JPS6252814B2 - - Google Patents
Info
- Publication number
- JPS6252814B2 JPS6252814B2 JP55048816A JP4881680A JPS6252814B2 JP S6252814 B2 JPS6252814 B2 JP S6252814B2 JP 55048816 A JP55048816 A JP 55048816A JP 4881680 A JP4881680 A JP 4881680A JP S6252814 B2 JPS6252814 B2 JP S6252814B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- chamber
- irradiation
- irradiation area
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4881680A JPS56145330A (en) | 1980-04-14 | 1980-04-14 | Measuring device for light-scattering particulate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4881680A JPS56145330A (en) | 1980-04-14 | 1980-04-14 | Measuring device for light-scattering particulate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56145330A JPS56145330A (en) | 1981-11-12 |
JPS6252814B2 true JPS6252814B2 (enrdf_load_stackoverflow) | 1987-11-06 |
Family
ID=12813728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4881680A Granted JPS56145330A (en) | 1980-04-14 | 1980-04-14 | Measuring device for light-scattering particulate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56145330A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01125919U (enrdf_load_stackoverflow) * | 1988-02-22 | 1989-08-28 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62220833A (ja) * | 1986-03-22 | 1987-09-29 | Sigma Tec:Kk | 光散乱式微粒子センサ |
JP4157212B2 (ja) * | 1999-02-15 | 2008-10-01 | 松下電工株式会社 | 光散乱式粒子検知センサ |
JP2006120697A (ja) * | 2004-10-19 | 2006-05-11 | Nichicon Corp | アルミニウム電解コンデンサ |
-
1980
- 1980-04-14 JP JP4881680A patent/JPS56145330A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01125919U (enrdf_load_stackoverflow) * | 1988-02-22 | 1989-08-28 |
Also Published As
Publication number | Publication date |
---|---|
JPS56145330A (en) | 1981-11-12 |
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