JPS62152276U - - Google Patents
Info
- Publication number
- JPS62152276U JPS62152276U JP4051986U JP4051986U JPS62152276U JP S62152276 U JPS62152276 U JP S62152276U JP 4051986 U JP4051986 U JP 4051986U JP 4051986 U JP4051986 U JP 4051986U JP S62152276 U JPS62152276 U JP S62152276U
- Authority
- JP
- Japan
- Prior art keywords
- connection point
- anode
- cathode connection
- power supply
- supply terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4051986U JPH0442781Y2 (enExample) | 1986-03-19 | 1986-03-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4051986U JPH0442781Y2 (enExample) | 1986-03-19 | 1986-03-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62152276U true JPS62152276U (enExample) | 1987-09-26 |
| JPH0442781Y2 JPH0442781Y2 (enExample) | 1992-10-09 |
Family
ID=30854678
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4051986U Expired JPH0442781Y2 (enExample) | 1986-03-19 | 1986-03-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0442781Y2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012013446A (ja) * | 2010-06-29 | 2012-01-19 | Advantest Corp | ピンエレクトロニクス回路およびそれを用いた試験装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4177759B2 (ja) * | 2001-07-17 | 2008-11-05 | 株式会社アドバンテスト | 入出力回路、及び試験装置 |
-
1986
- 1986-03-19 JP JP4051986U patent/JPH0442781Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012013446A (ja) * | 2010-06-29 | 2012-01-19 | Advantest Corp | ピンエレクトロニクス回路およびそれを用いた試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0442781Y2 (enExample) | 1992-10-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5917899B2 (ja) | 半導体スイッチ | |
| US6833722B2 (en) | Electronic circuit device with a short circuit switch using transistors and method of testing such a device | |
| JPS62152276U (enExample) | ||
| KR890000953A (ko) | 집적 회로 | |
| US5276355A (en) | Change-over circuit for tester implemented by using diode-bridge type analog switches | |
| JPS616775U (ja) | 電流−電圧変換回路 | |
| KR840007325A (ko) | 스위치 회로 | |
| JPH0661962A (ja) | 半導体フライングキャパシタ・マルチプレクサ | |
| SU1690119A1 (ru) | Устройство дл управлени транзистором со статической индукцией | |
| JPH0328480U (enExample) | ||
| JPH039524U (enExample) | ||
| JPH0159880U (enExample) | ||
| SU1398741A1 (ru) | Ключевое устройство | |
| JPH0218710Y2 (enExample) | ||
| JPH03130569U (enExample) | ||
| JPS57211076A (en) | Semiconductor integrated circuit device | |
| JPH0164988U (enExample) | ||
| JPS6214866U (enExample) | ||
| JPS6437346U (enExample) | ||
| JPH0349700U (enExample) | ||
| JPS5987681U (ja) | 電気部品の試験装置 | |
| JPS59127174U (ja) | キヤパシタンス測定回路 | |
| JPS6041046U (ja) | Icチツプ動作テスト用治具 | |
| JPH0239179U (enExample) | ||
| JPS6257470U (enExample) |