JPS62269241A - Fault diagnosing device - Google Patents

Abstract

PURPOSE:To diagnose even a circuit board whose operation changes whenever a measurement is executed, by providing a diagnosing part for comparing and diagnosing a measurement data of a reference side electronic equipment, which is stored in a storage part, and a measurement data of a diagnosing object side electronic equipment. CONSTITUTION:Each signal S1-S4 of each circuit board 11a, 11b obtained by each probe 13a-13d is supplied to a processing part 14. When a data input condition which is inputted from a keyboard 12 has coincided with an operation data of each circuit board 11a, 11b obtained by each probe 13a-13d, the processing part 14 inputs each signal S1-S4 and stores it as a measured data. In such a stage, at the time of a diagnosis, a measured data of said reference circuit board 11a, and a measured data of the circuit board to be diagnosed 11b are compared and decided, and whether the circuit board to be diagnosed 11b operates correctly or not is diagnosed.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a failure diagnosis device for diagnosing whether electronic equipment such as a digital circuit board is operating correctly.

(Prior Art) Conventionally, as a failure diagnosis device for diagnosing whether a digital device or the like is operating properly, one that performs diagnosis by a comparison method is known.

As shown in FIG. 4, this type of device includes a plurality of probes 18 to 1d, and each of these probes 1a to 1d is connected to a properly operating digital circuit board (reference circuit board>28), and this reference circuit board 2a A reference data storage unit 3 that stores operational data (reference data) obtained when operating the , and each of the probes 18 to 1d are connected to a digital circuit board to be diagnosed (circuit board to be diagnosed) 2b, Diagnosed data storage section 4 that stores operation data (diagnosed data) that is read when the circuit board to be diagnosed 2b is operated.
and a comparison unit 5 that compares the reference data and the diagnosed data stored in each of these data storage units 3 and 4,
It is equipped with a display section 6 for displaying the comparison results of the comparison section 5, and if the reference data and the data to be diagnosed match, it is determined that the circuit board to be diagnosed 2b is normal, and these If each data does not match, the circuit board to be diagnosed 2
b is determined to be a failure.

(Problems to be Solved by the Invention) Conventionally, in this type of failure diagnosis device, the operating state of the reference circuit board 2a and the operating state of the circuit board to be diagnosed 2b are all taken in, and these operating states are determined. Since the circuit board to be diagnosed 2b was diagnosed to be normal or not based on whether or not they all matched, there was a problem in that it was not possible to diagnose the failure of a circuit board whose operation changed every time a measurement was performed. Ta.

In view of the above circumstances, it is an object of the present invention to provide a failure diagnosis device U capable of diagnosing not only ordinary circuit boards but also circuit boards whose operation changes each time a measurement is performed.

(Means for Solving the Problems) In order to solve the above problems, the failure diagnosis device according to the present invention uses reference data obtained by operating a reference electronic device and operating an electronic device to be diagnosed. In a fault diagnosis device that diagnoses whether or not the electronic device to be diagnosed is operating correctly by comparing the obtained data to be diagnosed, each front electronic dawn device operates to satisfy predetermined data acquisition conditions. a comparison unit that generates a data acquisition signal when the data acquisition signal is generated; a storage unit that acquires and stores operational data of the electronic device when the comparison unit generates the data acquisition signal; and a reference stored in the storage unit. The present invention is characterized by comprising a diagnosis section that compares measurement data of the side electronic device and measurement data of the diagnostic target side electronic device to diagnose whether or not the electronic device to be diagnosed is operating correctly.

(Embodiment) FIG. 1 is a circuit block diagram showing an embodiment of a failure diagnosis device according to the present invention.

The failure diagnosis 5A shown in this figure includes a keyboard 12, probes 13a to 13d, a processing section 14, and a display! '1
15, and selectively takes in the operation data 19 generated when the reference circuit board 11a and the circuit board to be diagnosed 11b are operated, and compares the data that satisfies the conditions input in advance. This diagnoses whether the circuit board 11b to be diagnosed is operating correctly.

The keyboard 12 has X scale keys necessary to operate this failure diagnosis device, and generates a signal (key manual signal) according to the operated key, and supplies this to the processing section 14. .

Further, the probes 138 to 13d are connected to the reference circuit board 11a (
Alternatively, a desired location (for example,
test point, etc.), and is configured so that each time ``!f!1ul/211a'' obtained by each of these probes 13a to 13d.

Each signal 81 to S4 of 11b is supplied to processing section 1/I.

The display device 15 is equipped with a CRT (cathode ray tube) display, an LCD (liquid crystal) display, etc., and displays the display data on the screen when it is supplied with display data from the processing section 14.

The processing unit 14 includes an input circuit 16, a comparison circuit 17, an interrupt control circuit 18, an address counter 19, a data memory 20, and a RAM (random access memory).
21, a display 't822, and a CPU 23, and the data acquisition conditions entered from the keyboard 12 and the operation data of each circuit board 118°11b obtained by each of the library probes 38 to 3d are When it matches,
Each signal S1 to S4 is taken in/v and stored as measurement data, and at the time of diagnosis, the measurement data of the reference circuit board 11a and the measurement data of the circuit board to be diagnosed 11b are compared and judged, and the 'Pli diagnostic circuit Diagnose whether the base 11b operates correctly.

The input circuit 16 is equipped with a bluff memory that stores key manual signals supplied from the keyboard 12 in a conventional manner, and when supplied with a read signal from the CPtJ 23,
The key manual signals stored in this bluff memory are sequentially read out and supplied to the CPU 23.

The comparator circuit 17 is equipped with a 1-bit semi-integrated RAM, etc., and when it is supplied with address data and write-in data (1-bit data) from the CPU 23 at the time of writing, this address data The input data is stored in the address specified by the signal 81 to S4 of each of the probes 138 to 13d. 1'' data, it is supplied to the input/output flil+ control circuit 18 as the data acquisition signal S5.

The store control circuit 18, as shown in FIG.
When the activation signal S6 is supplied from the LJ 23, a latch circuit 24 latches it, and a timing generation circuit 2 oscillates at a predetermined frequency +91 and outputs a clock signal $7.
5 and two AND gates 26°27.
When the activation signal S6 is supplied from the CPU 23, it is latched, and after that, when the data acquisition signal S5 is supplied from the comparison port 't817, each AND gate 26.2
7 is turned on, and the clock signal S7 output by the timing generation circuit 25 is output from each output terminal 18a, 18b.

In this case, the clock signal M output from the output terminal 18a
S7 is supplied to the data memory 20 as a write signal S8, and is also a clock signal S output from the output terminal 18b.
7 is supplied to one address counter as a count signal S.

The address counter 19 is configured to increment its t1 value every time the count signal S9 is supplied, and the count value obtained here is supplied to the data memory 20 as an n-bit address signal AD. .

Further, the data memory 20 is equipped with a 4-bit semiconductor RAM, etc., and when the write signal @S8 is supplied, it takes in each of the signals S1 to S4, and uses this as measurement data to be used as the data specified by the address signal AD. Enter the address. Then, when supplied with a read signal and a read address signal from the CPU 23, the data memory 20 reads out the measurement data stored at the address specified by the address signal and supplies it to the CPU 23.

Further, the RAM 21 is a memory used as a work area for the CPU 23, and when the 03 measurement of the reference circuit board 11a is completed, the measurement data etc. stored in the data memory 20 are transferred to this RAM 21 and stored. be done.

Further, the display circuit 22 is configured to convert data sent from the CPU 23 into display data,
Here, the given display data is supplied to the display device 15 and displayed.

Further, the CPU 23 is constituted by, for example, a microprocessor, and controls various parts of the circuit and processes data.

Next, the operation of this embodiment will be explained with reference to the flowchart shown in FIG.

First, when diagnosing a new circuit board 11b to be diagnosed, prior to this diagnosis, data relating to data acquisition conditions is input from the keyboard 12 by the operator in step STI.

In this case, each probe 138-13d is represented by a symbol P1-P4, and each of these symbols P1-13d is represented by a symbol P1-P4.
P4 and the symbols "A N D", "'OR", and "NOT" representing logical sum, logical product, and logical negation, respectively.
and a symbol indicating that you are entering data import conditions.”
Data acquisition conditions are input in combination with 'S ET'.

For example, when the "1" signal is detected by the probes 13a, 13t), if you want to import the signals 81 to S4 obtained by the probes 13a to 13d and use them as measurement data, from the keyboard 12, SET Pi AND P2 is input.In this case, this data import condition includes:
Since symbols P3 and Pi are not described, signal S1
, S2 is °'1pa, the remaining signals S3 and S4 are 1'
Even if it is 0'' or 0'', the signals S1 to S4 generated by each probe 138 to 13d at this time are taken in as measurement data.

When data regarding such data acquisition conditions is input from the keyboard 12, the CPU 23 inputs the data via the input circuit 16 and creates setting data.

In this case, if the data import condition input from the keyboard 12 is "'SET Pi AND P2", the CPU 23 reads the address data ladder "'SET Pi AND P2" as the setting data.
x x 11'' and data "1" are created. In this case, x'° is an undefined bit.

Next, the CPU 23 reads this address data ゛xx 11
” and data “1” are supplied to the comparison circuit 17, and the data “1” is written to the address indicated by the address data “×x 11 ” of the comparison circuit 17.

Once you have finished setting these data import conditions,
In step ST2, each of the probes 138 to 13d is connected to the normally operating reference circuit board 11a.

After this, in step ST3, the operator uses the keyboard 12
When the recording command "RE C" is input from the input circuit 16, the CPtJ23 detects this and supplies the starting signal S6 to the processing control circuit 18 and the readout signal to the comparator circuit 1a. .

As a result, the write 1llll'a11 circuit 18 is activated and enters the input waiting state, and the comparison circuit 17hζ
Enters read mode.

After that, when the reference circuit board 11a is activated, the comparator circuit 17 extracts the signals 81 to S4 from each part of the reference circuit board 11a via the probes 138 to 13d, and the signals 81 to S4 are cloisonnized with each of these signals 81 to S4. Read address data. If this is "1", the comparator circuit 17 supplies this to the write control '6+1 circuit 18 as the data acquisition signal S5.

In this case, the comparison circuit 17 stores an address set by the data acquisition condition, for example, if the data acquisition condition is 'SE
If it is “T Pi AND P2” then the address “xxl”
Since data “1” is written in “l”, the signals S1 and S
When 2 is "1", the comparison circuit 17 outputs a data acquisition signal S5, which is supplied to the processing control circuit 1.

At this moment, the write control circuit 18 is in an input state, so if the data acquisition signal S5 is supplied, an internal timing is generated @path 25
When the rack number S7 is generated, the interrupt signal $8 is supplied to the data memory 20, and the address signal A from one address counter of each address in the data memory 20 is
Each signal S1 to S is placed at the address specified by D.
4 is stored as measurement data, and at the same time, a count signal S9 is supplied to one address counter 19 to increment the value of the address signal ΔD output by this address counter 19 by 1-.

Hereinafter, each time the signals S1 and S2 become 1'', the operation described in (a) above is repeated, and the measured data is loaded into the data memory 20, and when the data memory 20 becomes full. , the store loading control circuit 18 stops outputting the 1 loading signal S8 and the count signal S9, and the measurement data collection operation ends.

When the collection of measurement data is about to be completed, CPtJ
23 transfers all measurement data stored in the data memory 20 to the RAM 21 and stores it therein.

Thereafter, in step ST4, the probes 13a to 13d are removed from the reference circuit board 11a by the operator.
In step ST5, these probes 138 to 13d are mounted on the circuit board to be diagnosed 11b.

After this, in step ST6, the operator uses the keyboard 12
If you input the snoop command 'DIA' from the input circuit 1
6, the CPU 23 detects this and supplies the starting signal S6 to the preemption control circuit 18, and also outputs the start signal S6 to the comparator circuit 1.
A read signal is supplied to 7.

After this, when the circuit to be diagnosed 11b is activated, the '# 1 Signal 81 obtained from the diagnostic circuit board 11b
~S4 are sequentially stored in the data memory 20 as measurement data.

When the data memory 20 becomes full, the write control 01+ circuit 18 stops operating and ends the measurement data collection operation. After this, the CPU 23 determines whether the data is stored in the data memory 20 in step ST7. ! 1! ! Each measurement data of the diagnostic circuit board 11b and the RA
The measurement data of the reference circuit 111a stored in M21 are compared, and if they match, the circuit board to be diagnosed 11a is determined to be normal. If these measurement data do not match, the CPU 23 determines that the circuit board 11b to be diagnosed is abnormal.

In step ST8, the CPU 23 supplies this determination result to the display circuit 22 and displays it on the display device'? Display it on T15.

As described above, in this embodiment, the reference circuit board 11a
and the circuit board to be diagnosed 11b are moved, selectively capturing data that satisfies pre-input data capture conditions and comparing them;
Based on this comparison result, it is determined whether the circuit board 11b to be diagnosed is normal or not, so that tJI
Even circuit boards whose operation changes each time can be diagnosed by simply setting the data acquisition conditions to avoid the parts that change.

Further, in the above-described embodiment, the timing generation circuit 25 is provided in the circular control circuit 18 to generate the write synchronization signal (write signal 88) of the data memory 20, but each time 't8Jl (f211a, f211a, 11b) The preemptive synchronization signal for the data memory 20 may be generated from the signal output from the machine number or the signal output from another machine number.

In addition, in the above embodiment, only one data acquisition condition is used to simplify the explanation, but what is this data acquisition condition? ! You can do it because of I. We also increased the number of probes to 5.
It can be more than just a book.

(Effects of the Invention) As described above, according to the present invention, it is possible to diagnose not only a normal circuit board but also a circuit board whose operation changes every time a measurement is performed.

[Brief explanation of drawings]

Fig. 1 is a circuit block diagram showing an embodiment of the fault diagnosis device according to the present invention, Fig. 2 is a detailed circuit diagram of the access control circuit shown in Fig. 1, and Fig. 3 is the operation of the same embodiment. FIG. 4 is a flowchart illustrating an example of a conventional failure diagnosis device, but is a circuit block diagram. 11a... Reference circuit board, 11b... Circuit board to be diagnosed, 138-13b... Probe, 14... Processing section, 17... Comparison section (comparison circuit), 20... Storage section (
data memory), 21... storage section (RAM), 23.
...Diagnosis unit (CPU). Patent applicant Agent: Tateishi Electric Co., Ltd.
Patent attorney Tetsuji Yoshigo (and 1 other person) Haku 3

Claims (1)

[Claims] Comparing reference data obtained by operating a reference electronic device with diagnostic data obtained by operating an electronic device to be diagnosed, to determine whether the electronic device to be diagnosed is operating correctly. A fault diagnosis device for diagnosing includes a comparison unit that generates a data acquisition signal when each of the electronic devices performs an operation that satisfies predetermined data acquisition conditions, and a comparison unit that generates a data acquisition signal when the comparison unit generates the data acquisition signal. A storage unit that captures and stores operating data of the electronic device, and an electronic device to be diagnosed by comparing the measurement data of the reference electronic device stored in this storage unit with the measurement data of the diagnostic target electronic device. A failure diagnosis device comprising: a diagnosis section for diagnosing whether or not the device is operating correctly.