JPS56145330A - Measuring device for light-scattering particulate - Google Patents

Measuring device for light-scattering particulate

Info

Publication number
JPS56145330A
JPS56145330A JP4881680A JP4881680A JPS56145330A JP S56145330 A JPS56145330 A JP S56145330A JP 4881680 A JP4881680 A JP 4881680A JP 4881680 A JP4881680 A JP 4881680A JP S56145330 A JPS56145330 A JP S56145330A
Authority
JP
Japan
Prior art keywords
light
bent
constitution
plane mirror
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4881680A
Other languages
Japanese (ja)
Other versions
JPS6252814B2 (en
Inventor
Tamio Hoshina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rion Co Ltd
Original Assignee
Rion Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rion Co Ltd filed Critical Rion Co Ltd
Priority to JP4881680A priority Critical patent/JPS56145330A/en
Publication of JPS56145330A publication Critical patent/JPS56145330A/en
Publication of JPS6252814B2 publication Critical patent/JPS6252814B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To shorten the size of the device in the direction of an optical axis and thereby miniaturize the constitution of an optical system by adopting a constitution wherein irradiating and light-receiving systems are bent at an angle of 180 deg. by using a plane reflecting mirror. CONSTITUTION:Irradiating light beams from a light source 22 which pass through a lens system 23 are bent at an angle of 90 deg. approximately by a plane mirror 20 and condensed into an irradiation region P to irradiate sample air, and further are bent by a plane mirror 21 and absorbed in a phototrap chamber 19 to which photoabsorption processing is applied. Scattered lights generated in the irradiation region P by the particulates in the sample air are bent at an angle of 90 deg. approximately by a plane mirror 28 and condensed into the light-receiving surface of a photoelectric transducer 30 by a lens system 31. The component of the scattered lights which is not projected directly on the plane mirror 28 is bent at an angle of 90 deg. by a plane mirror 29 and absorbed in a phototrap chamber 25. An irradiating chamber 18 and a light-receiving chamber 24 are set in parallel to the path of the sample air wherein the irradiation region P is set, while the optical axes of the irradiating light, scattering light, etc. are bent by the plane mirrors 20 and 28, and thus the constitution of the optical system can be miniaturized.
JP4881680A 1980-04-14 1980-04-14 Measuring device for light-scattering particulate Granted JPS56145330A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4881680A JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4881680A JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Publications (2)

Publication Number Publication Date
JPS56145330A true JPS56145330A (en) 1981-11-12
JPS6252814B2 JPS6252814B2 (en) 1987-11-06

Family

ID=12813728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4881680A Granted JPS56145330A (en) 1980-04-14 1980-04-14 Measuring device for light-scattering particulate

Country Status (1)

Country Link
JP (1) JPS56145330A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220833A (en) * 1986-03-22 1987-09-29 Sigma Tec:Kk Light scatter type particulate sensor
JP2000235000A (en) * 1999-02-15 2000-08-29 Matsushita Electric Works Ltd Light-scattering-type particle detection sensor
JP2006120697A (en) * 2004-10-19 2006-05-11 Nichicon Corp Aluminum electrolytic capacitor

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01125919U (en) * 1988-02-22 1989-08-28

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220833A (en) * 1986-03-22 1987-09-29 Sigma Tec:Kk Light scatter type particulate sensor
JP2000235000A (en) * 1999-02-15 2000-08-29 Matsushita Electric Works Ltd Light-scattering-type particle detection sensor
JP2006120697A (en) * 2004-10-19 2006-05-11 Nichicon Corp Aluminum electrolytic capacitor

Also Published As

Publication number Publication date
JPS6252814B2 (en) 1987-11-06

Similar Documents

Publication Publication Date Title
EP0148497A3 (en) Method and device for guiding and collecting light in photometry or the like
PT88981A (en) PORTABLE PARTICLE ANALYZER AND RESPECTIVE PARTICLE ANALYSIS PROCESS
KR940013473A (en) Lighting and Imaging Subsystem for Lens Inspection Systems
WO1998052025A1 (en) Surface inspection instrument and surface inspection method
GR3004812T3 (en)
DE3373212D1 (en) Detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample irradiated at a specified angle of incidence
KR890010554A (en) Photoelectric particle detector
JPS56145330A (en) Measuring device for light-scattering particulate
AU8285698A (en) Allergen detector system and method
JPS59164945A (en) Optical analyzing meter
WO1991014935A1 (en) A method and an apparatus for cleaning control
JPS57154206A (en) Focusing device
JPS5444582A (en) Smoke detector
JP3040131B2 (en) Spherical surface scratch inspection device
JPS60214238A (en) Fine particle detector
JPS56157841A (en) Detecting apparatus for surface defect of body
JP2595315B2 (en) Light scattering measuring device
SU1265822A1 (en) Smoke detector
WO1991002486A1 (en) Skin pattern sensing apparatus
JPS61186806A (en) Fault detecting device for transparent body
FR2377573A1 (en) Optical system for measuring size of particles suspended in air - maintains uniform intensity of illumination in measuring zone
JPS57169712A (en) Connecting device for optical fiber
JPS57190246A (en) Detector for lens defect
JPS6484119A (en) Object state detector
JPS56152249A (en) Image pickup device for inspection