JPS62451B2 - - Google Patents

Info

Publication number
JPS62451B2
JPS62451B2 JP51118051A JP11805176A JPS62451B2 JP S62451 B2 JPS62451 B2 JP S62451B2 JP 51118051 A JP51118051 A JP 51118051A JP 11805176 A JP11805176 A JP 11805176A JP S62451 B2 JPS62451 B2 JP S62451B2
Authority
JP
Japan
Prior art keywords
sample
electron beam
detector
thin film
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51118051A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5343596A (en
Inventor
Hiroyoshi Soejima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11805176A priority Critical patent/JPS5343596A/ja
Publication of JPS5343596A publication Critical patent/JPS5343596A/ja
Publication of JPS62451B2 publication Critical patent/JPS62451B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP11805176A 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device Granted JPS5343596A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11805176A JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11805176A JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Publications (2)

Publication Number Publication Date
JPS5343596A JPS5343596A (en) 1978-04-19
JPS62451B2 true JPS62451B2 (https=) 1987-01-08

Family

ID=14726798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11805176A Granted JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Country Status (1)

Country Link
JP (1) JPS5343596A (https=)

Also Published As

Publication number Publication date
JPS5343596A (en) 1978-04-19

Similar Documents

Publication Publication Date Title
US4211924A (en) Transmission-type scanning charged-particle beam microscope
US4587425A (en) Electron beam apparatus and electron collectors therefor
JPH043952A (ja) 表面解析方法および表面解析装置
US4399360A (en) Transmission electron microscope employing sequential pixel acquistion for display
US7205542B1 (en) Scanning electron microscope with curved axes
JPS6127856B2 (https=)
JPS62451B2 (https=)
JP2025097962A (ja) 荷電粒子ビーム及びアクティブピクセル制御センサを使用して試料を分析するためのシステム及び方法
US4264815A (en) Apparatus for X-ray analysis of a specimen with local resolution
JPH05146426A (ja) 散乱線トモグラフイ及び散乱線トモグラフイ装置
JPH08285947A (ja) 電子検出装置及びこれを備えた電子顕微鏡
JP2966438B2 (ja) 走査干渉電子顕微鏡
JP4045058B2 (ja) 多重荷電粒子検出器、及びそれを用いた走査透過電子顕微鏡
JPH1167138A (ja) 微小領域観察装置
JP3754767B2 (ja) アルミニウム板中の非金属介在物検出方法および装置
JP2003004668A (ja) X線検査装置
JPS5823172Y2 (ja) ハンシヤデンシケンシユツソウチ
JP2849491B2 (ja) X線断層撮影方法とその装置
JP2005005056A (ja) 走査電子顕微鏡
JPH09190793A (ja) 走査電子顕微鏡
JPH082603Y2 (ja) X線分析装置
JP2726415B2 (ja) 微弱光像拡大観察装置
JPH0352179B2 (https=)
JPH04294040A (ja) X線イメージ装置
JPS6326925Y2 (https=)