JPS6310471U - - Google Patents

Info

Publication number
JPS6310471U
JPS6310471U JP10413786U JP10413786U JPS6310471U JP S6310471 U JPS6310471 U JP S6310471U JP 10413786 U JP10413786 U JP 10413786U JP 10413786 U JP10413786 U JP 10413786U JP S6310471 U JPS6310471 U JP S6310471U
Authority
JP
Japan
Prior art keywords
circuit
reference clock
measuring
loop
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10413786U
Other languages
English (en)
Japanese (ja)
Other versions
JPH082623Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986104137U priority Critical patent/JPH082623Y2/ja
Publication of JPS6310471U publication Critical patent/JPS6310471U/ja
Application granted granted Critical
Publication of JPH082623Y2 publication Critical patent/JPH082623Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1986104137U 1986-07-07 1986-07-07 遅延量測定回路 Expired - Lifetime JPH082623Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986104137U JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986104137U JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Publications (2)

Publication Number Publication Date
JPS6310471U true JPS6310471U (sv) 1988-01-23
JPH082623Y2 JPH082623Y2 (ja) 1996-01-29

Family

ID=30977354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986104137U Expired - Lifetime JPH082623Y2 (ja) 1986-07-07 1986-07-07 遅延量測定回路

Country Status (1)

Country Link
JP (1) JPH082623Y2 (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007138814A1 (ja) * 2006-05-26 2007-12-06 Advantest Corporation 試験装置および試験モジュール

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59154367A (ja) * 1983-02-23 1984-09-03 Mitsubishi Electric Corp 遅延量測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59154367A (ja) * 1983-02-23 1984-09-03 Mitsubishi Electric Corp 遅延量測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007138814A1 (ja) * 2006-05-26 2007-12-06 Advantest Corporation 試験装置および試験モジュール
JP5100645B2 (ja) * 2006-05-26 2012-12-19 株式会社アドバンテスト 試験装置および試験モジュール

Also Published As

Publication number Publication date
JPH082623Y2 (ja) 1996-01-29

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