JPS62144080A - Lattice converter - Google Patents

Abstract

PURPOSE:To make two substrates easy to detach when in assembly while facilitating the assembling and repairs, by allowing either of two spacers for connecting two substrates apart from a link shaft with the link shaft piercing the substrates. CONSTITUTION:Spacers 28 and 32 which are cylinders and unable to be removed from a connection shaft 26 as assembled while a spacer 30 can be removed and mounted freely. To assemble this lattice converter 10, first, a substrate 14, the spacer 32 and an assembly except the spacer 30 are placed on a bench upside down. Then, relay pins 40 are inserted into corresponding pin holes 12A and 14A of the substrates 12 and 14. Here when the interval of the substrates 12 and 14 is larger, wrong insertion of the relay pins 40 is liable to take place. But removal of the spacer 30 can reduce the interval between the substrates 12 and 13 so sufficiently to facilitate the insertion of the relay pin 40.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] This invention is a board testing device that performs continuity tests, insulation tests, etc. of circuit boards. In order to make contact with the probe pins arranged at 7 points of the standard,
The present invention relates to a case-r converter that is used by being interposed between the circuit board and the blower board.

[Prior art] In a circuit board testing device that performs continuity tests, insulation tests, etc. of circuit boards, the circuit board to be tested is pressed against the blower board, and the test point (through-hole etc.) to the probe pins installed on the Bulova board.Then, select a specific probe pin on the board test equipment side and check the continuity or insulation between the test point on the circuit board that is in contact with that probe pin. To check.

Such board testing apparatuses include one in which a circuit board is pressed against an upward facing prober board from the 1- side, and another in which a circuit board is pressed against a downward facing prober board from the bottom side.

In any type of board testing device, the probe pins of the blower board are regularly planted at regular grid points (generally 2.54 mm pinch city square f points).

On the other hand, through-holes that serve as test points for printed circuit boards are generally provided at regular grid points, but 11
Test points that deviate from standard Y point (off-grid,
There are many cases where test points) are not convenient.

When testing a circuit board that includes such off-grid test points, if you press the circuit board directly against the blowover board, the probe pins will not come into contact with the off-grid test points. Related tests are not possible.

To enable testing on such off-grid test points, a grid conversion stage is installed between the circuit board and the prober board to bring the off-grid test points into contact with the corresponding probe pins (located at regular grid points). It is necessary to intervene between the two.

For board testing equipment with the blower board facing upwards, grid converters for such grid conversion are known in the art. In this method, a first board with pin holes formed at the real grid points is fixed facing a prober board, and one of the boards is -
・Fix a second board at a certain distance, and insert pin holes (
(including off-grid ones), pass a somewhat flexible relay pin i'r through the corresponding pin hole of the first and second substrates from one side, and connect the lower end of the relay pin to the corresponding probe. It has a structure in which it is in contact with a pin. A test point on the circuit board contacts one end of each relay pin, and each test point is connected to a probe pin via the relay pin.

On the other hand, a grating converter for application to a board testing device for blower boards is not known.

[The problem you are trying to solve] The conventional grating converter has the following problems.

First, conventional rating r-converters cannot be used in board testing equipment where the blower board faces downward. This is because the relay pin is not supported by the probe pin, so it will fall off due to the 1,000 yen. Board testing equipment designed for Bulova boards has the advantage of being less affected by dust, and is becoming more common, so it is extremely inconvenient that it cannot be installed on Bulova boards that are oriented to Bulova boards. .

Further, since the relay pin is structured to easily fall off, it is difficult to attach and detach the relay pin to the blower board in the assembled state. Therefore, it is necessary to perform assembly work such as inserting a relay pin or repair work such as replacing the relay pin while it is attached to the prober board.

Furthermore, since the horizontal positional deviation between the pin hole of the first board and the pin hole of the second board is absorbed by the deflection of the relay pin, it is necessary to make the gap between both boards a certain size. Since the spacing is fixed, it is not easy to properly pass the relay pins through the corresponding pin holes on both boards, and the work is time-consuming.In addition, mistakes in insertion are likely to occur.

Thus, conventional grating transducers are cumbersome to assemble and repair.

Such a lattice converter is created and assembled by the user of the board testing equipment according to the circuit board to be tested on the second board.
It is often necessary to replace it depending on the circuit board to be tested. For this reason, as mentioned above, it is troublesome to make a set, and it is difficult to get out of the blue in a set \y state.
1 is extremely inconvenient.

[Ej Objectives of the Invention Therefore, an object of the present invention is that it can be attached to a Bulova board facing in the direction of C, that it can be easily attached and detached in the set q state, and that it can be attached to the set 1'1. It is an object of the present invention to provide a lattice converter which solves the problems of the conventional art, such as being able to be easily repaired and repaired.

[Means for Solving the Problems] In order to achieve the [21st objective], the grating converter provided by the present invention includes a first substrate in which a pin hole is formed at the normal standard r point, and a test The second and third boards having pin holes formed at positions corresponding to test points on the circuit board to be tested are joined to the first, second and third boards in that order, facing each other with an interval between them. and 11 relay pins passed through corresponding pin holes of the first, second and third boards, and each of the relay pins has 1. A protrusion is provided for the second and third
the means for bonding is positioned between the first and second substrates, the means for bonding being capable of holding only the first and second substrates in a bonded state, and at least the first and second substrates being in a bonded state. The same substrate spacing is made i'i) different in each case.

[Function] Since the protruding portion of the relay pin is retained in shape by either of the two substrates, the relay pin will not fall off even if it is not brought into contact with the probe pin of the blower board. Therefore, this lattice converter can be attached and used not only to the Bulova board facing the "-" direction, but also to the Bulova board facing the "-" direction.

In addition, since the relay pins do not fall off, this lattice converter can be easily attached to and detached from the Bulova board by simply wiping the assembly.
Furthermore, it can be assembled or repaired while being removed from the prober board.

Furthermore, only the first and second substrates can be held in a bonded state, and the distance between the substrates can be varied in this state. Therefore, the relay pins can be easily and reliably inserted into the corresponding pin holes of the inner substrate while only the first and second substrates are coupled at a small interval.

In this manner, the grating transducer can be assembled and repaired in an uninstalled state more easily than conventionally.

[Embodiment] Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic cross-sectional front view showing an embodiment of a grating converter according to the present invention, with parts omitted. This case r converter 1
0 has three rectangular substrates 12, 14, and 16.

Since this grating converter 10 is mounted on the Bulova board 18 as shown in the figure (although it may be in the direction of C or L of the board inspection device), the board 12 has the same IE standard γ and probe pins 20 of the Bulova board 18. Point (-・Generally 2.54m
Pin holes 12A are formed at m-pitch square case Y points).

Although only two pin holes 12A are shown in the figure, a large number are provided corresponding to the probe pins.

In addition, the circuit to be tested is pressed against this case r transformation "&410," (because the board 22 is pressed as shown in the figure), (
Pin holes 14A, 16A are formed in the plates 14, 16 at positions corresponding to each test point (including off-grid test points) on the circuit board 22. Tatashi,
Only two of each pin hole 14A, 16A are shown in the figure.

24 is a frame for attaching the lattice converter r10 to the blower board 18. This frame 24 and each board 12.1
A coupling shaft 26 passes through the hole at each corner of 4 and IF 5, and a spacer 28° 30.32 is inserted into this coupling shaft 26 as shown. Then, nuts 34.38 are screwed into threaded portions at both ends of the coupling shaft 26 protruding from the base plate 12.16, and the base plate 12.14.16 and the frame body 24 are coupled as shown.

The spacers 28 and 32 are cylindrical bodies, and cannot be removed from the coupling shaft 26 in the illustrated group-y state, but the spacers 30 can be removed or attached.

FIG. 2 is an end view of the spacer 30 taken along the line ■-■. As shown in this figure, the spacer 30
is composed of two members 30A and 30B in the shape of a pair (21; cylindrical surface grooves 30C and 3 for forming a hole through which the coupling shaft 26 passes 17 times on the inner surface of the portions 44' 30A and 30B.
0D is formed. This spacer 30 is a member 30
A and 30B can be fixed to the coupling shaft 26 by applying them to the coupling shaft 26 from the sides and tightening them with the screws 38.

Conversely, the spacer 30 can be removed from the coupling shaft 26 by loosening the screw 38.

Here, the coupling axis 26. The spacers 28, 30, 32 and the nuts 34, 3B constitute an L stage that connects the substrates 12, 14, 16. Such a coupling means can hold only the substrates 12.14 in a coupled state, and in this state, the distance between the substrates can be increased by attaching and detaching the spacer 30.
It's obvious that it's weird.

+Ir and in FIG.
, 1 on 14A, 16A! ■I am forced to pass.

Prevents it from falling off in the middle of the middle single pin 40! A collar (drop-off rainproof protrusion) 42 for 1- is provided, and the adjacent substrate 14
．． It is located between 16 and 16.

FIG. 3 is an enlarged schematic front view with a part of the relay pin 40 cut away. As shown in this figure, a conical recess 44 is formed at one end of the relay pin 40 in order to improve contact with the circular button-shaped tip of the probe pin 20, and a hole is formed at the bottom of the conical recess 44. 46 are formed. With such a structure, the contact area between the tip of the probe pin 20 and the bottom of the conical recess 44 can be increased, thereby reducing contact resistance.

A conical L portion 48 is formed at the lower end of the relay pin 40 to achieve good contact with a test point (through hole, etc.) on the circuit board 22.

The lattice converter 10 described below can be used by being mounted on a blower board 18 facing downward in an upright position as shown in FIG. A probe pin (spring pin) 20 contacts one end of the relay pin 40 . The circuit board 22 to be tested is pressed from below, and its test points come into contact with the lower ends of the corresponding relay pins 40 and are connected to the corresponding probe pins 20 via the relay pins 40 .

The off-grid test point for circuit board 22 is
The ilE standard emphasis position is corrected (lattice converted) by the relay pin 40 and connected to the corresponding probe pin 20 arranged at the regular lattice point. Therefore, continuity tests, insulation tests, etc. related to off-grid test points are possible.

Now, this lattice converter 10 is in the assembled state (the state shown in FIG. 1) in the position shown in FIG. Even in the posture, since the collar 42 of the relay pin 40 is engaged with the board 14 or the board 16, the relay pin 40 will not fall off. Therefore, this converter 10 can be assembled outside the board testing equipment,
Also, set X7. Bulova board 18 facing towards
It can also be attached to and removed from the 1-direction Bulova board.

As mentioned above, this case r converter 10 is 1 in the uninstalled state.
, 1[It can be inspected and repaired, and even though it is easier to assemble and repair than the conventional case r converter, it is also easier to assemble and repair. The structure has been devised. In order to clarify this, the set q procedure of this grating converter 10 will be explained below.

First, place the assembly excluding the substrate 14, the spacer 32, and the spacer 30 upside down on a workbench. and,
Holding the relay pin 40 upside down, insert the relay pin 40 into the corresponding pin holes 12A and 14B of the board 13.14.

Here, in the assembled state, the positional deviation between the pin holes 14A and 16A corresponding to the off-grid test points and the corresponding pin hole 12A is absorbed by the deflection of the relay pin 40. (It is necessary to widen the gap between the plates 12 and 14 to some extent. However, the pin hole 12A
, 14A, when inserting the relay pin 40 into the board 12.14
If the interval is large, incorrect insertion of the relay pin 40 is likely to occur.

Therefore, in this invention, the spacer 30 is removed)
(The distance between the plates 12A and 14A can be made sufficiently small to facilitate the insertion work of the relay pin 40.

However, if the distance between the boards 12 and 14 is too small, the relay pin 40 cannot be inserted through the pin hole 14A corresponding to the off-grid test point and the corresponding pin hole 12A, so the spacer 28 It is designed to ensure the necessary spacing by intervening.

After completing the insertion work of the relay pin 40, the spacer 32 is inserted into the coupling shaft 26, and then the relay pin 40 corresponding to the pin hole 16A of the board 16 is inserted.

At this time, the tip of the relay pin 40 is connected to the pin hole 18A of the board 16.
Its insertion is easy since it is positioned fairly accurately.

After completing the insertion work, the nut 36 is screwed onto the screw M of the coupling shaft 26 that has passed through the corner hole of the board 16, and the board 16 is tightened. The set \y is now complete.

This grating transducer IO is thus extremely easy to repair.

Although one embodiment has been described above, the present invention is not limited thereto (and can be implemented with appropriate modifications).

Further, the lattice converter of the present invention can also be applied to similar lattice conversion applications other than board testing equipment.

[Effects of the Invention] As described above, according to the present invention, the grid transducer includes a first board in which pin holes are formed at regular grid points, and a circuit board that corresponds to the test points of the circuit board to be tested. second and third substrates having pin holes formed therein; means for coupling the first, second and third substrates in that order with an interval therebetween; and a relay pin passed through the corresponding pin hole of the third board,
Each of the relay pins is provided with a fall-preventing protrusion, and the protrusion is positioned between the second and third substrates, and the -L stage for coupling is connected to the first and second substrates. It is possible to hold only the first and second substrates in a bonded state, and the distance between the substrates is variable when at least the first and second substrates are bonded. It can be used not only with the L-oriented Bulova board, but also with the D-oriented prober board, and it can be easily attached to and removed from the Bulova board in the assembled state. Alternatively, it is possible to realize a lattice converter that solves the problems of conventional lattice converters, such as being able to be easily repaired.

[Brief explanation of drawings]

Fig. 1 is a schematic cross-sectional front view with some parts omitted showing an embodiment of a lattice converter according to the present invention, Fig. 2 is a cross-sectional view of a removable spacer cut away along the line ■-■ Fig. 3 is a relay pin of-
・This is an enlarged schematic diagram of 1E with the section broken away. lO... Lattice converter, 12.14.16... Substrate,
12A, 14A, 18A... Pin hole, 18... Blowbabo-1', 20... Probe pin, 22... Circuit board to be inspected, 26... Connection shaft, 28.30.3
2...Spacer, 40...Relay pin, 42...Collar for fall prevention 11.

Claims (2)

[Claims] (1) a first substrate in which pin holes are formed at regular lattice points;
second and third boards having pin holes formed at positions corresponding to test points of the circuit board to be tested;
, a means for coupling the second and third substrates facing each other with an interval in that order; and relay pins passed through corresponding pin holes of the first, second and third substrates. Each of the relay pins is provided with a protrusion for preventing falling off, the protrusion is positioned between the second and third substrates, and the coupling means is connected to the first substrate. and a configuration in which only the second substrate can be held in a bonded state, and the spacing between the first and second substrates is variable at least when the first and second substrates are in the bonded state. A lattice converter characterized by: (2) The means for bonding the first, second and third substrates includes:
A coupling shaft penetrating through each of the substrates, and two spacers attached to the coupling shaft between the first and second substrates, at least one of the spacers is such that the coupling shaft is connected to the first and second substrates. The lattice converter according to claim 1, wherein the lattice converter is attachable to and detachable from the coupling shaft while penetrating the second substrate.