JPS6310471U - - Google Patents
Info
- Publication number
- JPS6310471U JPS6310471U JP10413786U JP10413786U JPS6310471U JP S6310471 U JPS6310471 U JP S6310471U JP 10413786 U JP10413786 U JP 10413786U JP 10413786 U JP10413786 U JP 10413786U JP S6310471 U JPS6310471 U JP S6310471U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- reference clock
- measuring
- loop
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010355 oscillation Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986104137U JPH082623Y2 (ja) | 1986-07-07 | 1986-07-07 | 遅延量測定回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986104137U JPH082623Y2 (ja) | 1986-07-07 | 1986-07-07 | 遅延量測定回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6310471U true JPS6310471U (is) | 1988-01-23 |
JPH082623Y2 JPH082623Y2 (ja) | 1996-01-29 |
Family
ID=30977354
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986104137U Expired - Lifetime JPH082623Y2 (ja) | 1986-07-07 | 1986-07-07 | 遅延量測定回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH082623Y2 (is) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007138814A1 (ja) * | 2006-05-26 | 2007-12-06 | Advantest Corporation | 試験装置および試験モジュール |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59154367A (ja) * | 1983-02-23 | 1984-09-03 | Mitsubishi Electric Corp | 遅延量測定装置 |
-
1986
- 1986-07-07 JP JP1986104137U patent/JPH082623Y2/ja not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59154367A (ja) * | 1983-02-23 | 1984-09-03 | Mitsubishi Electric Corp | 遅延量測定装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007138814A1 (ja) * | 2006-05-26 | 2007-12-06 | Advantest Corporation | 試験装置および試験モジュール |
JP5100645B2 (ja) * | 2006-05-26 | 2012-12-19 | 株式会社アドバンテスト | 試験装置および試験モジュール |
Also Published As
Publication number | Publication date |
---|---|
JPH082623Y2 (ja) | 1996-01-29 |
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