JPS61195428U - - Google Patents
Info
- Publication number
- JPS61195428U JPS61195428U JP8060685U JP8060685U JPS61195428U JP S61195428 U JPS61195428 U JP S61195428U JP 8060685 U JP8060685 U JP 8060685U JP 8060685 U JP8060685 U JP 8060685U JP S61195428 U JPS61195428 U JP S61195428U
- Authority
- JP
- Japan
- Prior art keywords
- photodiode
- signal
- outputs
- comparison
- photodiodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
Description
第１図は本考案に係る測定装置の構成図、第２
図Ａ〜Ｉはその動作説明のための各部の出力波形
図、第３図は従来例を示す構成図である。
１…測定対象、１０…信号用ホトダイオード、
２０…比較用ホトダイオード、ａ…信号出力。
Figure 1 is a configuration diagram of the measuring device according to the present invention, Figure 2
Figures A to I are output waveform diagrams of each part to explain its operation, and Figure 3 is a configuration diagram showing a conventional example. 1...Measurement object, 10...Signal photodiode,
20... Comparison photodiode, a... Signal output.
Claims (1)
用ホトダイオードとを互いに並列的に設け、前記
ホトダイオードの出力を比較して該出力に差が生
じているとき、前記信号用ホトダイオードの信号
出力をホールドするようにしたことを特徴とする
測光装置。 A signal photodiode and a comparison photodiode are provided in parallel with each other for the measurement target, and when the outputs of the photodiodes are compared and a difference occurs in the outputs, the signal output of the signal photodiode is held. A photometric device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985080606U JPH074553Y2 (en) | 1985-05-29 | 1985-05-29 | Photometric device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985080606U JPH074553Y2 (en) | 1985-05-29 | 1985-05-29 | Photometric device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61195428U true JPS61195428U (en) | 1986-12-05 |
| JPH074553Y2 JPH074553Y2 (en) | 1995-02-01 |
Family
ID=30626613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985080606U Expired - Lifetime JPH074553Y2 (en) | 1985-05-29 | 1985-05-29 | Photometric device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH074553Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4634478B2 (en) * | 2008-03-07 | 2011-02-16 | 株式会社東芝 | Sample inspection apparatus and sample inspection method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50118990U (en) * | 1974-03-12 | 1975-09-29 |
-
1985
- 1985-05-29 JP JP1985080606U patent/JPH074553Y2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50118990U (en) * | 1974-03-12 | 1975-09-29 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH074553Y2 (en) | 1995-02-01 |