JPS62165718A - Thin film magnetic head - Google Patents

Thin film magnetic head

Info

Publication number
JPS62165718A
JPS62165718A JP773986A JP773986A JPS62165718A JP S62165718 A JPS62165718 A JP S62165718A JP 773986 A JP773986 A JP 773986A JP 773986 A JP773986 A JP 773986A JP S62165718 A JPS62165718 A JP S62165718A
Authority
JP
Japan
Prior art keywords
film
layer
coil
thin film
magnetic head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP773986A
Other languages
Japanese (ja)
Other versions
JP2628854B2 (en
Inventor
Tsuneo Nakamura
恒夫 中村
Naoki Koide
小出 直樹
Ryoji Namikata
量二 南方
Toru Kira
吉良 徹
Mitsuhiko Yoshikawa
吉川 光彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP61007739A priority Critical patent/JP2628854B2/en
Publication of JPS62165718A publication Critical patent/JPS62165718A/en
Application granted granted Critical
Publication of JP2628854B2 publication Critical patent/JP2628854B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3109Details
    • G11B5/313Disposition of layers
    • G11B5/3133Disposition of layers including layers not usually being a part of the electromagnetic transducer structure and providing additional features, e.g. for improving heat radiation, reduction of power dissipation, adaptations for measurement or indication of gap depth or other properties of the structure

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Magnetic Heads (AREA)

Abstract

PURPOSE:To prevent cracks from being caused by forming dummy coils to an inner and/or outer circumference of a conductor coil except the uppermost layer so as to decrease the step difference at the position for making flatness thereby reducing the film thickness of a coating film for flatness forming. CONSTITUTION:In forming a two layer six turn thin film magnetic head, a lower magnetic core 12 is formed on a base 11 at first and then an insulation film 13 is formed. A conductor film is worked to a prescribed shape thereupon to form a 1st layer three turn thin film conductor coil 14 and to form dummy coils 14a-14e at the same time by the same material and manufacture method. An insulation film 17 is formed on them and a film 18 for flatness forming on the film 17. A 2nd layer three turn thin film conductor coil 19, and insulation film 20 and a film 21 for flatness forming are provided by the similar procedure. Thus, the film thickness of the 2nd layer film 21 at the inner and outer circumference of the coil 14 is reduce in this way, and cracks at sintering are reduced.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は薄膜磁気ヘッド、特に多層型導電体コイルを用
いた薄膜磁気ヘッドに関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a thin film magnetic head, and particularly to a thin film magnetic head using a multilayer conductor coil.

(従来の技術とその問題点) 近年、軟磁性体バルク材料を加工して作成する磁気ヘッ
ドと比較して、狭トラツク化、狭ギャップ化、多素子化
が容易なことから、高密度記録用ヘッドとして薄膜磁気
ヘッドが重要視されている。
(Conventional technology and its problems) In recent years, it has become popular for high-density recording because it is easier to narrow tracks, narrow gaps, and increase the number of elements compared to magnetic heads made by processing soft magnetic bulk materials. Thin film magnetic heads are considered important as heads.

ところで、この薄膜磁気ヘッドにおいて、高密度記録を
達成するためには、狭トラツク化、狭ギャップ化、マル
チターン(複数巻)化による低電流化が要求される。又
、多トラツク磁気ヘッドにおいては導電体コイルの配置
スペースの縮小化のため、一方、−トラック磁気ヘッド
では上記マルチターン化による低電流化のため、それぞ
れ軟磁性薄膜からなる下部磁気コアと上部磁気コア間に
導電体コイルを複数色積層して多層導電体コイル形状と
することが好ましい。そして、このような多層コイル形
状を採用する場合、導電体コイルによって生じる段差の
平坦化が非常に重要となる。
By the way, in order to achieve high-density recording in this thin film magnetic head, it is required to reduce the current by narrowing the track, narrowing the gap, and using multi-turns (multiple turns). In addition, in multi-track magnetic heads, in order to reduce the arrangement space of conductor coils, and in -track magnetic heads, in order to reduce the current due to the above-mentioned multi-turn structure, a lower magnetic core and an upper magnetic core made of a soft magnetic thin film are used, respectively. It is preferable to laminate a plurality of colored conductor coils between the cores to form a multilayer conductor coil shape. When such a multilayer coil shape is adopted, it is very important to flatten the level difference caused by the conductor coil.

すなわち、下層のコイルにより生じる段差の平坦化が充
分でなければ、上筋の微細コイルのパターン精度の劣化
、上部磁気コアの透磁率、飽和磁東密度、抗磁力等の磁
気特性の劣化等の問題が生じる。そして、今後更にコイ
ルの微細化、高集積化が進むにつれて薄膜磁気ヘッド特
性に及ぼす平坦化の影響が大きくなるものと思われる。
In other words, if the level difference caused by the lower layer coil is not sufficiently flattened, the pattern accuracy of the upper fine coil may deteriorate, and the magnetic properties such as magnetic permeability, saturation magnetic east density, and coercive force of the upper magnetic core may deteriorate. A problem arises. In the future, as coils become smaller and more highly integrated, it is thought that the influence of flattening on the characteristics of thin-film magnetic heads will become greater.

ところで、従来平坦化の手法としてリフトオフ法又はポ
リイミド等の何機性絶縁材もしくは塗布型S iOを等
を塗布して平坦化する方法が知られている。それらの中
で塗布型Sin、を塗布する方法は手軽であり、かつ若
干の有機性を含んでいるが本質的に無機質であるから安
定性が高く、しかもプラズマエッヂング等のドライプロ
セスを利用できるという利点があって、非常に有用な手
法である。
Incidentally, as a conventional planarization method, a lift-off method or a method of applying a multifunctional insulating material such as polyimide or a coating type SiO, etc. for planarization is known. Among them, coating type Sin is easy to apply, and although it contains some organic properties, it is essentially inorganic, so it is highly stable, and it is said that dry processes such as plasma etching can be used. This is a very useful method with many advantages.

第4図及び第5図に平坦化用に塗布型S i Otを用
いた従来の2層6ターンの薄膜磁気ヘッドを示す。第4
図は2層目コイルを取り除いて示す1ff1月3ターン
の導電体コイル部の概略平面図であり、第5図は第4図
の■−■線に沿う概略拡大断面図である。両図において
、■は基板であり、該基板1上に下部磁気コア2及び絶
縁膜3を介して1層目の薄膜状導電体コイル4が形成さ
れ、この導電体コイル4上に絶縁膜5が形成されるとと
もに、絶縁膜5上に平坦化用のSin、膜6が塗布され
ている。更に塗布型5iOtnlAG上に、1層目と同
禄に、2層目導電体コイル7、絶縁膜8、平坦化用塗布
型5ift膜9が設けられ、その後該S!01膜9上に
図示しない上部磁気コアが形成される。
FIGS. 4 and 5 show a conventional two-layer, six-turn thin film magnetic head using coated SiOt for planarization. Fourth
The figure is a schematic plan view of the 1FF 1/3 turn conductor coil portion shown with the second layer coil removed, and FIG. 5 is a schematic enlarged sectional view taken along the line ■-■ in FIG. 4. In both figures, ■ is a substrate, on which a first layer of thin film conductive coil 4 is formed via a lower magnetic core 2 and an insulating film 3, and on this conductive coil 4 an insulating film 5 is formed. is formed, and a planarizing Si film 6 is coated on the insulating film 5. Further, on the coating type 5iOtnlAG, a second layer conductor coil 7, an insulating film 8, and a coating type 5ift film 9 for planarization are provided in the same manner as the first layer, and then the S! An upper magnetic core (not shown) is formed on the 01 film 9.

ところで、図示の磁気ヘッドにおいて、第5図中に矢印
b1、b、で示す2層目導電体コイル7の内周部及び外
周部では、15目導電体コイル4と2層目導電体コイル
7のパターンがほぼ重なっているため、1層目塗布型S
tO!である程度緩和されているものの、コイル4とコ
イル7の2層分の厚み分の段差が生じることになと。こ
のためこの部位で2層目塗布型5iOx9が広範囲に渡
り、かつ厚X塗布されてしまう。従って、焼成時の体積
収縮又は他の膜から及ぼされる引張り荷重に対する応力
等により2層目SiO2膜9にクラックが発生しやすい
状況が生じている。このようなりラックは薄膜磁気ヘッ
ドの安定性、信頼性龜悪影響を与える。
By the way, in the illustrated magnetic head, the 15th conductor coil 4 and the second layer conductor coil 7 are located at the inner and outer circumferential portions of the second layer conductor coil 7 indicated by arrows b1 and b in FIG. Since the patterns of are almost overlapping, 1st layer coating type S
tO! Although this has been alleviated to some extent, there will still be a difference in thickness equal to the thickness of the two layers of coil 4 and coil 7. Therefore, the second coating type 5iOx9 is applied over a wide area and in a thickness of X at this location. Therefore, a situation has arisen in which cracks are likely to occur in the second layer SiO2 film 9 due to volume shrinkage during firing or stress due to a tensile load applied from other films. Such a rack adversely affects the stability and reliability of the thin film magnetic head.

なお、クラックの発生頻度低減のため塗布型Sio2に
有機成分を含有させる方法が知られているが、有機成分
が多くなれば絶縁膜8に対する5iOt膜9の付看力の
低下を招き、又構造安定性にb問題が生じるので、必ず
しも有用な方法とはいえない。
In order to reduce the frequency of cracks, a method is known in which the coating type SIO 2 contains an organic component, but if the organic component increases, the adhering force of the 5iOt film 9 to the insulating film 8 will decrease, and the structure This is not necessarily a useful method because it causes problems with stability.

(問題点を解決するための手段) 本発明は上述の不具合を解消するためになされたもので
あって、具体的には、最上層以外の各層の導電体コイル
の内周部及び/又は外周部にダミーコイルを形成して当
該部位における上記塗布膜の膜厚を低減させたことを特
徴としている。
(Means for Solving the Problems) The present invention has been made to solve the above-mentioned problems, and specifically, the present invention is directed to the inner circumference and/or outer circumference of the conductor coil in each layer other than the top layer. The present invention is characterized in that a dummy coil is formed in a portion to reduce the thickness of the coating film in that portion.

なお、導電体コイルを3層以上とする場合、上記ダミー
コイルを最上層以外の各層に設け、かつ該ダミーコイル
を下層におけるほどコイルから1玉方向へ離れた位置ま
で延長させることが好ましい。
In addition, when the conductor coil has three or more layers, it is preferable that the dummy coil is provided in each layer other than the top layer, and that the dummy coil is extended to a position further away from the coil in the direction of one ball in the lower layer.

(実施例) 次に、添付図面を参照しながら本発明を詳細に云MIl
n明−ス、 第1図〜第3図に従来の導電体コイルに本発明のダミー
コイルを付加した!トラック薄膜磁気ヘッドを示す。以
下、この磁気ヘッドの構造及び製法を述べる。 耐摩耗
性に優れたアルミナ、フェライト、ガラス等の基板ll
上にFe−Al−5LN i −re又はCo系アモル
ファス等の軟磁性薄膜をスパッタリング法、電子ビーム
蒸着法等により積層して下部磁気コア12を形成する。
(Example) Next, the present invention will be described in detail with reference to the accompanying drawings.
In Figures 1 to 3, the dummy coil of the present invention is added to the conventional conductor coil! A track thin film magnetic head is shown. The structure and manufacturing method of this magnetic head will be described below. Substrates made of alumina, ferrite, glass, etc. with excellent wear resistance
A soft magnetic thin film such as Fe-Al-5LN i -re or Co-based amorphous is laminated thereon by sputtering, electron beam evaporation, or the like to form the lower magnetic core 12 .

次に、プラズマCVD(Che−mical  Vap
or  Deposition)法、スパッタリング法
、電子ビーム蒸着法等によりSi0..5LN4、Al
to、等からなる絶縁膜13を形成する。更に、Cu、
Al5Au、Δg等の導電体膜をスパッタリング法、蒸
着法、メッキ法等により積層し、引続きイオンミリング
法、スバツタエッヂング法等により上記導電体膜を所定
形状に加工してIff目3ターンの薄膜状導電体コイル
14を形成する。又、これと同時に導電体コイル■4と
同−材料及び同一製法によりダミーコイル14a〜14
eを形成する。
Next, plasma CVD (Chemical Vap
or deposition) method, sputtering method, electron beam evaporation method, etc. .. 5LN4, Al
An insulating film 13 made of, for example, to is formed. Furthermore, Cu,
A conductive film of Al5Au, Δg, etc. is laminated by sputtering, vapor deposition, plating, etc., and then the conductive film is processed into a predetermined shape by ion milling, sputter etching, etc. to form a thin film with 3 turns of Iff. A shaped conductor coil 14 is formed. At the same time, dummy coils 14a to 14 are made of the same material and manufacturing method as the conductor coil 4.
form e.

次に、プラズマCVD法、スパッタリング法、電子ビー
ム蒸着法等により上記導電体コイル14及びダミーコイ
ル14a=I’le上に5ift、AItol、Si、
N4等からなる絶縁膜!7を形成する。
Next, 5ift, AItol, Si,
Insulating film made of N4 etc.! form 7.

更に該絶縁膜17上に塗布型5iOyを塗布して1層目
の平坦化用5iOz膜18を形成し、導電体コイル14
及び各ダミーコイル14a〜14eの上面と基板11間
の段差を吸収する。その場合塗布型5iOt膜1Bの平
坦部18aは、導電体コイル■4の内周及び外周からダ
ミーコイル14a=14eに沿って延長される。
Further, a coating type 5iOy is applied on the insulating film 17 to form a first layer of 5iOz film 18 for flattening, and the conductor coil 14 is coated with a coating type 5iOy.
Also, the difference in level between the upper surface of each dummy coil 14a to 14e and the substrate 11 is absorbed. In this case, the flat portion 18a of the coating type 5iOt film 1B is extended from the inner and outer peripheries of the conductor coil 4 along the dummy coils 14a=14e.

以下、Ie目と同様の手順で上記1層目5iOt膜■8
上に順次2層目3ターンの薄膜状導電体コイル19、絶
縁膜20.2層目の平坦化用5iOzEt21を設ける
。その後フロントギャップ部15の5iOz膜21がプ
ラズマエッヂフグ法、反応性イオンエツチング法等によ
りエツチングされ、磁気ギャップ層22を積層後、バッ
クコア接続部の絶縁層がエツチングされる。そして軟磁
性薄膜製の上部磁気コア23を形成するというような工
程が続く。
Hereinafter, the above first layer 5iOt film 8
A second layer of three-turn thin film conductor coil 19, an insulating film 20, and a second layer of 5iOzEt 21 for planarization are sequentially provided on top. Thereafter, the 5iOz film 21 of the front gap portion 15 is etched by a plasma edging method, a reactive ion etching method, etc., and after the magnetic gap layer 22 is laminated, the insulating layer of the back core connection portion is etched. Then, the process of forming the upper magnetic core 23 made of a soft magnetic thin film continues.

上記製造工程において、1色目Sin、膜18の平坦部
18aがダミーコイル14a〜14cに沿って径方向に
延長されることにより、2層目導電体コイル1つの内周
部及び外周部における導電体コイル19の上面と1層目
Sin、膜18間の段差が減少する。従って、例えば第
2図中に矢印b3で示す如く、導電体コイル19の内周
部及び外周部において、2層目5io2膜2Iの膜厚を
従来(第5図の矢印す8部参照)より薄くして導電体コ
イル19と1層目Sin、膜18間の段差を緩やかに平
坦化することができる。このように、導電体コイル14
の内周部及び外周部における2層目5iOy膜21の膜
厚を低減させることができるので、焼成時における当該
部位のクラックを減少させることが可能になる。
In the above manufacturing process, by extending the flat portion 18a of the first color film 18 in the radial direction along the dummy coils 14a to 14c, the conductor at the inner and outer circumferential portions of one second layer conductor coil is The level difference between the upper surface of the coil 19 and the first layer Sin and the film 18 is reduced. Therefore, as shown by arrow b3 in FIG. 2, for example, the thickness of the second layer 5io2 film 2I at the inner and outer circumferential portions of the conductor coil 19 is made smaller than the conventional thickness (see arrow 8 in FIG. 5). By making it thinner, the difference in level between the conductive coil 19, the first layer of Sin, and the film 18 can be gently flattened. In this way, the conductor coil 14
Since it is possible to reduce the thickness of the second layer 5iOy film 21 at the inner and outer peripheral portions, it is possible to reduce cracks in these portions during firing.

なお、導電体コイルI4の内周部及び外同部における2
層目5iOJ21のv1厚を薄くするため、スペース的
に余裕がある場合はダミーコイルの幅寸法をできるだけ
大きくするこ浜が好ましい。そして例えば外周左側部の
ダミーコイル14bのように全体として幅寸法を大きく
する場合、その中央にギャップ14rを設ければ、金F
Ii(ダミーコイル14b)−絶縁物(絶縁膜13)間
の接合面積を小さく、絶縁物(絶縁膜17)−絶縁物(
絶縁膜13)間の接合面積を大きくすることができるの
で、付若力の点で有利になる。又フロントギャップ部1
5及びバックコア接続部16(第3図参照)近傍におけ
るダミーコイル14c及び14aは例えば1〜5μm程
度にその線幅を小さくすることにより、磁路長をあまり
長くせずに、かつ本発明の効果も得られるようになる。
In addition, 2 in the inner peripheral part and the outer peripheral part of the conductor coil I4
In order to reduce the v1 thickness of layer 5iOJ21, it is preferable to make the width of the dummy coil as large as possible if there is space available. For example, when the width dimension is increased as a whole like the dummy coil 14b on the left side of the outer periphery, if a gap 14r is provided in the center, the gold F
The bonding area between Ii (dummy coil 14b) and the insulator (insulating film 13) is made small, and the bonding area between the insulator (insulating film 17) and the insulator (
Since the bonding area between the insulating films 13) can be increased, this is advantageous in terms of rejuvenation strength. Also, front gap part 1
By reducing the line width of the dummy coils 14c and 14a in the vicinity of the 5 and back core connection portions 16 (see FIG. 3) to, for example, about 1 to 5 μm, the magnetic path length can be prevented from becoming too long and the present invention can be achieved. You will also be able to get better results.

(発明の効果) 以上説明したように、本発明では、最上層以外の導電体
コイルの内周部及び/又は外周部にダミーコイルを形成
したので、当該部位における段差を減少させることがで
き、それにより当該部位における平坦化用塗布膜の膜厚
を低減させることが可能になる。
(Effects of the Invention) As explained above, in the present invention, since the dummy coil is formed at the inner circumference and/or outer circumference of the conductive coil other than the top layer, it is possible to reduce the level difference in the part, Thereby, it becomes possible to reduce the thickness of the planarization coating film in the region.

又、導電体コイルを3層以上とする場合、ダミーコイル
を最上層以外の各層に設けるとともに下色におけるほど
導電体コイルから径方向に離れた位置まで延長させるよ
うにすれば、隣接する各層間で上述の効果を得ることが
できる。
In addition, when the conductor coil has three or more layers, a dummy coil is provided in each layer other than the top layer, and if it is extended to a position further away from the conductor coil in the radial direction as the bottom color approaches, it is possible to reduce the distance between adjacent layers. The above effect can be obtained.

又多トラツク素子の場合でも同様に導電体コイル2層分
以上の厚みの段差が生じる箇所にダミーコイルを設置す
ることにより同様の効果を得ることができる。
Also, in the case of a multi-track element, the same effect can be obtained by installing a dummy coil at a location where a difference in thickness equal to or more than two conductor coil layers occurs.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例に係る薄膜磁気ヘッドおける1
層目導電体コイルの平面図、 第2図及び第3図はそれぞれ第1図の■−■線及び■−
■線に沿う拡大断面部分図、 第4図は従来の薄膜磁気ヘッドにおける1層目導電体コ
イルの平面図、 第5図は第4図の■−■線に沿う拡大断面部分図である
。 12.17・・・導電体コイル、 14 a−14e・−ダミーコイル、 18.2I・・・平坦化用塗布型5iOz膜。 第1図 第2図 第3図 第4図
FIG. 1 shows a thin film magnetic head according to an embodiment of the present invention.
The plan view of the layered conductor coil, Figures 2 and 3 are the lines ■-■ and ■- in Figure 1, respectively.
FIG. 4 is a plan view of the first-layer conductor coil in a conventional thin film magnetic head; FIG. 5 is an enlarged partial cross-sectional view taken along line 1--2 in FIG. 4; 12.17...Conductor coil, 14 a-14e--dummy coil, 18.2I...Coating type 5iOz film for planarization. Figure 1 Figure 2 Figure 3 Figure 4

Claims (2)

【特許請求の範囲】[Claims] (1)軟磁性薄膜製の上部磁気コアと下部磁気コア間に
平坦化用塗布膜を介して複数層の導電体コイルを積層し
てなる薄膜磁気ヘッドにおいて、最上層以外の各層のコ
イルの内周部及び/又は外周部にダミーコイルを形成し
て当該部位における上記塗布膜の膜厚を低減させたこと
を特徴とする薄膜磁気ヘッド。
(1) In a thin film magnetic head in which multiple layers of conductive coils are stacked with a flattening coating film interposed between an upper magnetic core and a lower magnetic core made of soft magnetic thin film, the inside of the coils in each layer other than the top layer is A thin-film magnetic head characterized in that a dummy coil is formed on a peripheral portion and/or an outer peripheral portion to reduce the thickness of the coating film in that portion.
(2)導電体コイルを3層以上とする場合において、上
記ダミーコイルを最上層以外の各層に設け、かつ該ダミ
ーコイルを下層におけるほどコイルから径方向へ離れた
位置まで延長させた特許請求の範囲第1項に記載の薄膜
磁気ヘッド。
(2) In a case where the conductor coil has three or more layers, the dummy coil is provided in each layer other than the top layer, and the dummy coil is extended to a position further away from the coil in the radial direction as the layer becomes lower. The thin film magnetic head according to the first item.
JP61007739A 1986-01-16 1986-01-16 Thin film magnetic head Expired - Fee Related JP2628854B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61007739A JP2628854B2 (en) 1986-01-16 1986-01-16 Thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61007739A JP2628854B2 (en) 1986-01-16 1986-01-16 Thin film magnetic head

Publications (2)

Publication Number Publication Date
JPS62165718A true JPS62165718A (en) 1987-07-22
JP2628854B2 JP2628854B2 (en) 1997-07-09

Family

ID=11674068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61007739A Expired - Fee Related JP2628854B2 (en) 1986-01-16 1986-01-16 Thin film magnetic head

Country Status (1)

Country Link
JP (1) JP2628854B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9153257B1 (en) 2014-09-25 2015-10-06 Seagate Technology Llc Write head having reduced dimensions
US9159340B1 (en) * 2014-08-28 2015-10-13 Seagate Technology Llc Coil structure for write head
US9230570B1 (en) * 2014-08-28 2016-01-05 Seagate Technology Llc Write head having two yokes
US9286918B1 (en) 2014-08-28 2016-03-15 Seagate Technology Llc Write head with coil structure aligned with yoke

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6134616U (en) * 1984-07-31 1986-03-03 ソニー株式会社 thin film head
JPS61132512U (en) * 1985-02-05 1986-08-19

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6134616U (en) * 1984-07-31 1986-03-03 ソニー株式会社 thin film head
JPS61132512U (en) * 1985-02-05 1986-08-19

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9159340B1 (en) * 2014-08-28 2015-10-13 Seagate Technology Llc Coil structure for write head
US9230570B1 (en) * 2014-08-28 2016-01-05 Seagate Technology Llc Write head having two yokes
US9286918B1 (en) 2014-08-28 2016-03-15 Seagate Technology Llc Write head with coil structure aligned with yoke
US9153257B1 (en) 2014-09-25 2015-10-06 Seagate Technology Llc Write head having reduced dimensions

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