JPS6228758Y2 - - Google Patents

Info

Publication number
JPS6228758Y2
JPS6228758Y2 JP9752382U JP9752382U JPS6228758Y2 JP S6228758 Y2 JPS6228758 Y2 JP S6228758Y2 JP 9752382 U JP9752382 U JP 9752382U JP 9752382 U JP9752382 U JP 9752382U JP S6228758 Y2 JPS6228758 Y2 JP S6228758Y2
Authority
JP
Japan
Prior art keywords
sample
measurement
window
measurement container
bottom plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9752382U
Other languages
English (en)
Japanese (ja)
Other versions
JPS593535U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9752382U priority Critical patent/JPS593535U/ja
Publication of JPS593535U publication Critical patent/JPS593535U/ja
Application granted granted Critical
Publication of JPS6228758Y2 publication Critical patent/JPS6228758Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9752382U 1982-06-30 1982-06-30 クライオスタツト Granted JPS593535U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9752382U JPS593535U (ja) 1982-06-30 1982-06-30 クライオスタツト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9752382U JPS593535U (ja) 1982-06-30 1982-06-30 クライオスタツト

Publications (2)

Publication Number Publication Date
JPS593535U JPS593535U (ja) 1984-01-11
JPS6228758Y2 true JPS6228758Y2 (enrdf_load_stackoverflow) 1987-07-23

Family

ID=30231941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9752382U Granted JPS593535U (ja) 1982-06-30 1982-06-30 クライオスタツト

Country Status (1)

Country Link
JP (1) JPS593535U (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS593535U (ja) 1984-01-11

Similar Documents

Publication Publication Date Title
US5835997A (en) Wafer shielding chamber for probe station
JPH0251243A (ja) 集積回路の自動制御システム
US5459408A (en) Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe to form a MIS device
US20140157817A1 (en) Method and apparatus for rapidly cooling a gem, including two stage cooling
JPS6228758Y2 (enrdf_load_stackoverflow)
JPH0545990Y2 (enrdf_load_stackoverflow)
JPH10288646A (ja) 回路板支持具及び回路板検査方法並びに回路板検査装置
US4408478A (en) Heatable cell for photoacoustic tests
CN108680458B (zh) 微波热重分析装置
CN215493961U (zh) 一种液氮环境载物装置及应用于晶圆测试的液氮手动探针台
US10775313B2 (en) Method and apparatus for rapidly cooling a gem
CN209640268U (zh) 非稳态超高温隔热性能试验装置
CN221528492U (zh) 基于物联网的导热系数测定仪
JPH0581175B2 (enrdf_load_stackoverflow)
CN216735389U (zh) 一种医疗检验用检验样本存储箱
CN2405313Y (zh) 一种带加热退火的杜瓦瓶装置
CN214567017U (zh) 一种保温效果更好的血液样品运输箱
CN213229565U (zh) 一种多功能食品检验存储装置
JPH04145638A (ja) 半導体ウエハ検査装置
KR20030075746A (ko) 탐침형 깊은 준위 과도 전기 용량 분광기
JPH0618288Y2 (ja) 示差熱分析装置の試料自動交換装置
JPH04145636A (ja) 半導体ウエハ検査装置
JPS6221956Y2 (enrdf_load_stackoverflow)
JPH0714872Y2 (ja) 低温粉末ｘ線回折装置
CN115001396A (zh) 光伏组件小样的热斑测试方法