JPS6225877U - - Google Patents
Info
- Publication number
- JPS6225877U JPS6225877U JP11979586U JP11979586U JPS6225877U JP S6225877 U JPS6225877 U JP S6225877U JP 11979586 U JP11979586 U JP 11979586U JP 11979586 U JP11979586 U JP 11979586U JP S6225877 U JPS6225877 U JP S6225877U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- fixed
- insulating plate
- pipe
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 10
- 239000004020 conductor Substances 0.000 claims 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Description
第1図は本考案に係る多探針形プローブステー
シヨンの一実施例の正面図、第2図はその平面図
、第3図は絶縁板の部分の斜視図、第4図は探針
パイプの断面図、第5図、第6図はそれぞれ他の
実施例の正面図、第7図はプリント基板の他の実
施例の平面図である。
1……基台、2……ウエハ、3,4,5……プ
リント基板、6……支柱ねじ、7,8,9……ア
ーム、10,11,12……取付体、13,14
,15……ソケツト、20……絶縁板、21……
探針パイプ、22……探針、23……リード線、
24……スプリング。
Fig. 1 is a front view of an embodiment of a multi-probe probe station according to the present invention, Fig. 2 is a plan view thereof, Fig. 3 is a perspective view of the insulating plate portion, and Fig. 4 is a view of the probe pipe. The sectional view, FIGS. 5 and 6 are front views of other embodiments, and FIG. 7 is a plan view of another embodiment of the printed circuit board. 1... Base, 2... Wafer, 3, 4, 5... Printed circuit board, 6... Support screw, 7, 8, 9... Arm, 10, 11, 12... Mounting body, 13, 14
, 15... socket, 20... insulating plate, 21...
Probe pipe, 22... Probe, 23... Lead wire,
24...Spring.
Claims (1)
れ、その先端がほぼ同一面にかつ重ならないよう
に所定範囲内に配置された複数のアームと、各ア
ームの先端にそのほぼ中央部がそれぞれ固定され
た絶縁板と、絶縁板の周辺部に貫通して固定され
た複数のパイプと、各パイプの内に上下に移動自
在に挿入された導電材からなる探針と、探針を下
方に付勢するとともに、一端がパイプの上端に固
定され他端が探針の上端に接触するスプリングと
、各スプリングの一端と基板の対応する端子回路
とをそれぞれ接続するリード線とを備えた多探針
形プローブステーシヨン。 It is formed by extending from a board having a plurality of terminal circuits, and has a plurality of arms arranged within a predetermined range so that their tips are almost on the same plane and do not overlap, and each arm has a roughly central portion fixed to the tip. an insulating plate, a plurality of pipes fixed through the periphery of the insulating plate, a probe made of a conductive material inserted into each pipe so as to be movable up and down, and the probe is urged downward. and a multi-probe type having a spring whose one end is fixed to the upper end of the pipe and whose other end is in contact with the upper end of the probe, and lead wires that respectively connect one end of each spring to the corresponding terminal circuit of the board. probe station.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11979586U JPS6236139Y2 (en) | 1986-08-06 | 1986-08-06 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11979586U JPS6236139Y2 (en) | 1986-08-06 | 1986-08-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6225877U true JPS6225877U (en) | 1987-02-17 |
JPS6236139Y2 JPS6236139Y2 (en) | 1987-09-14 |
Family
ID=31007502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11979586U Expired JPS6236139Y2 (en) | 1986-08-06 | 1986-08-06 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6236139Y2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63186441A (en) * | 1987-01-29 | 1988-08-02 | Tokyo Electron Ltd | Probe measurement |
JPH0236368A (en) * | 1988-07-26 | 1990-02-06 | Matsushita Electric Ind Co Ltd | Prover |
JP2011117767A (en) * | 2009-12-01 | 2011-06-16 | Unitechno Inc | Contact probe and inspection prober equipped with the same |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009113183A1 (en) * | 2008-03-11 | 2009-09-17 | 株式会社東京精密 | Multichip prober |
-
1986
- 1986-08-06 JP JP11979586U patent/JPS6236139Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63186441A (en) * | 1987-01-29 | 1988-08-02 | Tokyo Electron Ltd | Probe measurement |
JPH0236368A (en) * | 1988-07-26 | 1990-02-06 | Matsushita Electric Ind Co Ltd | Prover |
JP2011117767A (en) * | 2009-12-01 | 2011-06-16 | Unitechno Inc | Contact probe and inspection prober equipped with the same |
Also Published As
Publication number | Publication date |
---|---|
JPS6236139Y2 (en) | 1987-09-14 |
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