JPH0339183U - - Google Patents
Info
- Publication number
- JPH0339183U JPH0339183U JP9923789U JP9923789U JPH0339183U JP H0339183 U JPH0339183 U JP H0339183U JP 9923789 U JP9923789 U JP 9923789U JP 9923789 U JP9923789 U JP 9923789U JP H0339183 U JPH0339183 U JP H0339183U
- Authority
- JP
- Japan
- Prior art keywords
- surge
- test device
- switching circuit
- circuit
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案の一実施例を示すブロツク図で
あり、第２図は試料切換回路及びタイミングコン
トロール回路の詳細な回路図であり、第３図は本
考案の測定タイミング図である。第４図は他の実
施例の試料切換回路図である。また第５図は従来
のブロツク図であり、第６図はサージ発生回路部
内の回路図であり、第７図は試料に印加されるサ
ージ電圧の波形図である。
１……試験電源部、２……サージ発生回路部、
３……試料１〜ｎ、４……コンデンサ、５……抵
抗、６……スイツチ、７……実施例１による試料
切換回路部、８……タイミングコントロール回路
、９……実施例２による試料切換回路部、１０…
…試料切換回路リレー、１１……半導体素子。
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a detailed circuit diagram of a sample switching circuit and a timing control circuit, and FIG. 3 is a measurement timing diagram of the present invention. FIG. 4 is a sample switching circuit diagram of another embodiment. Further, FIG. 5 is a conventional block diagram, FIG. 6 is a circuit diagram of the inside of the surge generating circuit, and FIG. 7 is a waveform diagram of the surge voltage applied to the sample. 1... Test power supply section, 2... Surge generation circuit section,
3... Samples 1 to n, 4... Capacitor, 5... Resistor, 6... Switch, 7... Sample switching circuit section according to Example 1, 8... Timing control circuit, 9... Sample according to Example 2 Switching circuit section, 10...
...Sample switching circuit relay, 11...Semiconductor element.
Claims (1)
装置において、複数個の試料に順次規定のサージ
電圧を印加するための試料切換回路及びタイミン
グコントロール回路を設けたことを特徴とするサ
ージ試験装置。 A surge test device for evaluating the surge resistance of a semiconductor device, characterized in that the surge test device is equipped with a sample switching circuit and a timing control circuit for sequentially applying a specified surge voltage to a plurality of samples.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9923789U JPH0339183U (en) | 1989-08-24 | 1989-08-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9923789U JPH0339183U (en) | 1989-08-24 | 1989-08-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0339183U true JPH0339183U (en) | 1991-04-16 |
Family
ID=31648294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9923789U Pending JPH0339183U (en) | 1989-08-24 | 1989-08-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0339183U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009069147A (en) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | Measurement system and method |
-
1989
- 1989-08-24 JP JP9923789U patent/JPH0339183U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009069147A (en) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | Measurement system and method |
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