JPS6273272U - - Google Patents

Info

Publication number
JPS6273272U
JPS6273272U JP16426885U JP16426885U JPS6273272U JP S6273272 U JPS6273272 U JP S6273272U JP 16426885 U JP16426885 U JP 16426885U JP 16426885 U JP16426885 U JP 16426885U JP S6273272 U JPS6273272 U JP S6273272U
Authority
JP
Japan
Prior art keywords
photocoupler
judgment
high voltage
test device
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16426885U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16426885U priority Critical patent/JPS6273272U/ja
Publication of JPS6273272U publication Critical patent/JPS6273272U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は本考案の一実施例を示し、第
1図は全体構成図、第2図は測定判定部の回路ブ
ロツク図、第3図は従来の試験装置の回路ブロツ
ク図である。 10……高電圧発生回路、11……コンデンサ
、12……抵抗群、13A〜13N……試料、1
4A〜14N……測定判定部、15(A〜Nは省
略、以下同じ)……電流電圧変換回路、16……
コンパレータ、17……ラツチ・タイミング回路
、18……ホトカプラ、19……DC/DCコン
バータ。
Fig. 1 and Fig. 2 show an embodiment of the present invention, Fig. 1 is an overall configuration diagram, Fig. 2 is a circuit block diagram of the measurement judgment section, and Fig. 3 is a circuit block diagram of a conventional test device. be. 10...High voltage generation circuit, 11...Capacitor, 12...Resistor group, 13A to 13N...Sample, 1
4A to 14N...Measurement judgment section, 15 (A to N are omitted, the same applies hereinafter)...Current voltage conversion circuit, 16...
Comparator, 17... Latch timing circuit, 18... Photocoupler, 19... DC/DC converter.

Claims (1)

【実用新案登録請求の範囲】 共通の高電圧発生回路の出力端にパルス吸収用
コンデンサを接続するとともに、被試験ホトカプ
ラごとにそれぞれ抵抗を介して高電圧を印加する
複数個の分岐路および各分岐路の絶縁電流を測定
し被試験ホトカプラの耐圧を判断する個別の測定
判定部を設けた試験装置であつて、 前記各測定判定部は、絶縁形のDC/DCコン
バータで電源が供給され、ホトカプラによつて判
定信号を出力することを特徴とするホトカプラ耐
電圧試験装置。
[Claim for Utility Model Registration] A pulse absorbing capacitor is connected to the output end of a common high voltage generation circuit, and multiple branch paths and each branch to which a high voltage is applied via a resistor to each photocoupler under test. The test device is equipped with individual measurement/judgment sections that measure the insulation current of the circuit and judge the withstand voltage of the photocoupler under test, and each of the measurement/judgment sections is powered by an isolated DC/DC converter, and the photocoupler 1. A photocoupler withstand voltage test device, characterized in that it outputs a judgment signal based on
JP16426885U 1985-10-25 1985-10-25 Pending JPS6273272U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16426885U JPS6273272U (en) 1985-10-25 1985-10-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16426885U JPS6273272U (en) 1985-10-25 1985-10-25

Publications (1)

Publication Number Publication Date
JPS6273272U true JPS6273272U (en) 1987-05-11

Family

ID=31093228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16426885U Pending JPS6273272U (en) 1985-10-25 1985-10-25

Country Status (1)

Country Link
JP (1) JPS6273272U (en)

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