JPS6238317A - Data recording device - Google Patents

Abstract

PURPOSE:To record a measurement signal used to analyze the cause of abnormality by providing an abnormality detecting circuit which detects abnormality of each measurement signal from a specific combination of plural measurement signals and preserves storage and constituting an abnormal signal according to a purpose. CONSTITUTION:A combination of abnormal signals is set is a logic circuit 22 according to a purpose. Then,. an analog signal and a contact signal are inputted to a central processing unit 14 through input units 10 and 12 respectively. Those signals are processed and stored in an external storage device 16. In such a case, the analog signal and contact signal and other signals are inputted to the circuit 22 and processed by a combination of logical elements such as AND and OR to constitute an abnormal signal used to analyze sudden abnormality. Data of various measurement signals before and after a stored abnormal position are analyzed to investigate the cause of a fault due to the sudden abnormality.

Description

[Detailed description of the invention] [Industrial application field]

The present invention relates to a data recording device that is suitable for use in analyzing the causes of sudden abnormalities, diagnosing equipment, and monitoring operations in all industrial fields, and in particular, when an abnormal signal occurs in at least one of a plurality of measurement signals. In particular, the present invention relates to an improvement of a data recording device for storing the measurement signal and analyzing the cause of the abnormality.

[Conventional technology]

In the past, not only in steel mills but in all industrial fields, there have been many problems with production lines or quality caused by sudden abnormalities, especially when the sudden abnormalities occur instantaneously or - 2 to 3 times per day. When the abnormality occurs at the following low frequencies, it takes a great deal of effort to investigate the cause of the sudden abnormality. In recent years, data recording devices have been commercialized as a means to solve such problems, and are sold by various measuring instrument manufacturers. This existing data recording device utilizes the latest electronic technology, is small in size, has various additional functions, and is fully effective as a general-purpose Il device. This existing data recording device has a configuration as shown in FIG. 3, for example. In the figure, 16 to 16 of the target plant
The 64-point analog signal and the 4 to 8-point contact signal are input to the input circuits 10 and 12, each consisting of an insulated amplifier, etc.
Via Chuo 1! I! Attire! ! 14 is input. Those input signals are stored as data in the external storage device 16 and can be viewed on the recording device 18 if necessary. Since the external storage device 16 has a limited storage capacity M, in normal times, it stores the data of the first window until it reaches full capacity, and then sequentially erases the old data and stores the erased data. The data is stored in an endless manner by storing new data on top of the data. On the other hand, when a predetermined abnormal signal (it may be an on/off signal of a specific contact signal, or a signal exceeding the upper and lower limits of a specific analog signal) is input from the interrupt unit 20, the data is stored for a certain period of time. After that, the external storage device 1
16 is turned off. In this way, the data of the signals before and after the abnormal signal is input are stored in the external storage device r! 116. (Problems to be Solved by the Invention) However, the conventional data recording device adopts a method in which any one signal is arbitrarily selected from a plurality of input signals, etc., and is used as an abnormal signal. For example, when an abnormality signal must be constructed based on multiple signals, such as when used for analyzing and diagnosing sudden abnormalities in high-speed and complicated equipment such as plate thickness control devices in rolling mills in steel plants. had a problem in that it was not possible to construct an abnormal signal in the data recording device and input it to the interrupt unit 20. That is, for example, when operating by monitoring information from analog signal A, Suppose that the operating mode is changed from X to Y. In this case, in mode X, the signal A is abnormal at a certain upper limit, but in mode Y, no matter how high the signal A is, it is not abnormal. In the case where there is no abnormal signal, the conventional technology could not construct an abnormal signal.Also, simply two analog signals A
In the prior art, it has not been possible to generate an abnormality signal even when it is considered abnormal when all or any of the XBs reach the upper limit.

[Purpose of the invention]

The present invention has been made in view of the above-mentioned conventional problems, and is a data recording system that can optimally configure an abnormal signal according to the purpose and record measurement signals used for analyzing the cause of the abnormality without overflowing. The purpose is to provide four

[Means to solve the problem]

The present invention provides a data recording device for storing the measurement signal and analyzing the cause of the abnormality when an abnormal signal occurs in at least one of the plurality of measurement signals. The above object is achieved by providing an abnormality detection circuit that detects abnormalities in each measurement signal from a predetermined combination and stores the detected abnormalities.

[Effect]

In the present invention, when an abnormal signal occurs in at least one of the plurality of measurement signals, the abnormality detection circuit detects the plurality of measurement signals when storing the measurement signal and analyzing the cause of the abnormality. Anomalies in each measurement signal are constructed from a predetermined combination of , and stored in memory. Therefore, it is possible to optimally configure an abnormal signal that suits the purpose by combining multiple signals, and the necessary measurement signals can be recorded without omission, making it possible to reliably investigate the cause of the abnormality and save time. Can be shortened. So, for example, high speed? ! Diagnosis and operation monitoring of complex equipment can be performed reliably.

【Example】

Embodiments of the data recording device according to the present invention will be described in detail below. As shown in FIG. 1, this embodiment is a data recording device having an input unit 10.12 similar to the conventional example, a central processing unit 14, an external storage device 16, a recording device 18, and an interrupt unit 20i. , a logic circuit 22 is provided which generates an abnormal signal by calculating analog signals on two pairs, contact signals, and other signals by a combination of logics such as AND and OR. Other points are the same as those of the conventional example, so the same numbers are given and explanations are omitted. The effects of the embodiment will be explained below. First, before using the data recording device, the logic circuit 2
2. Set the combination of abnormal signals according to the purpose. Next, in the data recording apparatus according to this embodiment, as shown in FIG. 1, analog signals and contact signals are inputted to the central processing unit 14 through the respective input units 10 and 12. The input analog signals and contact signals are processed and stored in the external storage device 16 in the same manner as in the conventional example. At that time, the analog signal, contact signal, and other signals are input to the logic circuit 22 to form an abnormality signal for the purpose of analyzing sudden abnormalities. In this way, an abnormal signal that could not be constructed using the prior art can be constructed, for example, as follows. That is, for example, suppose that the operating mode is changed from X to Y while operating while monitoring an analog signal. However, when the operation mode is X, the analog signal A is abnormal at a certain upper limit, but when the operation mode is Y, no matter how high the analog signal @A is, it is not abnormal. In such a case, the conventional data recording device as shown in FIG. can be ANDed by the logic circuit 22 to form an abnormal signal. In addition, for example, in the case where it is considered that an abnormality occurs when both of the two analog signals A and B reach the upper limit, or when either of them reaches the upper limit, similarly, in the conventional example, the abnormal signal could not be configured, but the analog signals A and B
The abnormal signal can be constructed by calculating the AND or OR of the above in the logic circuit 22. Here, the results of actually analyzing failures due to sudden abnormalities in plate thickness control devices for cold rolling steel using data processing devices according to the conventional example and the present embodiment will be described. This was done in order to investigate the cause of the sudden change in the thickness of the rolled material during rolling, which occurs two to three times on -day. At that time, the difference in plate thickness (9) of the rolled material changes as shown in FIG. 2(A). In the figure, in the part of the material to be rolled that was rolled at a low speed (indicated by S in Fig. 2 (A)), even if the thickness variation is large, it cannot be said to be abnormal; part(
In the part other than S in Fig. 2 (A)), the part having the same plate thickness fluctuation range as the part rolled at the low speed (Fig. 2 (A)
Even P) in the middle should be considered abnormal. At this time, the rolling speed of the material to be rolled is varied as shown in FIG. 2(B), and the rolling speed is a constant speed V. The signal that is turned on when the above conditions occur is as shown in FIG. 3(C). Further, assuming that the upper limit value of the plate thickness deviation is H, the signal when the plate thickness deviation exceeds the upper limit value H is as shown in FIG. 2(D). Furthermore, the plate thickness control signal of the cold rolling mill changes as shown in FIG. 2(E). When constructing an abnormal signal using the conventional data recording device as shown in FIG. Second
Any signal among the signals T t , T 2 , and T3 in the portion where the plate thickness (deviation exceeds the upper limit H) shown in Figure (D) is determined to be abnormal. Therefore, this conventional example Once the signal T1 is input to the data recording device and the measurement signal, that is, the data for analyzing the sudden abnormality is stored, the data recording device is turned off after that. It was not possible to store the abnormal state data of the signal T2 (this is the true abnormal state).On the other hand, when the data recording device according to this embodiment was used, the data as shown in FIG. 2(C) The logic circuit 22 calculates the AND of the signal indicating that the rolling speed has exceeded a certain speed and the signals T+, T2, and T3 that exceed the upper limit 11H of plate thickness deviation shown in FIG. 2(D). Since the abnormal signal was formed at the time when @T2 was output, the target abnormal point P
I was able to memorize the data before and after. Therefore, by analyzing the data of various measurement signals stored at that time, it was possible to investigate the cause of the failure due to the sudden abnormality. In this case,
The actual cause of the failure was the X used in the cold rolling mill.
The cause was a contact failure in the tube current control circuit of the wire thickness gauge. The tube current of the xi thickness gauge is shown in Figure 2 (F).
It changes as shown in the figure, and the PA point in the figure is the abnormal location. In addition, in the above embodiment, the abnormal signal is constructed by the logic circuit 22 using two signals, but the number of signals for constructing the abnormal signal is not limited to two, and any number of signals greater than or equal to two may be used. It may be configured by combining. or,
The signals input to the logic circuit 22 may be any combination of analog signals and contact signals. [Effect of the invention 1] As explained above, according to the present invention, it is possible to optimally configure an abnormal signal that suits the purpose, and therefore, necessary measurement signals can be collected without omission, making it possible to investigate the cause of the abnormality. Moreover, the time required for this purpose can be shortened. So, for example, high speed? ! It has the excellent effect of being able to reliably perform equipment diagnosis, operation monitoring, etc.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing the configuration of an embodiment of a data recording device according to the present invention, and FIG. 2 (A), (B), (C), and (D)
(E) and (F) are plate thickness deviation with respect to time for detailed explanation of the present invention, rolling speed, rolling speed - signal above the chamber,
A line diagram showing the relationship between the plate thickness deviation upper limit excess value signal, the plate thickness control signal, and the tube current of the X-ray thickness meter. FIG. 3 is a block diagram showing the configuration of a conventional example of a data recording device. . 10.12...Input crab unit, 14...Central processing unit, 16...External memory Ia device, 20...Interrupt unit, 22...Logic circuit.

Claims (1)

[Scope of Claims] A data recording device for storing the measurement signal and analyzing the cause of the abnormality when an abnormal signal occurs in at least one of the plurality of measurement signals, comprising: A data recording device characterized by comprising an abnormality detection circuit that detects an abnormality in each measurement signal from a predetermined combination of signals and stores the detected abnormality.