JPS6274072A - Thin film forming device - Google Patents

Thin film forming device

Info

Publication number
JPS6274072A
JPS6274072A JP21416785A JP21416785A JPS6274072A JP S6274072 A JPS6274072 A JP S6274072A JP 21416785 A JP21416785 A JP 21416785A JP 21416785 A JP21416785 A JP 21416785A JP S6274072 A JPS6274072 A JP S6274072A
Authority
JP
Japan
Prior art keywords
substrates
shutter
targets
thin film
film forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21416785A
Other languages
Japanese (ja)
Other versions
JPS642188B2 (en
Inventor
Hidetsugu Setoyama
英嗣 瀬戸山
Shinzo Oikawa
及川 新三
Kenichi Kizawa
賢一 鬼沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP21416785A priority Critical patent/JPS6274072A/en
Publication of JPS6274072A publication Critical patent/JPS6274072A/en
Publication of JPS642188B2 publication Critical patent/JPS642188B2/ja
Granted legal-status Critical Current

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Abstract

PURPOSE:To form multi-layered thin films having uniform film quality by disposing a shutter which is divided and is turned oppositely from each other between plural substrates on a substrate holder which is rotationally driven and targets which are disposed to face the substrates. CONSTITUTION:Two sets of cathode electrodes 2 are provided in a vacuum vessel 1 of a thin film forming device and the targets 3, 4 are disposed thereon. The plural substrates 6 are attached to the rotating substrate holder 5 above the targets 3, 4 so as to face the targets. Gas is introduced into the above- mentioned vacuum vessel 1 from a gas introducing hole 7 and is converted to plasma 20 by which the targets 3, 4 are sputtered and the thin films are formed on the substrates 6. The shutter for controlling the spattered and splashed particles 21 is provided between the targets 3, 4 and the substrates 6 of the above-mentioned device. The shutter is constituted of the shutter plates 9, 10 which are bisected approximately along the straight line connecting the centers of the substrates 6 and are respectively turned cooperatively oppositely from each other by means of a central shaft 13 and auxiliary shaft 14 engaged with gears 15, 16. The opening and closing speed of the shutter are thereby increased and the quality of the thin film is made uniform.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、スパッタ装置、蒸着装置、イオンビーム応用
装置などの薄膜形成装置に係り、特に、均一、均質な膜
形成に好適な、シャッタ装置を具備する薄膜形成装置に
関する。
Detailed Description of the Invention [Field of Application of the Invention] The present invention relates to a thin film forming apparatus such as a sputtering apparatus, a vapor deposition apparatus, and an ion beam application apparatus, and particularly relates to a shutter apparatus suitable for forming a uniform and homogeneous film. The present invention relates to a thin film forming apparatus.

〔発明の背景〕[Background of the invention]

たとえば絶縁基板面に金属からなる薄膜を形成するため
にたとえばスパッタ装置が用いられることは周知であり
、該金属のイオンあるいは粒子を前記絶縁基板に飛散さ
せるため、あるいはその飛散を停止するためのシャッタ
装置が備えられているのが一般的である。
For example, it is well known that a sputtering device is used to form a thin film made of metal on the surface of an insulating substrate, and a shutter is used to scatter ions or particles of the metal onto the insulating substrate or to stop the scattering. Generally, equipment is provided.

従来のスパッタ装置でのシャッタ機構は、特開昭60−
39819号公報に記載されているように、ターゲット
と基板間に配置されたシャツタ板の一端に、開閉操作用
の回転軸が設けられている。この回転軸を、容器外部よ
り操作することにより、ターゲットから飛散するスパッ
タ粒子が、基板に飛来せぬようシャツタ板で、遮蔽した
り、また、基板に飛来するよう開いたりして用いていた
The shutter mechanism in conventional sputtering equipment was developed in Japanese Patent Application Laid-open No. 1986-
As described in Japanese Patent No. 39819, a rotating shaft for opening/closing operation is provided at one end of a shirt plate disposed between a target and a substrate. By operating this rotating shaft from outside the container, the sputtered particles scattered from the target were shielded with a shutter plate to prevent them from flying onto the substrate, or opened to allow them to fly onto the substrate.

また、他の例として、特公昭60−15700号公報に
記載されたものがある。この装置は、シャツタ板の中央
に回転操作軸が設けられており、且つ、シャツタ板の一
部に設けた開口部の位置を回転させることにより、スパ
ッタ粒子を飛来させたり、遮蔽させたりして用いるよう
になっていた6一方、最近の薄膜形成技術の発達、形成
膜の多様化に伴ない、2種以上のスパッタ材の基板への
飛来を、シャツタ板より選択したり、シャツタ板の開閉
動作を、より高速化し、均質な成膜ができるシャッタ機
構が必要になってきた。
Further, as another example, there is one described in Japanese Patent Publication No. 60-15700. This device has a rotating operation shaft in the center of the shirt plate, and by rotating the position of an opening provided in a part of the shirt plate, sputtered particles can be made to fly or blocked. 6 On the other hand, with the recent development of thin film forming technology and the diversification of the films to be formed, it has become possible to select the method for sending two or more types of sputtering materials to the substrate from the shutter plate, or to open and close the shutter plate. There is now a need for a shutter mechanism that can operate at higher speeds and form a uniform film.

これに対し、従来の方法では、特に、2種のターゲット
からのスパッタ時間を可変させたり、且つ、高速で開閉
させたりすることは難しく、また形成される膜の均一性
、均質性などについては、十分配慮されていなかった。
In contrast, with conventional methods, it is particularly difficult to vary the sputtering time from two types of targets and to open and close them at high speed, and it is difficult to maintain uniformity and homogeneity of the formed film. , was not given sufficient consideration.

すなわち、従来のシャッタ機構は、第3図(a)。That is, the conventional shutter mechanism is shown in FIG. 3(a).

(b)に示すように、円形の板材にて−の基板に対応す
る個所に開口部19が設けられた円板シャッタ18を備
えるもので、180”の往復回動がなされるようになっ
ている。このことがら明らかなように回動角度が大きい
と高速駆動が困難となり、また、第3図(b)のような
状態の際には、各ターゲット34から前記開口部を通じ
てイオンまたは粒子が飛散されやすいという欠点を有す
るものである。
As shown in (b), the disc shutter 18 is made of a circular plate and has an opening 19 at a location corresponding to the - board, and is capable of reciprocating rotation of 180''. As is clear from this, when the rotation angle is large, high-speed driving becomes difficult, and in the state shown in FIG. It has the disadvantage of being easily scattered.

〔発明の目的〕[Purpose of the invention]

本発明は、このような事情に基づいてなされたものであ
り、その目的は、より均一な膜質を有する多層薄膜を形
成することのできる薄膜形成装置を提供するにある。
The present invention has been made based on such circumstances, and its purpose is to provide a thin film forming apparatus that can form a multilayer thin film having more uniform film quality.

〔発明の概要〕[Summary of the invention]

このような目的を達成するために、本発明は、2種のタ
ーゲツト材からなる、多層膜をスパッタ法などにより形
成したようにする際に、材質より異なるスパッタ収量の
差を、シャツタ開時間で制御したり、膜質の均一性を、
高速開閉駆動により得ようとしたものである。
In order to achieve such an object, the present invention aims to compensate for the difference in sputtering yield depending on the materials by changing the shutter opening time when a multilayer film is formed by sputtering or the like using two types of target materials. control and uniformity of film quality.
This is what we were trying to achieve through high-speed opening/closing drive.

そこで、2分割とした回転シャツタ板の回転方向を互い
に異なるようにすることで、回転角を半減きせ、且つ、
この回転軸を2つのターゲットの中間に置くことで、開
閉速度の向上をはかり、また、シャツタ開閉作動時の膜
質の不均一性を改善しようとしたものである。すなわち
、少なくとも2つの基板を保持し回転駆動される基板ホ
ルダと、この基板ホルダが定位置にきた際前記各基板に
それぞれ対向して配置される2個のターゲットと、この
ターゲットと前記基板との間に配置されるシャッタとを
備える薄膜形成装置において、前記シャッタは前記各基
板の中心間を結ぶ直線にほぼ沿って2分割され、分割さ
れた各シャッタは前記各基板間に垂設された駆動軸の駆
動によって互いに連動し逆回動するように構成されてい
るようにし、たものである。
Therefore, by making the rotating directions of the two-split rotary shirt plate different from each other, the rotation angle can be halved, and
By placing this rotating shaft between the two targets, the opening/closing speed is improved and the non-uniformity of the film quality during the opening/closing operation of the shirt shirt is also improved. That is, a substrate holder that holds at least two substrates and is rotationally driven, two targets that are arranged to face each of the substrates when the substrate holder comes to a fixed position, and a connection between the targets and the substrates. and a shutter disposed between the substrates, the shutter is divided into two parts approximately along a straight line connecting the centers of the respective substrates, and each of the divided shutters is provided with a drive vertically disposed between the respective substrates. The shafts are configured to interlock with each other and rotate in opposite directions when the shafts are driven.

〔発明の実施例〕[Embodiments of the invention]

第1図および第2図(a)、(b)は本発明による薄膜
形成装置の一実施例を示す構成図である。
FIG. 1 and FIGS. 2(a) and 2(b) are configuration diagrams showing one embodiment of a thin film forming apparatus according to the present invention.

まず第1図において、真空容器1の中には、スパッタ粒
子を生成するための4、カソード電極2が2組と、これ
らの頂部に固定されたターゲット3゜4が配されている
。ターゲットの上方には、基板ホルダー5と、このホル
ダーの各ターゲット対向面上に複数個の基板6が取付け
られており、この真空容器1内で回転運動を行なう。真
空容器に設けた、ガス導入孔7より流入したガスは、タ
ーゲット3,4上でプラズマ化し、衝突し、スパッタリ
ングを行ない、残りのガスは2排気孔8より外部へ排気
されるようになっている。この際、生成されたスパッタ
粒子が、基板6へ飛来する量を制御するために、前記基
板6と、ターゲット3.4の間にシャッタ板9,10が
設けられている。シャッタ板9,10は、それぞれ固定
用カップリング11.12を介して、中心軸13と、副
軸]−4に固定されている。また、中心軸13は、真空
容器の外部より回転力を受は回転し、副軸14は。
First, in FIG. 1, in a vacuum chamber 1 there are arranged two sets of cathode electrodes 2 and 4 for generating sputtered particles, and a target 3.times.4 fixed to the top of these electrodes. Above the target, a substrate holder 5 and a plurality of substrates 6 are mounted on each target-facing surface of this holder, and are rotated within the vacuum vessel 1. The gas flowing through the gas introduction hole 7 provided in the vacuum container turns into plasma on the targets 3 and 4, collides with it, and performs sputtering, and the remaining gas is exhausted to the outside through the 2 exhaust holes 8. There is. At this time, shutter plates 9 and 10 are provided between the substrate 6 and the target 3.4 in order to control the amount of generated sputtered particles flying toward the substrate 6. The shutter plates 9 and 10 are fixed to the central shaft 13 and the sub-shaft ]-4 via fixing couplings 11 and 12, respectively. Further, the central shaft 13 receives a rotational force from the outside of the vacuum container and rotates, and the sub-shaft 14 rotates.

金具17により保持され、ギヤ15.16を介して、中
心軸13の回転駆動力が伝達され、逆方向に回転するよ
うになっている。
It is held by a metal fitting 17, and the rotational driving force of the central shaft 13 is transmitted through gears 15 and 16, so that it rotates in the opposite direction.

前記シャッタ板9,10は、第2図(a)に示すように
、基板ホルダ5面の各基板6のうち前記基板ホルダ5の
回転軸を間にして対向配置される2個の基板(各ターゲ
ット3,4にそれぞれ対向する)を特定した場合、それ
ぞれの各基板の中心を結ぶ線にほぼ沿って2分割された
2組のシャツタ板で構成されている。各シャツタ板9,
10はその分割部において重畳領域が形成され、第2図
(a)の図示の状態では、各基板双方とも完全にシャッ
タされるようになっている。
As shown in FIG. 2(a), the shutter plates 9 and 10 are connected to two substrates (each of which are arranged facing each other with the rotation axis of the substrate holder 5 in between) out of each substrate 6 on the surface of the substrate holder 5. When the targets 3 and 4 (opposed to each other) are specified, they are composed of two sets of shirt plates that are divided into two roughly along a line connecting the centers of the respective substrates. Each shirt plate 9,
10 has an overlapping region formed at its divided portion, and in the state shown in FIG. 2(a), both of the substrates are completely shuttered.

各シャッタFi9.10のそれぞれの回転R8S軸11
.12は近接して配置され、前記回転駆動軸12はシャ
ツタ板10に直接固定され、また前記回転駆動軸11は
シャツタ板10に設けた円弧孔30に遊挿されてシャツ
タ板9に直接固定されている。
Each rotation R8S axis 11 of each shutter Fi9.10
.. 12 are arranged close to each other, the rotary drive shaft 12 is directly fixed to the shirt flap plate 10, and the rotary drive shaft 11 is loosely inserted into an arcuate hole 30 provided in the shirt flap plate 10 and directly fixed to the shirt flap plate 9. ing.

第2図(a)の状態から、前記回転駆動軸】52が図中
左方向へ回動するとシャツタ板10もそれにともなって
、第2図(b)の方向へ回動し、45″回転した状態で
停止するようになっている。
From the state shown in FIG. 2(a), when the rotational drive shaft 52 rotates to the left in the figure, the shirt shirt plate 10 also rotates in the direction shown in FIG. 2(b), rotating by 45''. It is designed to stop in this state.

この際、前記回転駆動軸′11は回転駆動軸12と連動
しかつ逆回転となっているため、シャツタ板9は第2図
(b)のように前記シャツタ板10とは逆方向へ45″
回転した状態で停止するようになっている。
At this time, since the rotary drive shaft '11 is interlocked with the rotary drive shaft 12 and rotates in the opposite direction, the shirt flap plate 9 is moved 45'' in the opposite direction to the shirt flap plate 10 as shown in FIG. 2(b).
It is designed to stop while rotating.

この場合、第2図(b)から明らかなように。In this case, as is clear from FIG. 2(b).

基板3に対してはシャッタが解除されることになる。The shutter for the substrate 3 will be released.

このように構成した薄膜形成装置は、」二連したシャッ
タ機構を有しているため、回転駆動軸1−2の45″回
転でシャッタ開放を達成することができるようになる。
Since the thin film forming apparatus configured in this manner has a double shutter mechanism, the shutter can be opened by rotating the rotary drive shaft 1-2 by 45''.

このためシャッタの閉塞あるいは開放動作を高速で行な
うことができるようになる。このことは、イオンあるい
は粒子の基板への飛散またはその停止を瞬時に行なうこ
とができることから、形成する膜の質を均一にすること
ができる。
Therefore, the shutter can be closed or opened at high speed. This allows the scattering of ions or particles to the substrate or their stopping instantaneously, so that the quality of the formed film can be made uniform.

また、一方の基板に対してイオンあるいは粒子の飛散を
行なっているときは、他方の基板はシャッタにより完全
にイオンあるいは粒子の飛散が停止され、したがって前
記他方の基板に対してイオンあるいは粒子の微小なる飛
散も防止できるようになり、形成する膜の質を均一にす
ることができる。
Further, when ions or particles are being scattered to one substrate, the other substrate is completely stopped from scattering ions or particles by a shutter, and therefore, the minute ions or particles are not scattered to the other substrate. It is also possible to prevent scattering, and the quality of the formed film can be made uniform.

以上説明した実施例では、各シャッタ9,10の回転駆
動軸11.12を近接して配置している結果、一方の回
転駆動軸11がシャッタ9に設けた円弧孔30に遊挿す
る構成を採用しているものである。しかし、第4図に示
すようにシャッタをその回転駆動軸近傍にて形状を変更
することによって上記実施例とは異なる構成を採ること
ができる。
In the embodiment described above, as a result of arranging the rotary drive shafts 11 and 12 of each shutter 9 and 10 close to each other, one of the rotary drive shafts 11 is loosely inserted into the circular arc hole 30 provided in the shutter 9. This is what is being adopted. However, as shown in FIG. 4, by changing the shape of the shutter near its rotational drive shaft, a configuration different from that of the above embodiment can be adopted.

〔発明の効果〕〔Effect of the invention〕

以上説明したことから明らかなように、本発明による薄
膜形成装置によれば、より均一な膜質を有する多層薄膜
を形成することができるようになる。
As is clear from the above explanation, according to the thin film forming apparatus according to the present invention, a multilayer thin film having more uniform film quality can be formed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による薄膜形成装置の一実施例を示す構
成図、第2図(a)、(b)は前記薄膜形成装置に具備
されるシャッタ機構の一実施例を示す構成図、第3図(
a)、(b)は従来のシャッタ機構の一例を示す構成図
、第4図は本発明による薄膜形成装置の他の実施例を示
す構成図である。 1・・・真空容器、2・・・カソード電極、3,4・・
・ターゲット、5・・・基板ホルダー、6・・・基板、
7・・・ガス導入孔、8・・・排気孔、9,10・・・
シャツタ板、11.12・・・カップリング、13.1
4・・・回転駆動軸、】−7・・・支持金具、18・・
・円板シャッタ。 19・・・開口部、20・・・プラズマ、21・・・ス
パッタ飛散粒子。
FIG. 1 is a block diagram showing an embodiment of a thin film forming apparatus according to the present invention, and FIGS. 2(a) and 2(b) are block diagrams showing an embodiment of a shutter mechanism provided in the thin film forming apparatus. Figure 3 (
FIG. 4 is a block diagram showing another embodiment of the thin film forming apparatus according to the present invention. 1... Vacuum container, 2... Cathode electrode, 3, 4...
・Target, 5... Substrate holder, 6... Substrate,
7... Gas introduction hole, 8... Exhaust hole, 9, 10...
Shaft plate, 11.12...Coupling, 13.1
4... Rotation drive shaft, ]-7... Support metal fittings, 18...
・Disc shutter. 19... Opening, 20... Plasma, 21... Sputtered particles.

Claims (1)

【特許請求の範囲】[Claims] 1、少なくとも2つの基板を保持し回転駆動される基板
ホルダと、この基板ホルダが定位置にきた際前記各基板
にそれぞれ対向して配置される2個のターゲットと、こ
のターゲットと前記基板との間に配置されるシャッタと
を備える薄膜形成装置において、前記シャッタは前記各
基板の中心間を結ぶ直線にほぼ沿って2分割され、分割
された各シャッタは前記各基板間に垂設された駆動軸の
駆動によって互いに連動し逆回動するように構成されて
いることを特徴とする薄膜形成装置。
1. A substrate holder that holds at least two substrates and is rotationally driven, two targets that are arranged to face each of the substrates when the substrate holder comes to a fixed position, and a connection between the targets and the substrates. and a shutter disposed between the substrates, the shutter is divided into two parts approximately along a straight line connecting the centers of the respective substrates, and each of the divided shutters is provided with a drive vertically disposed between the respective substrates. A thin film forming apparatus characterized in that the apparatus is configured to interlock with each other and rotate in opposite directions by driving shafts.
JP21416785A 1985-09-27 1985-09-27 Thin film forming device Granted JPS6274072A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21416785A JPS6274072A (en) 1985-09-27 1985-09-27 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21416785A JPS6274072A (en) 1985-09-27 1985-09-27 Thin film forming device

Publications (2)

Publication Number Publication Date
JPS6274072A true JPS6274072A (en) 1987-04-04
JPS642188B2 JPS642188B2 (en) 1989-01-13

Family

ID=16651341

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21416785A Granted JPS6274072A (en) 1985-09-27 1985-09-27 Thin film forming device

Country Status (1)

Country Link
JP (1) JPS6274072A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6869483B2 (en) * 1998-03-21 2005-03-22 Joachim Sacher Coating process and apparatus
WO2014083727A1 (en) * 2012-11-30 2014-06-05 キヤノンアネルバ株式会社 Sputtering device and substrate treatment device
US10062551B2 (en) 2012-11-30 2018-08-28 Canon Anelva Corporation Sputtering apparatus and substrate processing apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6869483B2 (en) * 1998-03-21 2005-03-22 Joachim Sacher Coating process and apparatus
WO2014083727A1 (en) * 2012-11-30 2014-06-05 キヤノンアネルバ株式会社 Sputtering device and substrate treatment device
JP5922795B2 (en) * 2012-11-30 2016-05-24 キヤノンアネルバ株式会社 Sputtering apparatus and substrate processing apparatus
CN104812933B (en) * 2012-11-30 2017-03-08 佳能安内华股份有限公司 Sputtering unit and substrate board treatment
US9997339B2 (en) 2012-11-30 2018-06-12 Canon Anelva Corporation Sputtering apparatus and substrate processing apparatus
US10062551B2 (en) 2012-11-30 2018-08-28 Canon Anelva Corporation Sputtering apparatus and substrate processing apparatus
US10615012B2 (en) 2012-11-30 2020-04-07 Canon Anelva Corporation Sputtering apparatus and substrate processing apparatus

Also Published As

Publication number Publication date
JPS642188B2 (en) 1989-01-13

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