JPS6233438A - Semiconductor substrate - Google Patents

Semiconductor substrate

Info

Publication number
JPS6233438A
JPS6233438A JP17647485A JP17647485A JPS6233438A JP S6233438 A JPS6233438 A JP S6233438A JP 17647485 A JP17647485 A JP 17647485A JP 17647485 A JP17647485 A JP 17647485A JP S6233438 A JPS6233438 A JP S6233438A
Authority
JP
Japan
Prior art keywords
substrate
semiconductor substrate
engaging hole
handle
peripheral face
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17647485A
Other languages
Japanese (ja)
Inventor
Sumio Akasaka
赤坂 寿三穂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP17647485A priority Critical patent/JPS6233438A/en
Publication of JPS6233438A publication Critical patent/JPS6233438A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable a substrate to be handled without the plane thereof being contacted so that even a substrate having a larger diameter can be handled easily, by providing an engaging hole in the plane of the substrate so that the substrate can be handled with the peripheral face of the engaging hole and the outer peripheral face of the substrate being grasped. CONSTITUTION:An engaging hole 4a is provided approximately at the center of a semiconductor substrate 4. In order to handle the substrate, the pin 5a of a handling jig 5 is inserted into the engaging hole 4a in the semiconductor substrate and a stopper 5b is applied against the outer periphery of the semiconductor substrate 4. The handling jig 5 has a handle 5c. When this handle 5c is pulled with the stopper 5b pushed in the direction as indicated by the arrow, the pin 5a provided vertically on the upper face of the end portion of an arm 5d is moved to the direction opposite to said direction of the arrow and is applied against the peripheral face of the engaging hole 4a. Namely, the outer periphery of the semiconductor substrate 4 and the peripheral face of the engaging hole 4a are grasped by the 'U' shaped bottom face of the stopper 5b and the outer peripheral face of the pin 5a, respectively. Once they are grasped, they can be fixed in this condition. Thus, the substrate can be handled to the next process by an operator grasping the handle 5c.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体集積回路の基板をなす半導体基板に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor substrate forming a substrate of a semiconductor integrated circuit.

〔従来の技術〕[Conventional technology]

従来よシ、この種の半導体基板においては、その取シ扱
いにビンセットやエアーピンセット等を用いている。
Conventionally, this type of semiconductor substrate is handled using a bottle set, air tweezers, or the like.

第3図はビンセットを用いた例を示し、1は半導体基板
、2はビンセットである。半導体基板1の周縁部をビン
セット2で掴持し、次工程への7・ンドリンクを行なっ
ている。
FIG. 3 shows an example using a bottle set, where 1 is a semiconductor substrate and 2 is a bottle set. The peripheral edge of the semiconductor substrate 1 is gripped and held by a bottle set 2, and a link to the next process is performed.

第4図は、エアービンセットを用いた例を示し、半導体
基板1の裏面にエアーピンセット3の吸着部3&を真空
吸着させて、ハンドリングを行なっている。
FIG. 4 shows an example using an air bin set, in which the suction part 3& of the air tweezers 3 is vacuum-adsorbed on the back surface of the semiconductor substrate 1, and handling is performed.

〔発明が解決しようとする問題点) しかしながら、このようなハンドリング方法によると、
半導体基板1をハンドリングする際、ビンセット2の掴
持部が半導体基板1の周縁部に接触するため、この周縁
部に悪影響を与えてしまうという問題があった。また、
エアービンセット3を用いてハンドリングする場合は、
吸着部31との接触部分が汚染されてしまう等という問
題があった。
[Problems to be solved by the invention] However, according to this handling method,
When handling the semiconductor substrate 1, the gripping portion of the bottle set 2 comes into contact with the peripheral edge of the semiconductor substrate 1, which causes a problem in that the peripheral edge is adversely affected. Also,
When handling using air bottle set 3,
There was a problem that the contact portion with the suction part 31 was contaminated.

また、半導体基板は、今後増々拡大化する傾向にあシ、
拡大化する大口径半導体基板に対して、この様なハンド
リング方法では充分対応することができず、その取シ扱
いが困難となることが予想されるものであった。
In addition, the demand for semiconductor substrates is expected to increase further in the future.
Such a handling method cannot adequately cope with the increasing size of large-diameter semiconductor substrates, and it was expected that the handling would become difficult.

本発明は、このような点に鑑みてなされたもので、その
目的とするところは、基板に悪影響を及ぼさず、しかも
大口径基板に移行しても容易にハンドリングを行なうこ
とのできる半導体基板を提供することにある。
The present invention has been made in view of these points, and its purpose is to provide a semiconductor substrate that does not have a negative effect on the substrate and can be easily handled even when transitioning to a large-diameter substrate. It is about providing.

〔問題点を解決するための手段〕[Means for solving problems]

このような目的を達成するために、本発明は半導体基板
の基板平面部に係合孔を開設したものである。
In order to achieve this object, the present invention provides an engagement hole in a flat surface of a semiconductor substrate.

〔作用〕[Effect]

したがって、この発明の半導体基板によると、基板平面
部に開設された係合孔周端面と基板外周端面とを掴持し
つつ、基板平面部に非接触でハンドリングを行なうこと
が可能となる。
Therefore, according to the semiconductor substrate of the present invention, it is possible to handle the substrate without contacting the flat surface of the substrate while grasping the peripheral end surface of the engagement hole formed in the flat surface of the substrate and the outer peripheral end surface of the substrate.

〔実施例〕〔Example〕

以下、本発明に係る半導体基板を図面を用いて説明する
。第1図は、この半導体基板の一実施例を示す外観斜視
図である。この半導体基板40基板千面略中夫には係合
孔4aが開設されている。
Hereinafter, a semiconductor substrate according to the present invention will be explained using the drawings. FIG. 1 is an external perspective view showing one embodiment of this semiconductor substrate. An engagement hole 4a is formed approximately in the center of the semiconductor substrate 40 on one side.

尚、4bは半導体基板4の結晶と直角な位置に形成され
たオリフラである。
Note that 4b is an orientation flat formed at a position perpendicular to the crystal of the semiconductor substrate 4.

次に、このように形成された半導体基板4のハンドリン
グ方法について説明する。すなわち、半導体基板4の係
合孔4mに、第2図に示す如く、ハンドリング治具5の
ピン5aを挿入配置し、ストッパ5bを半導体基板4の
外周端面に当接させる。ストッパ5bは断回路「U」字
状に形成されており、rUJ字状の底面が半導体基板4
の外周端面に当接するのみで、その上面および下面は半
導体基板4の表〆および裏の基板面には接触しない構成
となっている。ハンドリング治具5Fi取手5cを有し
、ストッパ5bを図示矢印方向に押圧しつつ取手5cを
引っばることによシ、アーム5dの先端部上面に植設さ
些たピン5aが該アーム5dと共に矢印方向とは反対に
移動し、係合孔4鳳の周端面に当接するようになってい
る。つまシ、半導体基板4の外周端面と係合孔4aの周
端面とがストッパ5bの「U」字状の底面とピン5&の
外周壁面とで掴持される。掴持した後は、この状態を固
定することができる様になっておシ、したがって、取手
5cをつかみっつ次工程へハンドリングを行なうことが
できる。
Next, a method of handling the semiconductor substrate 4 formed in this manner will be described. That is, the pin 5a of the handling jig 5 is inserted into the engagement hole 4m of the semiconductor substrate 4, as shown in FIG. 2, and the stopper 5b is brought into contact with the outer peripheral end surface of the semiconductor substrate 4. The stopper 5b is formed in the shape of a disconnection "U", and the bottom surface of the rUJ shape is connected to the semiconductor substrate 4.
The structure is such that the upper and lower surfaces of the semiconductor substrate 4 do not contact the front and back surfaces of the semiconductor substrate 4 . The handling jig 5Fi has a handle 5c, and by pulling the handle 5c while pressing the stopper 5b in the direction of the arrow shown in the figure, a small pin 5a implanted on the upper surface of the tip of the arm 5d moves in the direction of the arrow along with the arm 5d. It moves in the opposite direction and comes into contact with the peripheral end surface of the engagement hole 4. The outer peripheral end surface of the pick, the semiconductor substrate 4, and the peripheral end surface of the engagement hole 4a are gripped by the "U"-shaped bottom surface of the stopper 5b and the outer peripheral wall surface of the pin 5&. After gripping and holding, this state can be fixed, so that the handle 5c can be gripped and handled to the next step.

この様に、係合孔4aを利用すれば、基板面に非接触で
半導体基板4のハンドリングを行なうことができ、基板
面に接触して生ずる従来のような問題が解消される。ま
た、このようなハンドリング治具5を用いることにょシ
、半導体基板の大口径化にも充分対応することができ、
容易にハンドリングを行なうことができる。
In this manner, by using the engagement hole 4a, it is possible to handle the semiconductor substrate 4 without contacting the substrate surface, and the conventional problems caused by contacting the substrate surface are solved. In addition, by using such a handling jig 5, it is possible to sufficiently cope with larger diameter semiconductor substrates.
Easy handling.

尚、本実施例において用いたハンドリング治具5は、必
ずしもむのような構成とせずともよく、要は半導体基板
4の外周端面と係合孔4aの周端面とを掴持し、ハンド
リングを行なうことができれば、他の構成のハンドリン
グ治具であってもよい。また、係合孔4aは複数個開設
してもよく、必ずしも基板千面略中央に開設しなくとも
よい。
Note that the handling jig 5 used in this embodiment does not necessarily have to have such a configuration; in short, it grips and holds the outer peripheral end surface of the semiconductor substrate 4 and the peripheral end surface of the engagement hole 4a, and handles it. If possible, a handling jig with another configuration may be used. Further, a plurality of engagement holes 4a may be provided, and do not necessarily have to be provided approximately at the center of the 1000th surface of the substrate.

さらに、本実施例においては、ハンドリングについての
み説明したが、半導体基板に開設し丸裸合孔を用いるこ
とによシ、自動機における位置決めや、処理工程での基
板内の加工を均一にする等の効果が期待できる。すなわ
ち、処理工程においては、パターンの保護膜等を形成す
るために真空中で基板を回転させるような加工が行なわ
れることがら夛、係合孔を用いて基板を位置決め固定す
ることKよシ、基板自体がずれたシすることがなく、加
工の均一性を向上させることができる。
Furthermore, in this example, only the handling was explained, but by using a round hole formed in the semiconductor substrate, it is possible to improve the positioning in an automatic machine and to make the inside of the substrate uniform in the processing process. You can expect good results. That is, in the processing process, processing such as rotating the substrate in a vacuum is performed in order to form a patterned protective film, etc., so it is necessary to position and fix the substrate using the engagement hole. The substrate itself does not shift and the uniformity of processing can be improved.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に本発明による半導体基板によると、基
板平面部に係合孔を開設したので、係合孔周端面と基板
外周端面とを掴持しつつ基板平面部に非接触でハンドリ
ングを行なうことができ、接触に伴う悪影響が基板に生
ずることがなく、シかも大口径基板に移行しても容易に
ハンドリングを行なうことが可能となる。
As explained above, according to the semiconductor substrate according to the present invention, since the engagement hole is formed in the flat surface of the substrate, handling can be performed without contacting the flat surface of the substrate while grasping the peripheral end surface of the engagement hole and the outer peripheral end surface of the substrate. Therefore, there is no adverse effect on the substrate due to contact, and it is possible to easily handle the substrate even if the substrate has a large diameter.

また、自動機における位置決めやプロセスでの基板内の
加工の均一性の向上が出来る等の効果も期待できる。
Further, effects such as improved positioning in automatic machines and uniformity of processing within the substrate during processes can be expected.

【図面の簡単な説明】 第1図は本発明に係る半導体基板の一実施例を示す外観
斜視図、第2図はこの半導体基板のハンドリング方法を
説明する外観斜視図、第3図はピンセットを用いた半導
体基板のハンドリング方法を説明する外観斜視図、第4
図はエアーピンセットを用いた半導体基板のハンドリン
グ方法を説明する外観斜視図である。 4・・・・半導体基板、4a・・・・係合孔、5・・・
・ハンドリンク治J14.5a拳・−・ビン、5b・・
・拳ストッパ、5cφ・・−取手。
[Brief Description of the Drawings] Fig. 1 is an external perspective view showing an embodiment of a semiconductor substrate according to the present invention, Fig. 2 is an external perspective view illustrating a method of handling this semiconductor substrate, and Fig. 3 is an external perspective view showing an example of a semiconductor substrate according to the present invention. External perspective view illustrating the handling method of the semiconductor substrate used, Part 4
The figure is an external perspective view illustrating a method of handling a semiconductor substrate using air tweezers. 4... Semiconductor substrate, 4a... Engaging hole, 5...
・Hand link Jiji J14.5a fist --- bottle, 5b...
・Fist stopper, 5cφ...-handle.

Claims (1)

【特許請求の範囲】[Claims] 半導体集積回路の基板をなす半導体基板において、基板
平面部に係合孔を開設したことを特徴とする半導体基板
A semiconductor substrate forming a substrate of a semiconductor integrated circuit, characterized in that an engagement hole is formed in a flat surface of the substrate.
JP17647485A 1985-08-07 1985-08-07 Semiconductor substrate Pending JPS6233438A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17647485A JPS6233438A (en) 1985-08-07 1985-08-07 Semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17647485A JPS6233438A (en) 1985-08-07 1985-08-07 Semiconductor substrate

Publications (1)

Publication Number Publication Date
JPS6233438A true JPS6233438A (en) 1987-02-13

Family

ID=16014302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17647485A Pending JPS6233438A (en) 1985-08-07 1985-08-07 Semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS6233438A (en)

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