05-24 Hitachi Maxell Ltd Semiconductor device, semiconductor module, and method of manufacturing the semiconductor module
US8791645B2 (en) 2006-02-10 2014-07-29 Honeywell International Inc. Systems and methods for controlling light sources
US8937443B2 (en) 2006-02-10 2015-01-20 Honeywell International Inc. Systems and methods for controlling light sources
JP2010533975A (en) * 2007-07-17 2010-10-28 クリー インコーポレイテッド LED with integrated constant current drive circuit
US8569970B2 (en) 2007-07-17 2013-10-29 Cree, Inc. LED with integrated constant current driver
US8810151B2 (en) 2007-07-17 2014-08-19 Cree, Inc. LED with integrated constant current driver
JP2012060133A (en) * 2010-09-10 2012-03-22 Samsung Led Co Ltd Light-emitting device, illumination apparatus, and backlight

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