JPS6253043B2 - - Google Patents

Info

Publication number
JPS6253043B2
JPS6253043B2 JP56099353A JP9935381A JPS6253043B2 JP S6253043 B2 JPS6253043 B2 JP S6253043B2 JP 56099353 A JP56099353 A JP 56099353A JP 9935381 A JP9935381 A JP 9935381A JP S6253043 B2 JPS6253043 B2 JP S6253043B2
Authority
JP
Japan
Prior art keywords
radiation
steel plate
radiation detector
radiation source
width direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56099353A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58707A (ja
Inventor
Tatsuo Tsujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56099353A priority Critical patent/JPS58707A/ja
Publication of JPS58707A publication Critical patent/JPS58707A/ja
Publication of JPS6253043B2 publication Critical patent/JPS6253043B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56099353A 1981-06-26 1981-06-26 板材の断面板厚形状測定装置 Granted JPS58707A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56099353A JPS58707A (ja) 1981-06-26 1981-06-26 板材の断面板厚形状測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56099353A JPS58707A (ja) 1981-06-26 1981-06-26 板材の断面板厚形状測定装置

Publications (2)

Publication Number Publication Date
JPS58707A JPS58707A (ja) 1983-01-05
JPS6253043B2 true JPS6253043B2 (enrdf_load_stackoverflow) 1987-11-09

Family

ID=14245236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56099353A Granted JPS58707A (ja) 1981-06-26 1981-06-26 板材の断面板厚形状測定装置

Country Status (1)

Country Link
JP (1) JPS58707A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230009A (ja) * 1984-04-28 1985-11-15 Toshiba Corp 放射線厚さ計
KR100866888B1 (ko) 2006-10-04 2008-11-04 한국원자력연구원 와이어 수집 전극 및 이온 챔버 내 혼합 가압 기체를이용한, 감도가 향상된 철판 두께 측정용 방사선 센서 및측정 방법
KR100856276B1 (ko) 2007-05-15 2008-09-03 주식회사 포스코 압연 소재 두께 측정 장치

Also Published As

Publication number Publication date
JPS58707A (ja) 1983-01-05

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