JPS6257175U - - Google Patents
Info
- Publication number
- JPS6257175U JPS6257175U JP14803485U JP14803485U JPS6257175U JP S6257175 U JPS6257175 U JP S6257175U JP 14803485 U JP14803485 U JP 14803485U JP 14803485 U JP14803485 U JP 14803485U JP S6257175 U JPS6257175 U JP S6257175U
- Authority
- JP
- Japan
- Prior art keywords
- burn
- board
- semiconductor device
- inspection
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 15
- 238000007689 inspection Methods 0.000 claims description 7
- 238000003780 insertion Methods 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims description 4
- 238000005070 sampling Methods 0.000 claims description 2
- 230000002950 deficient Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 210000000078 claw Anatomy 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985148034U JPH051831Y2 (cg-RX-API-DMAC10.html) | 1985-09-30 | 1985-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985148034U JPH051831Y2 (cg-RX-API-DMAC10.html) | 1985-09-30 | 1985-09-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6257175U true JPS6257175U (cg-RX-API-DMAC10.html) | 1987-04-09 |
| JPH051831Y2 JPH051831Y2 (cg-RX-API-DMAC10.html) | 1993-01-18 |
Family
ID=31061935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985148034U Expired - Lifetime JPH051831Y2 (cg-RX-API-DMAC10.html) | 1985-09-30 | 1985-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH051831Y2 (cg-RX-API-DMAC10.html) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5764177A (en) * | 1980-10-06 | 1982-04-19 | Nec Corp | Testing device for service life |
-
1985
- 1985-09-30 JP JP1985148034U patent/JPH051831Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5764177A (en) * | 1980-10-06 | 1982-04-19 | Nec Corp | Testing device for service life |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH051831Y2 (cg-RX-API-DMAC10.html) | 1993-01-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3682513D1 (de) | Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten. | |
| JP2000074991A (ja) | 半導体チップ用パッケージの良否検査方法及びその装置とこれに用いるプローブピン構造 | |
| JPS6344443U (cg-RX-API-DMAC10.html) | ||
| JPH0310675Y2 (cg-RX-API-DMAC10.html) | ||
| JPS63185572U (cg-RX-API-DMAC10.html) | ||
| JPH1038970A (ja) | 検査治具および自動検査装置 | |
| JPH0815361A (ja) | プリント配線板の検査方法 | |
| JPH0623976Y2 (ja) | インサーキットテスタ用ピンボード構造 | |
| JPH0138531Y2 (cg-RX-API-DMAC10.html) | ||
| JPS6230969A (ja) | 検査装置 | |
| KR0134906Y1 (ko) | 반도체 테스트 프로브 카드 장치 | |
| JPS635479U (cg-RX-API-DMAC10.html) | ||
| JPH051831Y2 (cg-RX-API-DMAC10.html) | ||
| JPH0237683A (ja) | 半導体装置測定用ソケット | |
| JPS6348164U (cg-RX-API-DMAC10.html) | ||
| JPH0478579U (cg-RX-API-DMAC10.html) | ||
| JPS61161684U (cg-RX-API-DMAC10.html) | ||
| JPS5834063U (ja) | インサ−キツトテスタ用万能接続治具 | |
| JPS62108877U (cg-RX-API-DMAC10.html) | ||
| JPH02103283U (cg-RX-API-DMAC10.html) | ||
| JPS61258441A (ja) | 半導体検査方法 | |
| JPS59168173U (ja) | プリント基板回路検査用プロ−ブユニツト | |
| JPS60216474A (ja) | ピンソケツトの半田付け方法及び装置 | |
| JPS60152970U (ja) | プリント基板検査装置 | |
| JPH04265871A (ja) | バーンインチャンバー |