JPS56145330A - Measuring device for light-scattering particulate - Google Patents

Measuring device for light-scattering particulate

Info

Publication number
JPS56145330A
JPS56145330A JP4881680A JP4881680A JPS56145330A JP S56145330 A JPS56145330 A JP S56145330A JP 4881680 A JP4881680 A JP 4881680A JP 4881680 A JP4881680 A JP 4881680A JP S56145330 A JPS56145330 A JP S56145330A
Authority
JP
Japan
Prior art keywords
light
bent
constitution
plane mirror
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4881680A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6252814B2 (enrdf_load_stackoverflow
Inventor
Tamio Hoshina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rion Co Ltd
Original Assignee
Rion Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rion Co Ltd filed Critical Rion Co Ltd
Priority to JP4881680A priority Critical patent/JPS56145330A/ja
Publication of JPS56145330A publication Critical patent/JPS56145330A/ja
Publication of JPS6252814B2 publication Critical patent/JPS6252814B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP4881680A 1980-04-14 1980-04-14 Measuring device for light-scattering particulate Granted JPS56145330A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4881680A JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4881680A JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Publications (2)

Publication Number Publication Date
JPS56145330A true JPS56145330A (en) 1981-11-12
JPS6252814B2 JPS6252814B2 (enrdf_load_stackoverflow) 1987-11-06

Family

ID=12813728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4881680A Granted JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Country Status (1)

Country Link
JP (1) JPS56145330A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220833A (ja) * 1986-03-22 1987-09-29 Sigma Tec:Kk 光散乱式微粒子センサ
JP2000235000A (ja) * 1999-02-15 2000-08-29 Matsushita Electric Works Ltd 光散乱式粒子検知センサ
JP2006120697A (ja) * 2004-10-19 2006-05-11 Nichicon Corp アルミニウム電解コンデンサ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01125919U (enrdf_load_stackoverflow) * 1988-02-22 1989-08-28

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220833A (ja) * 1986-03-22 1987-09-29 Sigma Tec:Kk 光散乱式微粒子センサ
JP2000235000A (ja) * 1999-02-15 2000-08-29 Matsushita Electric Works Ltd 光散乱式粒子検知センサ
JP2006120697A (ja) * 2004-10-19 2006-05-11 Nichicon Corp アルミニウム電解コンデンサ

Also Published As

Publication number Publication date
JPS6252814B2 (enrdf_load_stackoverflow) 1987-11-06

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