JPH01142820U - - Google Patents
Info
- Publication number
- JPH01142820U JPH01142820U JP4093588U JP4093588U JPH01142820U JP H01142820 U JPH01142820 U JP H01142820U JP 4093588 U JP4093588 U JP 4093588U JP 4093588 U JP4093588 U JP 4093588U JP H01142820 U JPH01142820 U JP H01142820U
- Authority
- JP
- Japan
- Prior art keywords
- photodiodes
- outputs
- sum
- held
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
第１図は本考案の一実施例を示す信号処理のた
めのブロツク図である。第２図は従来技術に係る
信号処理のためのブロツク図である。
１，２……フオトダイオード、ａ，ｂ……フオ
トダイオードからの出力、Ａ……測定対象。
FIG. 1 is a block diagram for signal processing showing an embodiment of the present invention. FIG. 2 is a block diagram for signal processing according to the prior art. 1, 2...Photodiode, a, b...Output from photodiode, A...Measurement target.
Claims (1)
いに並列的に設け、これら両フオトダイオードの
出力を比較して差が生じたとき、前記両フオトダ
イオードの出力の和をホールドするようにしたこ
とを特徴とするガス分折計。 Two photodiodes are provided in parallel to each other for the object to be measured, and when the outputs of these two photodiodes are compared and a difference occurs, the sum of the outputs of the two photodiodes is held. gas spectrometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4093588U JPH058498Y2 (en) | 1988-03-26 | 1988-03-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4093588U JPH058498Y2 (en) | 1988-03-26 | 1988-03-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01142820U true JPH01142820U (en) | 1989-09-29 |
| JPH058498Y2 JPH058498Y2 (en) | 1993-03-03 |
Family
ID=31267391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4093588U Expired - Lifetime JPH058498Y2 (en) | 1988-03-26 | 1988-03-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH058498Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4634478B2 (en) * | 2008-03-07 | 2011-02-16 | 株式会社東芝 | Sample inspection apparatus and sample inspection method |
-
1988
- 1988-03-26 JP JP4093588U patent/JPH058498Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH058498Y2 (en) | 1993-03-03 |