JPH0438048U - - Google Patents
Info
- Publication number
- JPH0438048U JPH0438048U JP7965890U JP7965890U JPH0438048U JP H0438048 U JPH0438048 U JP H0438048U JP 7965890 U JP7965890 U JP 7965890U JP 7965890 U JP7965890 U JP 7965890U JP H0438048 U JPH0438048 U JP H0438048U
- Authority
- JP
- Japan
- Prior art keywords
- switch
- diode
- parallel
- series circuit
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図はこの考案の実施例を示す接続図、第２
図は第１図でスイツチＫ３をＯＮとした時の電流
設定値に対するＩＣ素子へ供給される出力電流特
性の例を示す図、第３図は第２図に示す出力電流
でダイオードの順方向特性を設定した例を示す図
、第４図は従来のＩＣ試験装置の直流モジユール
を示す接続図、第５図は第４図の直流モジユール
における電流設定値に対する実際の出力電流の特
性例を示す図、第６図は第５図に示した特性の出
力電流でダイオードの順方向特性を測定した例を
示す図、第７図は供給電流レンジを切替えて順方
向特性を測定した例を示す図である。
Figure 1 is a connection diagram showing an embodiment of this invention, Figure 2
The figure shows an example of the output current characteristics supplied to the IC element with respect to the current setting value when switch K3 is turned on in Figure 1, and Figure 3 shows the forward direction characteristics of the diode with the output current shown in Figure 2. Fig. 4 is a connection diagram showing a DC module of a conventional IC test device, and Fig. 5 is a diagram showing an example of the characteristics of the actual output current with respect to the current setting value in the DC module of Fig. 4. , Figure 6 is a diagram showing an example of measuring the forward characteristics of a diode with the output current having the characteristics shown in Figure 5, and Figure 7 is a diagram showing an example of measuring the forward characteristics by switching the supply current range. be.
Claims (1)
験ＩＣ素子へ供給して試験を行うＩＣ試験装置に
おいて、 上記アナログ電流の通路と直列に挿入された第
１スイツチと、 その第１スイツチと並列に接続された、第１ダ
イオードおよび第２スイツチの直列回路と、 上記第１スイツチと並列に接続された、上記第
１ダイオードと逆極性の第２ダイオードおよび第
３スイツチの直列回路と、 を設けたことを特徴とするＩＣ試験装置。[Scope of Claim for Utility Model Registration] In an IC testing device that performs testing by converting a set current value into an analog current and supplying it to an IC device under test, a first switch inserted in series with the analog current path; , a series circuit of a first diode and a second switch connected in parallel with the first switch, and a second diode and a third switch of opposite polarity to the first diode connected in parallel with the first switch. An IC testing device characterized by comprising a series circuit of;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7965890U JPH0438048U (en) | 1990-07-25 | 1990-07-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7965890U JPH0438048U (en) | 1990-07-25 | 1990-07-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0438048U true JPH0438048U (en) | 1992-03-31 |
Family
ID=31624014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7965890U Pending JPH0438048U (en) | 1990-07-25 | 1990-07-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0438048U (en) |
-
1990
- 1990-07-25 JP JP7965890U patent/JPH0438048U/ja active Pending