JPS6237346B2 - - Google Patents
Info
- Publication number
- JPS6237346B2 JPS6237346B2 JP50119750A JP11975075A JPS6237346B2 JP S6237346 B2 JPS6237346 B2 JP S6237346B2 JP 50119750 A JP50119750 A JP 50119750A JP 11975075 A JP11975075 A JP 11975075A JP S6237346 B2 JPS6237346 B2 JP S6237346B2
- Authority
- JP
- Japan
- Prior art keywords
- value
- characteristic parameter
- parameter
- circuit
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 25
- 230000008859 change Effects 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 claims description 13
- 230000004044 response Effects 0.000 claims description 8
- 230000009471 action Effects 0.000 claims description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 2
- 230000005428 wave function Effects 0.000 description 17
- 230000008878 coupling Effects 0.000 description 10
- 238000010168 coupling process Methods 0.000 description 10
- 238000005859 coupling reaction Methods 0.000 description 10
- 238000012360 testing method Methods 0.000 description 10
- 230000010363 phase shift Effects 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 230000003321 amplification Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50119750A JPS5244179A (en) | 1975-10-06 | 1975-10-06 | Automatic control system for electronic circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50119750A JPS5244179A (en) | 1975-10-06 | 1975-10-06 | Automatic control system for electronic circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5244179A JPS5244179A (en) | 1977-04-06 |
| JPS6237346B2 true JPS6237346B2 (enrdf_load_stackoverflow) | 1987-08-12 |
Family
ID=14769211
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50119750A Granted JPS5244179A (en) | 1975-10-06 | 1975-10-06 | Automatic control system for electronic circuits |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5244179A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62271288A (ja) * | 1986-05-20 | 1987-11-25 | Hitachi Maxell Ltd | メモリカ−トリツジ |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59219790A (ja) * | 1983-05-30 | 1984-12-11 | 日本電気株式会社 | 放電表示板の表示方式 |
| JPH0814605B2 (ja) * | 1984-12-24 | 1996-02-14 | 富士通株式会社 | 被調整ユニットの試験調整システム |
-
1975
- 1975-10-06 JP JP50119750A patent/JPS5244179A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62271288A (ja) * | 1986-05-20 | 1987-11-25 | Hitachi Maxell Ltd | メモリカ−トリツジ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5244179A (en) | 1977-04-06 |
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