JPS6230566B2 - - Google Patents
Info
- Publication number
- JPS6230566B2 JPS6230566B2 JP16817281A JP16817281A JPS6230566B2 JP S6230566 B2 JPS6230566 B2 JP S6230566B2 JP 16817281 A JP16817281 A JP 16817281A JP 16817281 A JP16817281 A JP 16817281A JP S6230566 B2 JPS6230566 B2 JP S6230566B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- detection system
- scattered
- optical path
- disk
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 22
- 230000003287 optical effect Effects 0.000 claims description 10
- 230000010287 polarization Effects 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 8
- 230000001678 irradiating effect Effects 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16817281A JPS5870109A (ja) | 1981-10-21 | 1981-10-21 | 組立精度測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16817281A JPS5870109A (ja) | 1981-10-21 | 1981-10-21 | 組立精度測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5870109A JPS5870109A (ja) | 1983-04-26 |
JPS6230566B2 true JPS6230566B2 (enrdf_load_html_response) | 1987-07-03 |
Family
ID=15863130
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16817281A Granted JPS5870109A (ja) | 1981-10-21 | 1981-10-21 | 組立精度測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5870109A (enrdf_load_html_response) |
-
1981
- 1981-10-21 JP JP16817281A patent/JPS5870109A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5870109A (ja) | 1983-04-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3989385A (en) | Part locating, mask alignment and mask alignment verification system | |
US4874246A (en) | Arrangement for optically measuring a distance between a surface and a reference plane | |
JPH036460B2 (enrdf_load_html_response) | ||
US4886362A (en) | Appratus for measuring the profile of an aspherical surface | |
EP1336095B1 (en) | Measurement of surface defects | |
JPH05232035A (ja) | 空間フィルタと面構造をモニタするシステム | |
JPH0256604B2 (enrdf_load_html_response) | ||
JPS6230566B2 (enrdf_load_html_response) | ||
US5932887A (en) | Apparatus for measuring the flying height and orientation of a magnetic head relative to a transparent medium based on frustrated total internal reflection | |
US4597668A (en) | Device for checking positional accuracy | |
JPS5833104A (ja) | 組立精度測定方法 | |
JP3326645B2 (ja) | 検出ヘッド浮上量測定装置および測定方法 | |
JPS6071903A (ja) | 光ディスク検査装置 | |
JPH1083580A (ja) | 光ディスク測定装置 | |
JPS6360324B2 (enrdf_load_html_response) | ||
JPH0128403Y2 (enrdf_load_html_response) | ||
JP3365881B2 (ja) | レンズの屈折率検査装置 | |
JP2591143B2 (ja) | 三次元形状測定装置 | |
JPH0331367B2 (enrdf_load_html_response) | ||
JPH04307358A (ja) | 表面検査装置 | |
JPS6217607A (ja) | 光学式傾き検出装置 | |
JPS63289429A (ja) | 複屈折測定器 | |
JPH03251708A (ja) | パラボラアンテナ面形状測定装置 | |
JPH0829664A (ja) | 測定対象の位置検出方法 | |
JPH01206208A (ja) | 光学的情報記憶媒体検査装置 |