JPS6244279U - - Google Patents

Info

Publication number
JPS6244279U
JPS6244279U JP13641985U JP13641985U JPS6244279U JP S6244279 U JPS6244279 U JP S6244279U JP 13641985 U JP13641985 U JP 13641985U JP 13641985 U JP13641985 U JP 13641985U JP S6244279 U JPS6244279 U JP S6244279U
Authority
JP
Japan
Prior art keywords
test
semiconductor device
voltage application
heater block
brought
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13641985U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13641985U priority Critical patent/JPS6244279U/ja
Publication of JPS6244279U publication Critical patent/JPS6244279U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す縦断面図、第
2図は従来式の高温動作あるいは高温電圧印加試
験装置を示す縦断面図である。 1……被試験半導体装置、2……ヒータブロツ
ク、2a……ヒータ、2b……温度センサ、3a
……スプリング、3b……押え金具、4……リー
ド挿入用ソケツト、5……バイアス印加用電源、
6……温度コントロールユニツト。
FIG. 1 is a longitudinal sectional view showing an embodiment of the present invention, and FIG. 2 is a longitudinal sectional view showing a conventional high temperature operation or high temperature voltage application test apparatus. DESCRIPTION OF SYMBOLS 1... Semiconductor device under test, 2... Heater block, 2a... Heater, 2b... Temperature sensor, 3a
...Spring, 3b... Holding metal fitting, 4... Socket for lead insertion, 5... Power supply for bias application,
6...Temperature control unit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 高温下で半導体装置の動作試験あるいは電圧印
加試験を実施する試験装置において、被試験半導
体装置に温度コントローラを有するヒーターブロ
ツクを直接接触させたことを特徴とする半導体装
置の試験装置。
1. A test device for a semiconductor device that performs an operation test or a voltage application test of a semiconductor device at high temperatures, and is characterized in that a heater block having a temperature controller is brought into direct contact with the semiconductor device under test.
JP13641985U 1985-09-06 1985-09-06 Pending JPS6244279U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13641985U JPS6244279U (en) 1985-09-06 1985-09-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13641985U JPS6244279U (en) 1985-09-06 1985-09-06

Publications (1)

Publication Number Publication Date
JPS6244279U true JPS6244279U (en) 1987-03-17

Family

ID=31039512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13641985U Pending JPS6244279U (en) 1985-09-06 1985-09-06

Country Status (1)

Country Link
JP (1) JPS6244279U (en)

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