JPS6259243B2 - - Google Patents

Info

Publication number
JPS6259243B2
JPS6259243B2 JP22008185A JP22008185A JPS6259243B2 JP S6259243 B2 JPS6259243 B2 JP S6259243B2 JP 22008185 A JP22008185 A JP 22008185A JP 22008185 A JP22008185 A JP 22008185A JP S6259243 B2 JPS6259243 B2 JP S6259243B2
Authority
JP
Japan
Prior art keywords
interference signal
thickness
maximum value
measured
epitaxial growth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP22008185A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61111407A (ja
Inventor
Masashi Yamamoto
Masahiko Ozawa
Koji Masutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
NTT Inc
Original Assignee
Hitachi Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Nippon Telegraph and Telephone Corp filed Critical Hitachi Ltd
Priority to JP22008185A priority Critical patent/JPS61111407A/ja
Publication of JPS61111407A publication Critical patent/JPS61111407A/ja
Publication of JPS6259243B2 publication Critical patent/JPS6259243B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP22008185A 1985-10-04 1985-10-04 付着層の厚さ測定法 Granted JPS61111407A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22008185A JPS61111407A (ja) 1985-10-04 1985-10-04 付着層の厚さ測定法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22008185A JPS61111407A (ja) 1985-10-04 1985-10-04 付着層の厚さ測定法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP15101678A Division JPS5578203A (en) 1978-12-08 1978-12-08 Interference signal processing method for fourier transformation spectrometer and measurement of thickness of adhered layer using it

Publications (2)

Publication Number Publication Date
JPS61111407A JPS61111407A (ja) 1986-05-29
JPS6259243B2 true JPS6259243B2 (enExample) 1987-12-10

Family

ID=16745633

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22008185A Granted JPS61111407A (ja) 1985-10-04 1985-10-04 付着層の厚さ測定法

Country Status (1)

Country Link
JP (1) JPS61111407A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100939538B1 (ko) * 2007-12-14 2010-02-03 (주) 인텍플러스 입체 형상 측정 장치

Also Published As

Publication number Publication date
JPS61111407A (ja) 1986-05-29

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