JPS6220348A - Wafer rotating mechanism for rotating around its own axis and therearound - Google Patents
Wafer rotating mechanism for rotating around its own axis and therearoundInfo
- Publication number
- JPS6220348A JPS6220348A JP60158242A JP15824285A JPS6220348A JP S6220348 A JPS6220348 A JP S6220348A JP 60158242 A JP60158242 A JP 60158242A JP 15824285 A JP15824285 A JP 15824285A JP S6220348 A JPS6220348 A JP S6220348A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- axis
- therearound
- around
- revolution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は半導体などの薄膜形成装置に係り、特に、イオ
ンビームを応用したコンパクトな加工装置に適用するの
に好適なウェハの自公転機構に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a thin film forming apparatus for semiconductors, etc., and particularly to a wafer rotation and revolution mechanism suitable for application to a compact processing apparatus that uses an ion beam.
[発明の背景〕
ミリング、スパッタ、打込等の加工装置に用いるイオン
ビームは、ビームが発散し、ビームの断面積について完
全には一様できないため、すぐれた加工性能を得るため
米国特許4,278,493のように、ウェハ取付台を
ビームに対し傾斜した状態でイオンビームを照射する方
法が提案さ汎ている。[Background of the Invention] Ion beams used in processing equipment such as milling, sputtering, and implantation diverge and cannot be completely uniform in cross-sectional area. 278, 493, a method of irradiating the ion beam with the wafer mount tilted with respect to the beam has been widely proposed.
しかし、従来の方法では次のような欠点がある。However, the conventional method has the following drawbacks.
1)第5図に示すように自転する複数個のウェハ3を公
転する盤5に取付tツ、自公転状態で盤全体をイオンビ
ーム7に対して傾斜させる方法では、ウェハとイオン源
との距離がウェハ3毎に異なるため、全ウェハ3にわた
って一様な加工性能を得ることが困難であり、傾斜角度
によって公転外径が異なるため、イオン源及びウェハ3
を収納するための真空容器が大形化し、不経済であり真
空性能等に悪影響を与え る。1) As shown in FIG. 5, a method in which a plurality of rotating wafers 3 are attached to a revolving disk 5 and the entire disk is tilted with respect to the ion beam 7 while it is rotating on its own axis, reduces the connection between the wafers and the ion source. Since the distance differs for each wafer 3, it is difficult to obtain uniform processing performance over all wafers 3, and since the outer diameter of revolution differs depending on the inclination angle, the ion source and wafer 3
The vacuum container used to store the vacuum becomes large, which is uneconomical and has a negative impact on vacuum performance, etc.
2)第6図に示すように、自公転するウェハ3がそれぞ
れイオンビーム7に対して傾斜する構造では、第一の欠
点は防止できるが、ウェハの傾斜軸をウェハ表面と一致
させることは構造上回難なため、傾斜により公転の最大
外径は増大し上述と同じ欠点が生じる。2) As shown in FIG. 6, the first drawback can be avoided with a structure in which the rotating wafers 3 are tilted with respect to the ion beam 7, but it is difficult to align the tilt axis of the wafer with the wafer surface. Due to the inclination, the maximum outer diameter of revolution increases and the same drawbacks as mentioned above occur.
本発明の目的は、ミリング性能向上のため、イオンビー
ムに対しウェハを傾斜した状態で自公転させる構造で、
基板とイオン源との距離を一定に転運動する複数個のウ
ェハを公転運動の半径軸まわりに傾斜させ、傾斜時公転
ず之ウェハの最大外径が増大することなく、所定の性能
を得る構造としたことにある。The purpose of the present invention is to provide a structure in which the wafer rotates and revolves in an inclined state with respect to the ion beam, in order to improve milling performance.
A structure in which multiple wafers that rotate at a constant distance between the substrate and the ion source are tilted around the radial axis of the orbital motion, and the maximum outer diameter of the wafers that do not revolve when tilted does not increase, and a specified performance is obtained. The reason is that
以下、本発明の一実施例を第1図ないし第4図により説
明する。An embodiment of the present invention will be described below with reference to FIGS. 1 to 4.
第1図に本発明の原理図を、その側面図を第4図に示す
。第1図及び第4図で、ウェハ保持機構2は、ウェハ3
を保持して、矢印12のように自転運動し、支持装置4
を介して公転軸1に支持さく3)
れ矢印11のように公転運動する。この状態で、ウェハ
3及びウェハ保持機構2は矢印13の方向に傾斜する。FIG. 1 shows a principle diagram of the present invention, and FIG. 4 shows a side view thereof. In FIGS. 1 and 4, the wafer holding mechanism 2 includes a wafer 3
The supporting device 4 rotates as shown by the arrow 12.
It is supported by the revolving axis 1 via 3) and revolves as shown by the arrow 11. In this state, the wafer 3 and the wafer holding mechanism 2 are tilted in the direction of the arrow 13.
全部のウェハ3及びウェハ保持機構2が同じ方向に傾斜
した場合を第2図に、となり合う、ウェハ3及びウェハ
保持機構2が逆の方向に傾斜した場合を第3図に示す。FIG. 2 shows a case in which all wafers 3 and wafer holding mechanisms 2 are tilted in the same direction, and FIG. 3 shows a case in which adjacent wafers 3 and wafer holding mechanisms 2 are tilted in opposite directions.
本実施例によれば、自公転機構の最大外径りを増加させ
ることなく、ウェハ3及びウェハ保持機構2を自転、公
転、傾斜させることができるので、イオン源、収納容器
6を必要以上に大きくすることなく、経済性、信頼性、
ともに優れた構造で、必要な加工性能を満足することが
できる。According to this embodiment, the wafer 3 and the wafer holding mechanism 2 can be rotated, revolved, and tilted without increasing the maximum outer diameter of the rotation/revolution mechanism, so the ion source and storage container 6 can be Economical, reliable, and
Both have excellent structures and can satisfy the required processing performance.
本発明によれば、すぐれた加工性能を達成でき、イオン
源の直径を最小にでき、経済性、信頼性がすぐれ、真空
性能の向上、真空装置の経済化が図れる。According to the present invention, excellent processing performance can be achieved, the diameter of the ion source can be minimized, economy and reliability are excellent, vacuum performance can be improved, and vacuum equipment can be made more economical.
第1図は本発明は一実施例の自公転機構の原理図、第2
図及び第3図は、第1図のウェハ支持袋置の傾斜状態を
示す図、第4図は第1図の側面図、第5図及び第6図は
従来のウェハ自公転機構の原理図である。
1・・・公転軸、2・・・ウェハ保持機構、3・・・ウ
ェハ、4・・・支持装置。Fig. 1 is a principle diagram of a rotation/revolution mechanism according to an embodiment of the present invention;
Figures 3 and 3 are views showing the tilted state of the wafer support bag holder in Figure 1, Figure 4 is a side view of Figure 1, and Figures 5 and 6 are principle diagrams of a conventional wafer rotation mechanism. It is. DESCRIPTION OF SYMBOLS 1... Revolution axis, 2... Wafer holding mechanism, 3... Wafer, 4... Support device.
Claims (1)
を支持する支持装置が、複数個、公転軸を中心に公転運
動し、前記ウエハ及び前記保持機構は、それぞれの自転
軸を中心に自転運動する装置において、 前記ウエハ及び前記保持機構は前記公転中心と、前記ウ
エハとを結ぶ線と前記公転軸とでなす面に対し、任意の
角度で傾斜した状態で前記自転及び前記公転運動できる
構造としたことを特徴とするウエハ自公転機構。[Scope of Claims] 1. A plurality of wafers, holding mechanisms for mounting the wafers, and supporting devices for supporting them revolve around revolution axes; In an apparatus that rotates about an axis, the wafer and the holding mechanism rotate and hold while being inclined at an arbitrary angle with respect to a plane formed by a line connecting the center of revolution and the wafer and the axis of revolution. A wafer revolution mechanism characterized by having a structure capable of the above-mentioned revolution movement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60158242A JPS6220348A (en) | 1985-07-19 | 1985-07-19 | Wafer rotating mechanism for rotating around its own axis and therearound |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60158242A JPS6220348A (en) | 1985-07-19 | 1985-07-19 | Wafer rotating mechanism for rotating around its own axis and therearound |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6220348A true JPS6220348A (en) | 1987-01-28 |
Family
ID=15667364
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60158242A Pending JPS6220348A (en) | 1985-07-19 | 1985-07-19 | Wafer rotating mechanism for rotating around its own axis and therearound |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6220348A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000049645A1 (en) * | 1999-02-18 | 2000-08-24 | The Furukawa Electric Co., Ltd. | Electrode for semiconductor device and its manufacturing method |
JPWO2016152395A1 (en) * | 2015-03-20 | 2017-04-27 | 芝浦メカトロニクス株式会社 | Film forming apparatus and film forming work manufacturing method |
-
1985
- 1985-07-19 JP JP60158242A patent/JPS6220348A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000049645A1 (en) * | 1999-02-18 | 2000-08-24 | The Furukawa Electric Co., Ltd. | Electrode for semiconductor device and its manufacturing method |
US6639316B1 (en) | 1999-02-18 | 2003-10-28 | The Furukawa Electric Co., Ltd. | Electrode having substrate and surface electrode components for a semiconductor device |
JPWO2016152395A1 (en) * | 2015-03-20 | 2017-04-27 | 芝浦メカトロニクス株式会社 | Film forming apparatus and film forming work manufacturing method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4745287A (en) | Ion implantation with variable implant angle | |
JPH031378B2 (en) | ||
US6082298A (en) | Substrate carrier for a vacuum coating apparatus | |
JP3142285B2 (en) | Ion implantation apparatus and method | |
JPS625548A (en) | Ion beam processing device | |
JPS6254089A (en) | Mechanism for rotating and revolving wafer | |
JPS6220348A (en) | Wafer rotating mechanism for rotating around its own axis and therearound | |
JP2000353490A (en) | Ion implanting device | |
CN116759375A (en) | Centrifugal square wafer clamping device, clamping method and cleaning method | |
US6806479B1 (en) | Apparatus and method for reducing implant angle variations across a large wafer for a batch disk | |
JP3149798B2 (en) | Platen support drive mechanism for ion implanter | |
JP2790661B2 (en) | Sputtering equipment | |
TWI664305B (en) | Three dimension revolution and rotation deposition turntable structure | |
JPH01184277A (en) | Substrate rotating device | |
JPS5918638A (en) | Dry etching apparatus | |
JPH08134668A (en) | Ion beam milling method and device therefor | |
JPH11238714A (en) | Method of cleaning | |
JP2716142B2 (en) | Semiconductor substrate ion implantation system | |
JP3382885B2 (en) | Ion implantation apparatus and ion implantation method | |
JPH0526755Y2 (en) | ||
JPS61179885A (en) | Rotating and revolving device | |
JPS6281030A (en) | Semiconductor substrate drying device | |
JPH01287940A (en) | Rotary treatment device | |
JPH01239747A (en) | Ion processing device | |
JP3007963U (en) | Workpiece attachment for vacuum deposition equipment |