JPS62144078A - Lattice converter - Google Patents

Abstract

PURPOSE:To enable the mounting of a lattice converter on not only an upward prober board but also an downward prober board while facilitating the attaching or detacthing thereof as assembled, by providing a relay pin with an anti-slip projection so as to be positioned between the second and third substrates. CONSTITUTION:A first 12 substrate having a pin hole 12A formed at a normal lattice point is connected with the second and third substrates 14 and 16 having pin holes 14A and 16A formed at the positions corresponding to a test point of a circuit board 22 to be tested with a coupling shaft 26 and a spacers 28, 30 and 32. Relay pins 40 piercing pin holes corresponding to the substrates 12, 14 and 16 are provided each with an anti-slip collar 42 so as to be positioned between the substrates 14 and 16, which allows this converter to be used by mounting a downward prober board 18. The circuit board 22 being tested is pushed from under to bring the test point thereof into contact with the lower end of the corresponding relay pin 40 and the upper end of the relay point 40 is connected to a prober board in contact with a probe pin (spring pin) 20.

Description

[Detailed Description of the Invention] [Field of Application of Industry 1] The present invention provides a circuit board testing device that performs continuity tests, insulation tests, etc. of circuit boards. 11: A deviated test point relates to a grid converter that is interposed between the circuit board and the prober board in order to make contact with the probe pins arranged at the standard point.

[Prior art] In board testing equipment that performs continuity tests, insulation tests, etc. of circuit boards, the number of circuit boards to be tested is pressed onto a blower board, and the test points (through holes, etc.) of the circuit board are implanted on the blower board. Make contact with the installed probe pin. Then, a specific probe pin is selected on the board testing device side, and continuity or insulation between test points on the circuit board that are in contact with the probe pin 6tK is checked.

There are two types of board testing equipment: one type that presses the circuit board from the 1- side onto the 1- oriented prober board, and the 9 type 9 type that presses the circuit board from the 1- side onto the 1- oriented prober board. There is.

Regardless of the type of board test equipment, the probe pins on the Bulova board are 11.
They are planted regularly in a square grid with a pitch of mm.

On the other hand, through-holes that serve as test points for printed circuit boards are generally referred to as 11: standard points, but test points (off-grid test points) that are off the +Ej3Jffi I' point are It is not uncommon for this to occur.

When testing a circuit board that includes such off-grid test points, if you press the circuit board directly against the blower board, the probe pins will not come into contact with the off-grid test points. The relevant test is incompetent.

To enable testing on such off-grid test points, a grid conversion stage for contacting the off-grid test points with the corresponding probe pins (located at the Ichikawa grid points) is installed on the circuit board. Is it necessary to interpose it between it and the Bulova board?

Regarding the Bulova board or 1-direction board test equipment,
Grating transformers for such lattice transformation are known in the art. This is 11: the first pin hole formed at the standard point.
(The plate is fixed facing the Bulova board, and a second board is fixed at a certain distance from the It force, and it has pin holes () corresponding to the test points of the circuit board to be tested) (including off-grid and rad ones), pass a somewhat visible relay pin through the corresponding pin hole of the first and second substrates from one side, and connect the end to the corresponding probe pin. This is a structure in which they are in contact with each other.1 of each relay pin
~.

Test points on the circuit board contact the ends, and each test point is connected to a probe pin via a relay pin.

On the other hand, since the Bulova board is oriented in a horizontal direction, no grating converter has been developed for use in board testing equipment.

[Problem to be solved] The conventional grating converter has the following problems.

First, conventional grating converters cannot be used in board testing equipment where the blower board is oriented in a horizontal direction. This is because the relay pin is not supported by the probe pin, and therefore falls off due to its own weight. Board testing apparatuses in which the prober board is oriented in the horizontal direction have the advantage of being less affected by dust, and are becoming more common, so it is extremely inconvenient that they cannot be mounted on such a prober board in the horizontal direction.

In addition, since the relay pin has a structure that easily falls off,
It is difficult to preface the Bulova board in this state.

Therefore, it is necessary to perform 11 repair operations such as assembly work such as inserting the relay pin and replacing the relay pin while it is attached to the blower board, which is not easy.

Such a grating transducer can be used by users of board test equipment (11
Second), (the board is created and assembled according to the circuit board to be tested), and it is often necessary to replace the circuit board to be tested. , as mentioned above, it is troublesome to set 17., etc., and it is difficult to get out of 71 in the set \r state, which is extremely inconvenient in practical use.

[Objective of the Invention] Therefore, an object of the present invention is that it can be mounted on a Bulova board that is oriented toward the camera, that it can be easily installed in the assembled state, and that it can be assembled and repaired efficiently when it is not installed. The object of the present invention is to provide a grating/transducer that solves the conventional problems, such as being able to perform

[Means for Solving the Problems] In order to achieve this goal, a grating transducer according to the present invention comprises: 11: a first substrate in which pin holes are formed at the standard points; means for coupling second and third boards having pin holes formed at positions corresponding to test points on the circuit board, and an eleventh second and third board facing each other in that order with an interval; It consists of relay pins that are passed through the corresponding pin holes of the first, second and third boards, and each of the relay pins is provided with a protrusion 11. to prevent it from falling off. The portion is configured to be located between the second and third substrates.

[Since the protrusion of the working relay pin is retained in shape by one of the two substrates, it will not fall off even if it does not come into contact with the probe pin of the blower board. Therefore, this lattice converter can be used by being attached to a blooper board facing 1 and 2, as well as a blooper board facing 1 and 2.

Further, since the relay pins do not fall off, this grid/converter can be easily attached to and detached from the blower board in the set-χ state. Furthermore, since the set 1''1. or repair can be performed once removed from the prober board, the set \r or repair is much easier than in the past.

[See example code and drawings! ! ((L) An embodiment of this invention will be described.

FIG. 1 is a schematic cross-sectional front view showing an embodiment of a grating converter according to the present invention, with parts omitted. This lattice converter 10
has three square-shaped substrates 12, 14, and 16. Since this grating converter 10 is mounted on the prober board 18 of the board inspection device facing the C direction (although it may also be the L direction) as shown in FIG. One piece of standard (-, generally 2.
A pin hole 12A is formed at one point of a rectangular grid with a pitch of 54 mm.

Although only two pin holes 12A are shown in the figure, a large number are provided corresponding to the probe pins.

The case γ converter 10 also includes a circuit board 2 to be tested.
2 is pressed as shown, so that the substrate 14.16
has pin holes 1 at positions corresponding to each test point (including off-grid test points) on the circuit board 22.
4A and 18A are formed. However, each pin hole 14
Only two A and 16A are shown in the figure.

24 is a frame for attaching the lattice conversion lattice 10 to the blower board 18. This frame body 24 and each board 12,1
A connecting shaft 26 passes through each corner hole of 4.16, and a spacer 28° 30.32 is inserted into this connecting shaft 26 as shown. Nuts 34.36 are then screwed into threads at both ends of the coupling shaft 26 protruding from the substrate 12.16, and the substrates 12, 14.18 and frame 24 are coupled as shown.

The spacers 28, 32 are cylindrical bodies, and cannot be removed from the coupling shaft 26 in the illustrated assembly \°L state, but the spacers 30 can be removed or attached.

FIG. 2 is an end view of the spacer 30 when cut along the line ■-■. As shown in this figure, spacer 30
consists of two symmetrical members 30A and 30B, and cylindrical surface shapes 30C and 301) are formed on the inner surfaces of the members 30A and 30B to form a hole through which the coupling shaft 26 passes. . This spacer 30 includes members 30A, 30
B can be fixed to the coupling shaft 26 by applying it from the side to the coupling shaft 26 and tightening it with the screw 38.

Conversely, the spacer 30 can be removed from the coupling shaft 26 by loosening the screw 38.

Now, in FIG. 1, 40 is a relay pin, and as shown in the figure, the corresponding pin holes 12A, 1 of the substrates 12, 14, 18
4A and 18A are made to pass through IT.

In the middle of the relay pin 40, there is a collar (fall prevention 1
1. A protrusion 42 is measured and positioned between adjacent substrates 14, 18.

FIG. 3 is an enlarged schematic front view of the relay pin 40 with the section broken away. As shown in this figure, a conical recess 44 is formed at one end of the relay pin 40 in order to improve contact with the conical tip of the probe bottle 20, and a hole 46 is formed at the bottom of the conical recess 44. is formed. With such a structure, the contact area between the tip of the probe pin 20 and the bottom M of the four conical parts 44 can be increased, thereby reducing contact resistance.

A circular hook-shaped portion 48 is formed at the end of the relay pin 40 in order to achieve good contact with a test point (through hole, etc.) on the circuit board 22.

1. The lattice converter 10 described above can be used by being attached to the blower board 18 facing C in the +I', s''1. position as shown in FIG.
- A probe pin (spring pin) 20 contacts the end. The circuit board 22 to be tested is pressed from the side, the test point contacts the do end of the corresponding relay pin 40, and the test point contacts the corresponding probe pin 2 via the relay pin 40.
Connected to 0.

The off-grid test point of the circuit board 221- is
The position at the IE standard point is complemented by the relay pin 40,
(lattice converted) and connected to the corresponding probe pin 20 located at the city standard-r point. therefore,
Continuity tests, insulation tests, etc. related to off-grid building test points are covered by i-+J functions.

Now, when this lattice converter 10 is in the group\y state (the state shown in FIG. 1), the collar 42 of the relay pin 40 is attached to the substrate 14 or Since the relay pins 40 are retained in shape by the substrate 16, they do not fall off. Therefore, this grating converter 10 can be assembled outside the board testing equipment, and
In the γ state, it can be attached to or removed from the prober board 18 oriented in the direction γ or the prober board 18 oriented in the direction 1.

As mentioned above, this lattice converter 10 can be assembled or repaired without being installed, which alone makes assembly and repair work easier than with conventional lattice converters. However, in this embodiment, the structure is made by one person in order to further facilitate assembly and repair. To clarify this, the set\daily order of this grid converter IO will be explained below.

First, (plate 14, spacer 32, and spacer 3
Place the set Iy except for 0 upside down on the workbench. Then, hold the relay pin 40 upside down, and
Insert the relay pins 40 into the corresponding pin holes 12A and 14B.

Here, in the group 1'1 state, the positional deviation between the pin holes 14A and 16A corresponding to the off-grid test points and the corresponding pin hole 12A is absorbed by only jA of the relay pin 40. However, it is necessary to increase the distance between the substrates 12 and 14 to some extent. However, pin hole 12
A, when inserting the relay pin 40 into 14A, the board 12.1
If the interval between pins 4 and 4 is large, it is easy to insert the relay pin 40 incorrectly.

Therefore, in this embodiment, the spacer 3o is removed to make the distance between the boards 12A and 14A sufficiently small, thereby facilitating the insertion of the relay pin 40.

However, if the distance between the boards 12 and 14 is too small, the relay pin 40 cannot be inserted through the pin hole 14A corresponding to the off-grid test point and the corresponding pin hole 12A, so the spacer 28 It is designed to ensure the necessary spacing by intervening.

Although the insertion work of the relay pin 40 is somewhat troublesome, it is also possible to use a long spacer that cannot be removed in place of the spacer 30.28.

After completing the insertion work of the relay pin 40, the spacer 32 is inserted into the coupling shaft 26, and then the corresponding relay pin 40 is inserted into the pin hole 16A of the board 16.

At this time, the tip of the medium pin 40 is connected to the pin hole 16A of the board 16.
Its insertion is easy since it is positioned fairly accurately.

After completing the insertion work, screw the nut 36 into the threaded portion of the coupling shaft 26 that has passed through the corner hole of the board 16,
Tighten the board 16. Now, group\1. is perfect r.

1-1 - Although the embodiments have been described, the present invention is not limited thereto (and can be implemented with appropriate modifications).

Furthermore, the grating/transducer of the present invention can also be applied to similar grating/transforming applications other than board testing equipment.

[Effects of the Invention] As described in 1-1 above, according to the present invention, the lattice converter connects the first board in which the pin holes are formed at the grid points and the test points of the circuit board to be tested. second and third substrates with pin holes formed in corresponding positions;
and a third board connected in that order by facing each other at intervals, and a relay pin that is passed through corresponding pin holes of the first, second, and third boards, and the relay pin Each is provided with a protrusion for preventing it from falling off 11-, and since this protrusion is positioned between the second and third boards, it goes without saying that the Bulova board is oriented in the 1- direction. It can be used by being attached to a Bulova board facing the Bulova board, and it can be easily attached to and removed from the Bulova board in the Group-1 state, and furthermore, it can be easily assembled or repaired when removed from the Bulova board. It is possible to realize a lattice converter that solves the problems of conventional lattice converters.

[Brief explanation of drawings]

Fig. 1 is a schematic cross-sectional view of one embodiment of a lattice converter according to the present invention, with the lattice omitted. Figure 3 is an enlarged schematic front view with a part of the relay pin cut away.
12A, 14A, 18A...Pin hole, 18...Bulova board, 20...Probe pin, 22...41
At should circuit board, 26... coupling axis, 28, 30.3
2...Spacer, 40...Relay pin, 42...Collar for fall prevention 11-.

Claims (1)

[Claims] (1) a first substrate in which pin holes are formed at regular lattice points;
second and third boards having pin holes formed at positions corresponding to test points of the circuit board to be tested;
, comprising means for coupling the second and third substrates facing each other with an interval in that order, and relay pins passed through corresponding pin holes of the first, second and third substrates, A lattice converter characterized in that each of the relay pins is provided with a protrusion for preventing falling off, and the protrusion is positioned between the second and third substrates.