JPS62163784U - - Google Patents
Info
- Publication number
- JPS62163784U JPS62163784U JP5239586U JP5239586U JPS62163784U JP S62163784 U JPS62163784 U JP S62163784U JP 5239586 U JP5239586 U JP 5239586U JP 5239586 U JP5239586 U JP 5239586U JP S62163784 U JPS62163784 U JP S62163784U
- Authority
- JP
- Japan
- Prior art keywords
- measurement chamber
- liquid nitrogen
- radiation
- measurement
- purge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 5
- 230000005855 radiation Effects 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 3
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- 239000007789 gas Substances 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000010926 purge Methods 0.000 claims 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
Description
第1図は本考案の一実施例を示す断面図、第2
図は本考案の他の実施例を示す断面図である。
2……測定室、3……半導体放射線検出器、L
N……液体窒素、G……気化ガス(窒素ガス)。
Fig. 1 is a sectional view showing one embodiment of the present invention;
The figure is a sectional view showing another embodiment of the present invention. 2...Measurement room, 3...Semiconductor radiation detector, L
N...liquid nitrogen, G...vaporized gas (nitrogen gas).
Claims (1)
素で冷却するようにした放射線計測装置において
、前記液体窒素の気化ガスを前記測定室内に導入
して、該測定室内をパージするようにしたことを
特徴とする放射線計測装置。 A radiation measurement device in which a semiconductor radiation detector provided in a measurement chamber is cooled with liquid nitrogen, characterized in that vaporized gas of the liquid nitrogen is introduced into the measurement chamber to purge the measurement chamber. Radiation measuring device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5239586U JPS62163784U (en) | 1986-04-08 | 1986-04-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5239586U JPS62163784U (en) | 1986-04-08 | 1986-04-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62163784U true JPS62163784U (en) | 1987-10-17 |
Family
ID=30877530
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5239586U Pending JPS62163784U (en) | 1986-04-08 | 1986-04-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62163784U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100979558B1 (en) * | 2009-12-31 | 2010-09-01 | (주)성우이앤티 | Using the net weight change of liquid nitrogen, an algorithm and calibration method for real time display of liquid nitrogen level in dewar |
-
1986
- 1986-04-08 JP JP5239586U patent/JPS62163784U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100979558B1 (en) * | 2009-12-31 | 2010-09-01 | (주)성우이앤티 | Using the net weight change of liquid nitrogen, an algorithm and calibration method for real time display of liquid nitrogen level in dewar |