JPS62229334A - Test system using test program for information processing system - Google Patents

Abstract

PURPOSE:To specify a fault area of hardware by using a hardware information collecting mechanism of a central processing unit to deliver also the detailed hardware information when an error occurs and is detected by a test program. CONSTITUTION:For the test programs 20 loaded to a main memory 2, a software instruction executing mechanism 10 of a central processing unit 1 carries out a test environment setting program 21, a test executing program 22 and a test result check program 23. If a foul operation is checked by the program 23, the program 20 starts a hardware information collecting mechanism 11 of the unit 1 via a hardware information collection start program 24 to store the information internal (hardware information 26) on a control memory and a register in the unit 1 into the memory 2 in addition to those information collected by the program 20. Then the program 20 delivers the test results including the information 26 to an output device 4.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a test method using a test program for an information processing system, and particularly to test result output information when an error is detected by the test program.

[Conventional technology]

Conventionally, this test result output information has been output by editing software reference information read out by a test program.

[Problem that the invention seeks to solve]

Since the test result output information by the conventional test program described above is only software reference information, there is a drawback that if an error is detected in the test program due to a hardware failure, the location of the hardware failure cannot be specified.

SUMMARY OF THE INVENTION An object of the present invention is to provide a test method using a test program for an information processing system that can identify a fault location in hardware using a test program.

[Means for solving problems]

The configuration of the present invention includes an external storage device that stores a test program, a main storage device that stores the test program, a software instruction execution mechanism that executes software instructions, an internal I that is registers, and control storage information.
- a central processing unit having a -docuair information collection mechanism that collects dokuair information and stores it in the main storage device;
In a test method using an information processing system test program, the test program is read from the external storage device and stored in the main storage device, and the test program is read out from the external storage device and stored in the main storage device. If the central processing unit executes test environment setting, test execution, and test result check, and if an error is detected in the test result check, the hardware information collection mechanism is activated to execute the test program. In addition to the collectable information, the internal hardware information in the central processing unit is stored in the main storage device, and the test result including the internal hardware information is output to the output device by the test program. shall be.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a schematic diagram showing the configuration of an information processing system according to an embodiment of the present invention, and FIG. 2 is a flowchart showing the operation of the test program used in FIG.

The central processing unit 1 is composed of a software instruction execution mechanism 10 and a hardware information collection mechanism 11, and a test program 20 stored in an external storage device 3 is initially loaded into the main storage device 2. The test program 20 has test environment settings 21. Test execution 22. Check test results 23, start collecting hardware information 24. It consists of a test result output 25.

Next, the operation of the single test program will be explained.

The test program 20 is loaded onto the main storage device 2 from the external storage device 13 (step 50). The test program 20 on the main storage device 2 is executed by the software instruction execution mechanism 10 on the central processing unit 1 in the test environment settings 21. Test execution 22. Test result check 23 is executed (step 5
1). At test result check 23, a check is made to see if the test result and the expected value are equal (step 52).

If the check results are determined to be equal, control shifts to implementation of the first test item, and the test environment is set for the next test. In this way, all test items are executed sequentially.

If the test result check 23 determines that the check result is incorrect, the hardware information collection mechanism 11 in the central processing unit 1φ is activated by the hardware information collection activation 24 in the test program 20 (step 53), and the test program In addition to the information that can be collected by the central processing unit
The hardware information collection mechanism 11 stores hardware information 26, which is storage information for controlling the register g inside, on the main storage device 2.

The test program 20 outputs the test results including the hardware information stored on the main storage device 2 to the output device 4 through the test result output 25 (step 54). By analyzing the output hardware information, find the difference from when it worked normally.

19 maintenance work is completed by identifying the faulty part of the hardware and replacing the faulty part.

〔Effect of the invention〕

In step 5 explained above, the present invention, when an error is detected in the test program, uses a hardware information collection mechanism in the central processing unit to output detailed hardware information at the time of error occurrence in the test program. This has the effect of making it possible to test information processing systems by identifying faulty parts and creating test programs by analyzing hardware information.

[Brief explanation of drawings]

FIG. 1 is a block diagram of an information processing system according to an embodiment of the present invention, and FIG. 2 is a flowchart showing the operation of a test program used in FIG. 1...Central processing unit t, 2...Main storage device, 3...External storage device, 4...Output device, 10...・Software instruction execution mechanism,
11...Hardware information collection mechanism, 20...
...Test program, 21...Test environment setting program, 22...Test execution program,
23...Test result check program, 24.
...Hardware information collection startup program. 25...Test result output program, 26...
...Internal hardware fair information, 50-54...
Each step of the test program operation flow.・1' is represented by patent attorney Susumu Uchihara.5. , /\-
I/Ga 1 diagram

Claims (1)

[Claims] Collects an external storage device storing a test program, a main storage device storing the test program, a software instruction execution mechanism and registers for executing software instructions, and internal hardware information which is storage information for control. In a test method using a test program for an information processing system, the information processing system includes a central processing unit having a hardware information collection mechanism stored in a main storage device, and an output device that outputs test result information of the test program. The test program read out from the main storage and stored in the main storage device is read by the software instruction execution mechanism, and the central processing unit executes test environment setting, test execution, and test result check, and an error is detected by the test result check. , starts the hardware information collection mechanism to store the internal hardware information in the central processing unit in the main storage device in addition to the information that can be collected by the test program; A test method using a test program for an information processing system, characterized in that a test result including information is output to the output device.