JPS62263635A - Developing device for resist - Google Patents

Developing device for resist

Info

Publication number
JPS62263635A
JPS62263635A JP10787586A JP10787586A JPS62263635A JP S62263635 A JPS62263635 A JP S62263635A JP 10787586 A JP10787586 A JP 10787586A JP 10787586 A JP10787586 A JP 10787586A JP S62263635 A JPS62263635 A JP S62263635A
Authority
JP
Japan
Prior art keywords
temperature
control means
heat medium
constant temperature
developer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10787586A
Other languages
Japanese (ja)
Other versions
JPH061763B2 (en
Inventor
Tsuneo Fujii
藤井 恒男
Toshitaka Takei
武居 俊孝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daikin Industries Ltd
Original Assignee
Daikin Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daikin Industries Ltd filed Critical Daikin Industries Ltd
Priority to JP10787586A priority Critical patent/JPH061763B2/en
Publication of JPS62263635A publication Critical patent/JPS62263635A/en
Publication of JPH061763B2 publication Critical patent/JPH061763B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Abstract

PURPOSE:To hold the temperature of chemicals at an arbitrarily set temperature with high precision by circulating a heating medium for a constant temperature into a heat medium chamber and bringing the heating medium for the constant temperature into contact with a control means. CONSTITUTION:A control means A is housed in a heat-medium chamber 30, which is connected to a generator 7 for a heating medium for a constant temperature and in which the heating medium for the constant temperature is circulated, thus bringing the heating medium for the constant temperature into contact with the control means A. The heating medium for the constant temperature is brought into contact with the control means A, thus eliminating the effect of the outside air on the control means A. Accordingly, the temperature of chemicals fed to a body to be developed W from the control means A can be controlled at a set value with high accuracy.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はレジスト現像装置、詳しくは、半導体ウェハ、
半導体マスク、光ディスク等の被現像体に装若されたレ
ジスト厄の現像を行なうレジスト現像装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Field of Application) The present invention relates to a resist developing apparatus, specifically a semiconductor wafer,
The present invention relates to a resist developing device that develops a resist mounted on an object to be developed such as a semiconductor mask or an optical disk.

(従来の技術) 従来、この種のレジスト現像装置としては、例えば特開
昭57−186032号公報に記載され、また第3図に
示すように、現像MI(1)内に収容した半導体ウェハ
(W )にノズル等の放出手段(2)から現像処理に供
される薬液を放出することにより、前記ウェハ(W)に
おけるレジスト層の現像を行なうようにしている。
(Prior Art) Conventionally, this type of resist developing apparatus is described in, for example, Japanese Patent Laid-Open No. 186032/1983, and as shown in FIG. The resist layer on the wafer (W) is developed by discharging a chemical solution for development from a discharging means (2) such as a nozzle onto the wafer (W).

尚、一般に前記薬液は、レジスト層を溶解する所謂現像
液の他に、該現像液の放出に先立ち前記ウェハ(W)の
経時変化によるレジスト感度のバラツキを除去するため
の前処理液、及び前記現像液の放出後に前記ウェハ(W
)を洗浄する後処理液等から成るものである。
In general, the chemical solution includes, in addition to a so-called developer for dissolving the resist layer, a pretreatment solution for removing variations in resist sensitivity due to changes in the wafer (W) over time prior to release of the developer, and the above-mentioned. After releasing the developer, the wafer (W
) consists of post-treatment liquid etc.

また、最近のレジストパターンの高密度化に伴なってそ
の現像条件、特に前記薬液の温度に対する要求が重要な
ものとなっていることから、前記薬液のひとつである現
像液の容器(3)とその放出手段(2)との間に、温調
器(5)を設けると共に、該温調器(5)から前記放出
手段(2)に至る送液管(6)に電気ヒータ(H)を巻
き付けることにより、前記温調器(5)にて温度調整さ
れる現像液が、前記送液管(6)部分で放熱により温度
低下してしまうのを抑制して、前記放出手段(2)から
放出され前記ウエノ1(W)に作用する現像液の温度を
設定値に限定できるようにしている。
In addition, with the recent increase in the density of resist patterns, the development conditions, especially the temperature of the chemical solution, have become important. A temperature regulator (5) is provided between the discharge means (2) and an electric heater (H) is connected to the liquid sending pipe (6) from the temperature regulator (5) to the discharge means (2). By wrapping the developing solution, the temperature of the developing solution whose temperature is adjusted by the temperature regulator (5) is suppressed from decreasing due to heat radiation in the liquid sending pipe (6), and the developing solution is released from the discharging means (2). The temperature of the developer that is released and acts on the Ueno 1 (W) can be limited to a set value.

ところが、前記電気ヒータ(H)による場合には、前記
送液管(6)を通る現像液の外気への放熱による温度低
下は抑制できても、外気からの吸熱による温度上昇は抑
制できず、従って、例えば外気温度が現像液の温度より
も高い場合には現像液の温度を設定値に制御できないと
いう致命的な聞届があった。
However, in the case of using the electric heater (H), although it is possible to suppress the temperature drop due to heat radiation of the developer through the liquid sending pipe (6) to the outside air, it is not possible to suppress the temperature rise due to heat absorption from the outside air. Therefore, for example, when the outside air temperature is higher than the temperature of the developer, it has been fatally reported that the temperature of the developer cannot be controlled to the set value.

一方、この問題を解決するために、第4図に示すように
、送液管(8)に二重管(40)を用いて、該二重管(
40)の内管(41)に温調器(5)からの薬液のひと
つである現像液を、また、外管(42)に温度調整され
た恒温水をそれぞれ通すことにより、現像液の温度が外
気に対し詩い場合でも低い場合でも常に任意の設定温度
に制御することが考えられる。
On the other hand, in order to solve this problem, as shown in FIG.
By passing a developer, which is one of the chemicals from the temperature controller (5), through the inner tube (41) of 40) and constant temperature water whose temperature has been adjusted through the outer tube (42), the temperature of the developer can be adjusted. It is conceivable to always control the temperature to an arbitrary setting even when the temperature is higher or lower than the outside air.

尚、送液管(6)の前記二重管(40)の出口からノズ
ル等の放出手段(2)に接続される部分、すなわち放出
手段(2)の近くには、現像液をろ過するためのストレ
ーナ(62)と現像液の出停を制御するための制御弁(
61)とを介装している。
In addition, in the part of the liquid sending pipe (6) connected from the outlet of the double pipe (40) to the discharge means (2) such as a nozzle, that is, near the discharge means (2), there is a part for filtering the developer. strainer (62) and a control valve (
61) is interposed.

(発明が解決しようとする問題点) 第4図の例によると、前記二重管(40)の部・′今で
は外気の影響を排して現像処理に供される薬液のひとつ
である現像液の温度を任意の設定値に保持できるけれど
も、前記二重管(40)の出口と前記現像槽(1)とを
接続する、ストレーナ(E32)、制御弁(61)及び
放出手段(2)等の制御手段(A)(送液管(6)も含
む)で外気の影響を受けることへなり、前記放出手段(
2)から放出されウェハ(W)に作用する現像液の温度
を高精度に設定値に制御できない問題があった。
(Problems to be Solved by the Invention) According to the example shown in FIG. A strainer (E32), a control valve (61), and a discharge means (2) connect the outlet of the double pipe (40) and the developer tank (1), although the temperature of the liquid can be maintained at an arbitrary set value. The control means (A) (including the liquid sending pipe (6)) will be affected by the outside air, and the control means (A) such as
2) There was a problem in that the temperature of the developer released from the wafer (W) and acting on the wafer (W) could not be controlled to a set value with high precision.

即ち、前記放出手段(2)等の制御手段(A)は熱容量
が大きく、しかも現像液は現像槽(1)に対し間欠的に
供給されるため、現像液の供給が停止されている間に前
記制御手段(A)が周囲の空気(外気)と熱交換し、外
気に近い温度になってしまう。
That is, the control means (A) such as the release means (2) has a large heat capacity, and since the developer is intermittently supplied to the developer tank (1), while the supply of the developer is stopped, The control means (A) exchanges heat with the surrounding air (outside air), resulting in a temperature close to that of the outside air.

このため、次のステップで現像液を現像槽(1)に対し
て供給しようとすると、温調器(5)等で温調された現
像液は前記制御手段(A)の熱影響を顕著に受けて、設
定値とは異なる温度に変動してしまうという問題があっ
た。
Therefore, when the developer is supplied to the developer tank (1) in the next step, the developer whose temperature has been adjusted by the temperature regulator (5) etc. is significantly affected by the heat of the control means (A). As a result, there was a problem in that the temperature fluctuated to a value different from the set value.

本発明の目的は、上記問題点を解決し、制御手段から供
給される現像液等の現像処理に供される薬液の温度を任
意の設定温度に高精度に制御できるようにしたレジスト
現像装置を提供する点にある。
An object of the present invention is to solve the above-mentioned problems, and to provide a resist developing device that can control the temperature of a chemical solution supplied from a control means, such as a developer solution, used for development processing, to an arbitrary set temperature with high precision. It is in the point of providing.

(間圧点を解決するための手段) そこで本発明は、現像槽(1)に被現像体(W)の保持
手段を内装すると共にこの保持手段で保持される被現像
体(W)に現像処理に供される薬液、例えば現像液、前
処理液、後処理液等を供給するための制御手段(A)、
例えばノズル等の放出手段(2)、制御弁(61)及び
ストレーナ(62)等を設け、この制御手段(A)を、
温調器(5)を介して薬液容器(3)に接続したレジス
ト現像装置であって、前記現像槽(1)の外部に、前記
制御手段(A)を内部に収容する熱媒チャンバー(30
)を設けると共に、恒温熱媒発生装置(7)を形成して
、この恒r]熱媒発生装置(7)を前記熱媒チャンバー
(30)の内部に配管(7B)(77)を介して連結し
、前記熱媒チャンバー(30)の内部に恒温熱媒体を循
環させる如く成し、前記制御手段(A)に前記恒温熱媒
体を接触させる如くしたことを特徴とするものである。
(Means for solving the pressure point) Therefore, the present invention provides a developing tank (1) with a holding means for the object to be developed (W), and the object to be developed (W) held by this holding means is subjected to development. a control means (A) for supplying a chemical solution to be subjected to processing, such as a developer solution, a pre-processing solution, a post-processing solution, etc.;
For example, a discharge means (2) such as a nozzle, a control valve (61), a strainer (62), etc. are provided, and this control means (A) is
The resist developing device is connected to a chemical solution container (3) via a temperature controller (5), and a heat medium chamber (30
), and a constant temperature heat medium generator (7) is formed, and this constant temperature heat medium generator (7) is inserted into the heat medium chamber (30) via piping (7B) (77). The heating medium is connected to the heating medium chamber (30) so that a constant temperature heating medium is circulated inside the heating medium chamber (30), and the constant temperature heating medium is brought into contact with the control means (A).

尚、前記薬液としては、前記現像液等のうち何れか一つ
あればよく、また前記制御手段(A)としては、前記放
出手段(2)等のうち何れか一つあればよい。
The chemical solution may be any one of the developing solutions, and the control means (A) may be any one of the releasing means (2).

(作用) 前記恒温熱媒発生装置(7)に連結され、恒温熱媒体が
循環する前記熱媒チャンバー(30)の内部に、前記制
御手段(A)を収容することにより、該制御手段(A)
に恒温熱媒体が接触することとなるのであり、この制御
手段(A)への恒温熱媒体の接触により、前記制御手段
(A)が外気の影響を受けるのをなくすることができる
のであり、従って、前記制御手段(A)から前記被現像
体(W)に供給される薬液の温度を設定値に高精度に制
御できるのである。
(Function) By accommodating the control means (A) in the heat medium chamber (30) connected to the constant temperature heat medium generator (7) and through which the constant temperature heat medium circulates, the control means (A) )
The constant-temperature heat medium comes into contact with the control means (A), and by contacting the constant-temperature heat medium with the control means (A), the control means (A) can be prevented from being influenced by outside air. Therefore, the temperature of the chemical solution supplied from the control means (A) to the object to be developed (W) can be controlled to a set value with high precision.

(実施例) 第1図において(1)は現像槽であって、この現像槽(
1)は二重壁構造とした胴体(11)と、底壁(12)
及び蓋体(13)とから成り、内部に現像室(10)を
形成すると共に、前記胴体(11)の二重壁構造により
、前記現像室(10)を取囲む熱交換チャンバー(14
)を形成している。
(Example) In Fig. 1, (1) is a developer tank, and this developer tank (
1) has a double-walled fuselage (11) and a bottom wall (12)
and a lid (13), forming a developing chamber (10) inside, and a heat exchange chamber (14) surrounding the developing chamber (10) due to the double wall structure of the body (11).
) is formed.

また、前記底壁(12)には支持筒(15)を立設して
、その内部に、上端に被現像体として例えば半導体ウェ
ハ(W)を固定状に保持するチャック(16)をもった
回転軸(17)を回転自由に支持するのであり、また、
前記蓋体(13)には、前記チャック(16)に保持さ
れる前記ウェハ< W )に、現像処理に供される薬液
の一つである現像液を放出する例えばスプレーノズル等
の放出手段(2)を配設している。
Further, a support cylinder (15) is provided upright on the bottom wall (12), and a chuck (16) is provided inside the support cylinder (15) for fixedly holding an object to be developed, such as a semiconductor wafer (W), at the upper end thereof. It supports the rotary shaft (17) freely, and also,
The lid (13) is provided with a discharge means (such as a spray nozzle) for discharging a developer, which is one of the chemicals used in the development process, onto the wafer <W> held by the chuck (16). 2) is installed.

この放出手段(2)は、詳しくは後記する温調器(5)
を介して加圧タンクを構成する薬液容器の一つである現
像液容器(3)に接続され、前記温調器(5)により温
度調整された現像液を、送液管(6)を介して前記放出
手段(2)に導き、該放出手段(2)から前記ウェハ(
W)に薬液(現像液)を例えば噴射により放出するよう
にしている。
This discharge means (2) is a temperature controller (5) which will be described in detail later.
is connected to the developer container (3), which is one of the chemical containers constituting the pressurized tank, through the pressure tank, and the developer whose temperature has been adjusted by the temperature controller (5) is sent through the liquid supply pipe (6). to the ejection means (2), and from the ejection means (2) the wafer (
A chemical solution (developing solution) is ejected onto W), for example, by spraying.

更に、送液管(6)には、現像N(1)への薬液(現像
液)の出停を制御するための制御弁(61)及び現像液
中の微小なゴミを除去するためのストレーナ(62)を
介装しており、これら放出手段(2)、制御弁(61)
及びストレーナ(132)’4により制御手段(A)(
これらを接続する送液管(6)を含む)を構成している
Furthermore, the liquid supply pipe (6) is provided with a control valve (61) for controlling the supply and stop of the chemical solution (developer) to the developer N (1) and a strainer for removing minute dust in the developer. (62), these discharge means (2), control valve (61)
and strainer (132)'4 to control means (A) (
(including a liquid sending pipe (6) connecting these).

なお、制御手段(A)としては、送液管(6)を用いず
に放出手段(2)、制御弁(61)及びストレーナ(6
2)等を一体成形したものでもよく、この制御手段(A
)により、現像液等の薬液を前記半導体ウェハ(W)に
適確に供給することができるのである。
In addition, as the control means (A), the discharge means (2), the control valve (61), and the strainer (6) are used without using the liquid sending pipe (6).
2) etc. may be integrally molded, and this control means (A
), it is possible to appropriately supply a chemical solution such as a developer to the semiconductor wafer (W).

尚、現像液としては、例えばイソブチルアルコールとエ
タノールとを約50対50の割合で混合したものを用い
ている。また前処理液や後処理液としては例えばイソプ
ロピルアルコール等が用いられる。
The developing solution used is, for example, a mixture of isobutyl alcohol and ethanol in a ratio of about 50:50. Further, as the pre-treatment liquid and the post-treatment liquid, for example, isopropyl alcohol or the like is used.

そして、以上のように構成するレジスト現像装置におい
て、前記現像槽(1)の外部に、前記制御手段(A)を
内部に収容する熱媒チャンバー(30)を設けると共に
、恒温熱媒発生装置(7)を形成して、この恒温熱媒発
生装置(7)を前記熱媒チャンバー(3o)の内部に配
管(76)(77)を介して連結し、前記熱媒チャンバ
ー(30)の内部に恒温熱媒体を循環させる如く成し、
前記制御手段(A)に前記恒温熱媒体を接触させる如く
したのである。
In the resist developing device configured as described above, a heating medium chamber (30) accommodating the control means (A) inside is provided outside the developing tank (1), and a constant temperature heating medium generating device ( 7), and this constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (3o) via piping (76) (77), and the constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30). Made to circulate a constant temperature heat medium,
The constant temperature heating medium is brought into contact with the control means (A).

具体的には、前記熱媒チャンバー(30)は、カップ状
の本体(31)を前記蓋体(13)の上部に取付けて構
成するものであって、この熱媒チャンバー(30)の内
部に、前記制御手段(A)を収容する如くしているので
ある。
Specifically, the heat medium chamber (30) is configured by attaching a cup-shaped main body (31) to the top of the lid (13), and the heat medium chamber (30) has a main body (31) attached to the top of the lid (13). , the control means (A) is housed therein.

また、前記現像槽(1)と前記温調器(5)とが離れて
いるため、前記送液管(6)の一部すなわち、前記熱媒
チャンバー(30)と前記温調器(5)との間は断熱構
造とした二重管(40)を用いて接続しているのであっ
て、該二重管(40)の内管(41)に前記薬液の一つ
である現像液を、また外管(42)に恒温熱媒を通して
いるのである。尚、前記二重管(40)は、恒温熱媒の
戻配管(77)及び断熱材(43)と共に1本の複合管
(44)を形成している。
Further, since the developing tank (1) and the temperature regulator (5) are separated, a part of the liquid feeding pipe (6), that is, the heat medium chamber (30) and the temperature regulator (5) are separated from each other. A double pipe (40) with a heat-insulating structure is used to connect the two, and a developer, which is one of the chemical solutions, is connected to the inner pipe (41) of the double pipe (40). Also, a constant temperature heating medium is passed through the outer tube (42). The double pipe (40) forms one composite pipe (44) together with the return pipe (77) for the constant temperature heating medium and the heat insulating material (43).

次に恒温熱媒発生装置(7)について説明する。尚、二
の実施例では、恒温熱媒体として恒温水を用いている。
Next, the constant temperature heat medium generator (7) will be explained. In the second embodiment, constant temperature water is used as the constant temperature heat medium.

この発生装置(7)は、断熱構造とした恒温槽(70)
に、ヒータ(71)及び冷凍装置の蒸発器(72)を内
装して構成するのであって、熱媒ポンプ(75)により
前記二重管(40)の外管(42)に恒温水(恒温熱媒
体)を供給すると共に、前記戻配管(77)からの恒温
水(恒温熱媒体)を前記恒温F!?(70)内に戻すよ
うにしている。
This generator (7) has a thermostatic oven (70) with a heat-insulating structure.
A heater (71) and an evaporator (72) of the refrigeration system are installed inside the unit, and a heat medium pump (75) supplies constant temperature water (constant temperature water) to the outer tube (42) of the double tube (40). At the same time, the constant temperature water (constant temperature heat medium) from the return pipe (77) is supplied to the constant temperature F! ? (70) I am trying to return it to within.

また、前記恒温槽(70)内に、前記薬液容器を構成す
る現像液容器(3)から延びるコイル状の熱交換器(5
0)を配設することにより、前記した薬液の一つである
現像液の温調器(5)を前記発生装置(7)と一体に構
成するのであって、この、′M調器(5)により前記恒
温水(恒温熱媒体)と同じ温度に設定される現像液を、
前記容器(3)の加圧作用により前記二重管(40)の
内管(41)に供給するようにしている。尚、前記熱交
換fi(50)の内部の容積は、1回の現像に用いる。
Further, a coil-shaped heat exchanger (5) extending from the developer container (3) constituting the chemical solution container is provided in the constant temperature bath (70).
0), the temperature regulator (5) of the developing solution, which is one of the chemical solutions described above, is integrated with the generator (7), and this 'M regulator (5) is integrated with the generator (7). ) to the same temperature as the constant temperature water (constant temperature heat medium),
The pressurizing action of the container (3) causes the water to be supplied to the inner tube (41) of the double tube (40). Note that the internal volume of the heat exchange fi (50) is used for one development.

夜量概ね200〜400 cc以上にするのが好ましい
It is preferable that the nighttime amount be approximately 200 to 400 cc or more.

そして前記恒温槽(70)に内装する前記ヒータ(71
)及び蒸発器(72)の運転は、前記熱媒チャンバー(
30)内の水温(熱媒温度)などを検出し、予じめ任意
に設定した設定温度との比較を行なうコントローラ(8
)により制御されるのであって、前記ヒータ(71)及
び蒸発器(72)の運転制御により5 ’C乃至40°
Cで誤差±0.1℃の一定の恒温水(恒温熱媒体)を形
成できるのである。
The heater (71) installed in the constant temperature oven (70)
) and the evaporator (72) are operated in the heat medium chamber (
The controller (8) detects the water temperature (heating medium temperature) etc. in the controller (30) and compares it with a preset temperature set arbitrarily.
), and the temperature ranges from 5'C to 40° by controlling the operation of the heater (71) and evaporator (72).
It is possible to form constant temperature water (constant temperature heat medium) with an error of ±0.1°C.

さらに、前記蒸発器(72)に対応する冷凍装置におけ
る凝縮器(76)は、圧縮機と共にフンデンシングユニ
ット(9)に設けるのであって、前記:囁発器(72)
の運転制御は前記圧縮機の発停又は容量制御により行な
うのである。
Furthermore, the condenser (76) in the refrigeration system corresponding to the evaporator (72) is provided in the funding unit (9) together with the compressor, and the:
The operation of the compressor is controlled by starting and stopping the compressor or by controlling the capacity.

かくして、前記恒温熱媒発生装置(7)からの恒温熱媒
体は、前記熱交換チャンバー(14)と前記熱媒チャン
バー(30)とに直列に循環させるのであり、前記恒温
熱媒体は、前記二重管(40)の外管(42)から第1
連絡管(80)を介して前記現像槽(1)の熱交換チャ
ンバー(14)に−日間ノIン六れ、樗チセンバー(1
4)から第2連絡管(90)を介して前記熱媒チャンバ
ー(30)の内部に供給されるのであって、これら一連
の通路(42)(80)(14)(90)より成る送配
管(76)及び前記戻配管(77)により、前記熱媒チ
ャンバー(30)に恒温熱媒体を循環させているのであ
る。
Thus, the constant temperature heat medium from the constant temperature heat medium generator (7) is circulated in series between the heat exchange chamber (14) and the heat medium chamber (30). The first from the outer pipe (42) of the heavy pipe (40)
The heat exchange chamber (14) of the developing tank (1) is connected to the heat exchange chamber (14) through the connecting pipe (80), and the Chinese centrifuge bar (1
4) through the second communication pipe (90) into the interior of the heat medium chamber (30), and is comprised of a series of passages (42), (80), (14), and (90). (76) and the return pipe (77) circulate the constant temperature heat medium in the heat medium chamber (30).

このとき、前記熱媒ジャケット(30)内に収容される
前記放出手段(2)及び該放出手段(2)を接続する送
液管(6)、また前記ストレーナ(62)及び制御弁(
61)、すなわち制御手段(A)は、所定の設定温度に
調整された恒温熱媒体と直接接触するのであるから、前
記制御手段(A)は外気の影響を受けることはないので
ある。従って、前記制御手段(A)から供給される現像
液等の薬液の温度は設定値に高精度に制御できるのであ
る。
At this time, the discharge means (2) housed in the heat medium jacket (30), the liquid feed pipe (6) connecting the discharge means (2), the strainer (62) and the control valve (
61), that is, since the control means (A) is in direct contact with the constant-temperature heat medium adjusted to a predetermined set temperature, the control means (A) is not affected by the outside air. Therefore, the temperature of the chemical liquid such as the developer supplied from the control means (A) can be controlled to a set value with high precision.

また、前記熱交換チャンバー(14)にも恒温熱媒体を
循環させているで、前記現像室(10)内の温度も該現
像室(10)内の雰囲気空気を介して間接的に設定温度
に保持できるのである。
Further, a constant temperature heat medium is also circulated in the heat exchange chamber (14), so that the temperature in the developing chamber (10) is indirectly brought to the set temperature via the atmospheric air in the developing chamber (10). It can be retained.

しかも、この設定温度は、前記コントローラ(8)の入
力器により任意に設定できるし、任意に選択した設定温
度に正確に制御できるのである。
Furthermore, this set temperature can be arbitrarily set using the input device of the controller (8), and can be accurately controlled to an arbitrarily selected set temperature.

尚、第1図において(20)は、前記現像槽(1)の胴
体(11)に設けるウェハ出入口であって、この出入口
(20)には扉(21)を開閉自由に取付けている。
In FIG. 1, (20) is a wafer entrance/exit provided in the body (11) of the developer tank (1), and a door (21) is attached to this entrance/exit (20) so that it can be opened and closed freely.

第1図の実施例では、前記熱媒チャンバー(30)を、
前記現像槽(1)の上部に構成したが、第2図の如く現
像槽(1)と独立に構成してもよい。
In the embodiment of FIG. 1, the heat medium chamber (30) is
Although it is constructed above the developer tank (1), it may be constructed independently of the developer tank (1) as shown in FIG.

この第2図のものは、熱媒チャンバー(30)を箱形本
体(32)で構成し、該本体(32)の内部に、制御手
段(A)のうち放出子(2)段を除く制御弁(61)及
びストレーナ(62)を収容する如くしたものである。
The one in FIG. 2 has a heat medium chamber (30) composed of a box-shaped main body (32), and inside the main body (32) is a control means (A) except for the emitter (2) stage. It accommodates a valve (61) and a strainer (62).

また、この熱媒チャンバー(30)は、現像室(10)
の雰囲気温度を調節する熱交換チャンバー(14)と配
管(7Ei)(77)により並”列に接続され、恒温熱
媒発生装置(7)からの恒温熱媒体を、前記両チ、ヤン
バー(30)(14)に並列に循環されている。
Moreover, this heat medium chamber (30) is a developing chamber (10).
The heat exchange chamber (14) for adjusting the ambient temperature of ) (14) in parallel.

尚、第2図では、温調器(5)を前記発生装置(7)と
別体に形成しており、また、薬液容器(3)の薬液はポ
ンプ(P)にて送出するようにしている。さらに蓋体(
13)にファン(22)を取付けて、該ファン(22)
の攪拌により、前記現像室(10)の室内を、前記放出
手段(2)から放出される薬液で迅速に飽和させる如く
している。
In FIG. 2, the temperature controller (5) is formed separately from the generator (7), and the chemical liquid in the chemical liquid container (3) is delivered by a pump (P). There is. Furthermore, the lid body (
13) and attach the fan (22) to the fan (22).
By stirring, the interior of the developing chamber (10) is quickly saturated with the chemical solution discharged from the discharge means (2).

以上の第1図及び第2図の実施例では、現像処理に供さ
れる薬液として、現像液のみを取上げて説明したが、前
処理液、後処理液等についても前記現像液の場合と同様
、本発明が適用されるのは云うまでもない。また、恒温
熱媒体を前記熱交換チャンバー(30)だけでなく、前
記熱交換チャンバー(14)にも循環させているが、該
熱交換チャンバー(14)は設けずに、前記熱交換チャ
ンバー(30)のみに恒温熱媒体を循環させてもよい。
In the embodiments shown in FIGS. 1 and 2 above, only the developer was used as the chemical solution used in the development process, but the pre-processing liquid, post-processing liquid, etc. are also similar to the case of the above-mentioned developer. , it goes without saying that the present invention is applicable. Further, although the constant temperature heat medium is circulated not only in the heat exchange chamber (30) but also in the heat exchange chamber (14), the heat exchange chamber (14) is not provided and the heat exchange chamber (30 ) may circulate the constant temperature heat medium only through the

(発明の効果) 本発明は以上のように、前記現像槽(1)の外部に、前
記制御手段(A)を内部に収容する熱媒チャンバー(3
0)を設けると共に、恒温熱媒発生装置(7)を形成し
て、この恒温熱媒発生装置(7)を前記熱媒チャンバー
(30)の内部に配管(76)(77)を介して連結し
、前記熱媒チャンバー(30)の内部に恒温熱媒体を循
環させる如く成し、前記制御手段(A)に前記恒温熱媒
体を接触させる如くしたから、前記制御手段(A)から
供給される現像液、前処理液、後処理液等の現像処理に
供される薬液の温度を任意に設定できると共に、設定し
た温度に高精度に保持できるのである。
(Effects of the Invention) As described above, the present invention provides a heating medium chamber (3) that accommodates the control means (A) inside the developer tank (1).
0), a constant temperature heat medium generator (7) is formed, and this constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30) via piping (76) (77). Since the constant temperature heat medium is circulated inside the heat medium chamber (30) and the constant temperature heat medium is brought into contact with the control means (A), the constant temperature heat medium is supplied from the control means (A). The temperature of the chemical solution used in the development process, such as the developer, pre-treatment liquid, and post-treatment liquid, can be arbitrarily set and maintained at the set temperature with high precision.

従って、現像液等の薬液の温度変化によるレジストg度
のバラつきを最小限に抑制でき、半導体ウェハ淳の被現
像体の製品歩留を向上できるのである。
Therefore, variations in the resist g degree due to temperature changes in a chemical solution such as a developer can be suppressed to a minimum, and the product yield of semiconductor wafers to be developed can be improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明現像装置の第1実施例を示す概略説明図
、第2図は同第2実施例を示す概略説明図、第3図及び
第4図は従来例を示す概略説明図である。 (1)・・・・・・現像槽 (2)・・・・・・放出手段 (3)・・・・・・薬液容器 (5)・・・・・・温調器 (6)・・・・・・送液管 (7)・・・・・・恒温熱媒発生装置 (30)・・・・・・熱媒チャンバー (61)・・・・−制御弁 (62)・・・・・・ストレーナ (7f3)(77)・・・・・・配管 (A)・・・・・・利口手段 (W)・・・・・・被現像体 出願人 ダイキン工業株式会社  。
FIG. 1 is a schematic explanatory diagram showing a first embodiment of the developing device of the present invention, FIG. 2 is a schematic explanatory diagram showing the second embodiment, and FIGS. 3 and 4 are schematic explanatory diagrams showing a conventional example. be. (1)...Developer tank (2)...Discharge means (3)...Medicine container (5)...Temperature controller (6)... ...Liquid pipe (7) ... Constant temperature heating medium generator (30) ... Heat medium chamber (61) ... - Control valve (62) ... ... Strainer (7f3) (77) ... Piping (A) ... Clever means (W) ... Object to be developed Applicant: Daikin Industries, Ltd.

Claims (1)

【特許請求の範囲】[Claims] (1)現像槽(1)に被現像体(W)の保持手段を内装
すると共にこの保持手段で保持される被現像体(W)に
現像処理に供される薬液を供給するための制御手段(A
)を設け、この制御手段(A)を、温調器(5)を介し
て薬液容器(3)に接続したレジスト現像装置であって
、前記現像槽(1)の外部に、前記制御手段(A)を内
部に収容する熱媒チャンバー(30)を設けると共に、
恒温熱媒発生装置(7)を形成して、この恒温熱媒発生
装置(7)を前記熱媒チャンバー(30)の内部に配管
(76)(77)を介して連結し、前記熱媒チャンバー
(30)の内部に恒温熱媒体を循環させる如く成し、前
記制御手段(A)に前記恒温熱媒体を接触させる如くし
たことを特徴とするレジスト現像装置。
(1) The developing tank (1) is equipped with a holding means for the object to be developed (W), and a control means for supplying a chemical solution to be subjected to development processing to the object to be developed (W) held by this holding means. (A
), and the control means (A) is connected to a chemical solution container (3) via a temperature controller (5), the resist development apparatus having a control means (A) connected to the chemical solution container (3) through a temperature controller (5), wherein the control means (A) is provided outside the developer tank (1). A) is provided with a heat medium chamber (30) accommodating the heat medium chamber (30) therein;
A constant-temperature heat medium generator (7) is formed, and this constant-temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30) via piping (76) (77). (30) A resist developing device characterized in that a constant temperature heating medium is circulated inside the resist developing device, and the constant temperature heating medium is brought into contact with the control means (A).
JP10787586A 1986-05-12 1986-05-12 Resist developing device Expired - Fee Related JPH061763B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10787586A JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10787586A JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Publications (2)

Publication Number Publication Date
JPS62263635A true JPS62263635A (en) 1987-11-16
JPH061763B2 JPH061763B2 (en) 1994-01-05

Family

ID=14470303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10787586A Expired - Fee Related JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Country Status (1)

Country Link
JP (1) JPH061763B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022068194A (en) * 2018-06-12 2022-05-09 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022068194A (en) * 2018-06-12 2022-05-09 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method

Also Published As

Publication number Publication date
JPH061763B2 (en) 1994-01-05

Similar Documents

Publication Publication Date Title
EP0224273B1 (en) Resist developing apparatus
KR950004433A (en) Chemical liquid supply device and method
JPH11226387A (en) Treatment by fluid and device therefor
KR100199681B1 (en) Apparatus for supplying a treatment material
JPH01315336A (en) Heating and cooling device for reactor
JP2001044163A (en) Method and apparatus for control of fluid within substrate processing tank
WO2012029875A1 (en) Hydrogen peroxide production apparatus and sterilization gas production apparatus
JPS62263635A (en) Developing device for resist
US6161300A (en) Alcohol vapor dryer system
CA1091074A (en) High-speed photographic processing using heated foamed liquids
JPS62263634A (en) Developing device for resist
JPS62183526A (en) Resist developing apparatus
TW200301407A (en) Developing device and method thereof
JPS62252938A (en) Resist developing apparatus
JPS62272542A (en) Wet etching apparatus
JP2882963B2 (en) Steam generator for substrate processing
JPH10147870A (en) Vaporizer for liquid raw material
JPH0290934A (en) Liquid treating apparatus
JPS6332922A (en) Resistor coater
EP0504420A1 (en) Steam supplier
KR930003875B1 (en) Photoresist developing apparatus
JPH03106485A (en) Ultrasonic washing and drying method and apparatus
JPS6373523A (en) Method for developing resist
JPS62183525A (en) Resist developing apparatus
JPH0571130B2 (en)

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees