JPH0159880U - - Google Patents
Info
- Publication number
- JPH0159880U JPH0159880U JP15640887U JP15640887U JPH0159880U JP H0159880 U JPH0159880 U JP H0159880U JP 15640887 U JP15640887 U JP 15640887U JP 15640887 U JP15640887 U JP 15640887U JP H0159880 U JPH0159880 U JP H0159880U
- Authority
- JP
- Japan
- Prior art keywords
- positional
- terminals
- power supply
- whose
- bias power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案の一実施例の回路図、第２図は
従来のダイオード試験装置の第１の例の回路図、
第３図は従来のダイオード試験装置の第２の例の
回路図である。
１……バイアス電源、２……デイジタル電圧電
源、３……電流・電圧変換器、４……デイジタル
電圧計、５ｉ……第ｉの逆並列ダイオード、Ｃｉ
……第ｉの定位閉路端子、Ｋｉ……第ｉの電流切
換スイツチ、Ｏｉ……第ｉの定位開路端子、Ｐｉ
……第ｉの被試験ダイオード、Ｔｉ……第ｉの接
片端子。
FIG. 1 is a circuit diagram of an embodiment of the present invention, FIG. 2 is a circuit diagram of a first example of a conventional diode test device,
FIG. 3 is a circuit diagram of a second example of a conventional diode testing device. DESCRIPTION OF SYMBOLS 1... Bias power supply, 2... Digital voltage power supply, 3... Current/voltage converter, 4... Digital voltmeter, 5i... i-th anti-parallel diode, Ci
...i-th positional closing terminal, Ki...i-th current changeover switch, Oi...i-th positional opening terminal, Pi
...i-th diode under test, Ti...i-th contact terminal.
Claims (1)
の一端に接続して定電圧あるいは定電流を与える
バイアス電源。 (B) 接片端子が前記試験ダイオードの対応する
他端に接続し、定位閉路端子が前記バイアス電源
の他端に接続し、定位開路端子が電流計に接続す
る複数の切換スイツチ。 (C) 前記定位開路端子及び定位閉路端子間にそ
れぞれ挿入された逆並列接続のダイオードを有す
る複数の測定切換スイツチ。 を含むことを特徴とするダイオード試験装置。[Claims for Utility Model Registration] (A) A bias power supply with one output end connected to one end of each diode under test to provide a constant voltage or constant current. (B) A plurality of changeover switches whose contact terminals are connected to the corresponding other ends of the test diodes, whose positional closing terminals are connected to the other end of the bias power supply, and whose positional open circuit terminals are connected to the ammeter. (C) A plurality of measurement changeover switches each having anti-parallel connected diodes inserted between the positional open circuit terminal and the positional close circuit terminal. A diode test device comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15640887U JPH0159880U (en) | 1987-10-12 | 1987-10-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15640887U JPH0159880U (en) | 1987-10-12 | 1987-10-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0159880U true JPH0159880U (en) | 1989-04-14 |
Family
ID=31434920
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15640887U Pending JPH0159880U (en) | 1987-10-12 | 1987-10-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0159880U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013148538A (en) * | 2012-01-23 | 2013-08-01 | Shindengen Electric Mfg Co Ltd | Semiconductor testing device, semiconductor testing method and semiconductor device |
-
1987
- 1987-10-12 JP JP15640887U patent/JPH0159880U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013148538A (en) * | 2012-01-23 | 2013-08-01 | Shindengen Electric Mfg Co Ltd | Semiconductor testing device, semiconductor testing method and semiconductor device |
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