JPH08227769A - Ic socket - Google Patents
Ic socketInfo
- Publication number
- JPH08227769A JPH08227769A JP3227195A JP3227195A JPH08227769A JP H08227769 A JPH08227769 A JP H08227769A JP 3227195 A JP3227195 A JP 3227195A JP 3227195 A JP3227195 A JP 3227195A JP H08227769 A JPH08227769 A JP H08227769A
- Authority
- JP
- Japan
- Prior art keywords
- socket
- contact
- mounting
- socket body
- contact end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Connecting Device With Holders (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、製造過程において集積
回路(IC)の電気特性をチェックするIC試験装置等
に用いられるICソケットに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC socket used in an IC tester or the like for checking the electrical characteristics of an integrated circuit (IC) in the manufacturing process.
【0002】[0002]
【従来の技術】周知の通り、モールド工程を経てパッケ
ージが形成され、外部リードが所定形状に成形されたI
Cは、試験検査工程でIC試験装置等によって電気特性
がチェックされて全製造過程を終了する。As is well known, a package is formed through a molding process, and external leads are molded into a predetermined shape.
The electrical characteristics of C are checked by an IC tester or the like in the test inspection process, and the entire manufacturing process is completed.
【0003】このように製造過程でICの試験検査を行
うIC試験装置では、ICソケットが被試験物であるI
Cを容易に着脱できるものであると共に、装着されたI
Cの外部リードにICソケットのコンタクトピンが確実
に接触するものでなくてはならない。同時にICソケッ
トは多数のICを連続してチェックするために優れた耐
久性も要求される。In the IC testing apparatus for testing and inspecting ICs in the manufacturing process as described above, the IC socket is an object to be tested.
The C can be easily attached and detached, and the attached I
The contact pin of the IC socket must surely contact the external lead of C. At the same time, the IC socket is required to have excellent durability in order to continuously check a large number of ICs.
【0004】このような要求に対し、従来は次のような
ICソケットが用いられていた。以下、図4乃至図6を
参照してこれを説明する。図4は断面図であり、図5は
上面図であり、図6はIC試験装置の基板に取り付けた
状態を示す断面図である。In response to such demands, the following IC sockets have been conventionally used. This will be described below with reference to FIGS. 4 to 6. 4 is a cross-sectional view, FIG. 5 is a top view, and FIG. 6 is a cross-sectional view showing a state where the IC test apparatus is attached to a substrate.
【0005】図4乃至図6において、1はソケット本体
であり、これは台座2とこの台座2の上方に図示しない
スプリングに付勢された上下方向に進退可能な枠状の押
え体3を備え、被試験物であるIC4を上部に装着し得
るように構成されている。そしてソケット本体1には複
数のコンタクトピン5が、装着するIC4の側面の外部
リード6に対応して所定間隔を設けて2列に配列されて
いる。In FIGS. 4 to 6, reference numeral 1 denotes a socket body, which is provided with a base 2 and a frame-shaped pressing body 3 above the base 2 which can be advanced and retracted vertically by a spring (not shown). The IC4 as the DUT can be mounted on the upper part. The socket body 1 has a plurality of contact pins 5 arranged in two rows at predetermined intervals corresponding to the external leads 6 on the side surface of the IC 4 to be mounted.
【0006】コンタクトピン5は中間部分に弾性変形部
7が形成され、上方側にIC4の外部リード6に接触し
電気的に導通する接触部8が形成されている。さらに上
方側には押え体3の係合部位9に係合する係合片10が
設けられており、押え体3を上下に進退させることで弾
性変形部7が変形し、相対するように配列された接触部
8がそれぞれ左右方向反対向きに進退するようになって
いる。The contact pin 5 has an elastically deforming portion 7 formed at an intermediate portion thereof, and a contact portion 8 which is in contact with the external lead 6 of the IC 4 and electrically conducts at the upper side thereof. Further, an engaging piece 10 that engages with the engaging portion 9 of the pressing body 3 is provided on the upper side, and the elastic deformation portion 7 is deformed by moving the pressing body 3 up and down, and the elastic deformation portions 7 are arranged so as to face each other. The contact portions 8 are moved back and forth in opposite lateral directions.
【0007】また、コンタクトピン5は下方側に、台座
2の下面の取付面から延出する接続部であるリード11
が形成されている。リード11はソケット本体1を例え
ばIC試験装置の実装基板12に取り付ける際、実装基
板12の貫通孔13に差し込み、パッド14に半田付け
によって固定される。The contact pin 5 is a lead 11 which is a connecting portion extending downward from the mounting surface of the lower surface of the pedestal 2.
Are formed. The lead 11 is inserted into the through hole 13 of the mounting substrate 12 and fixed to the pad 14 by soldering when the socket body 1 is attached to the mounting substrate 12 of the IC test apparatus, for example.
【0008】このように構成されているので、ソケット
本体1をリード11を半田付けすることによって実装基
板12に取り付けられる。そして、装着対象であるIC
4を装着する場合には、先ずソケット本体1の押え体3
を下方向に押し下げ、コンタクトピン5の相対するよう
に配列された接触部8間を広げる。With this structure, the socket body 1 is attached to the mounting substrate 12 by soldering the leads 11. And the IC to be mounted
When attaching 4, the pressing body 3 of the socket body 1
Is pushed down to widen the space between the contact portions 8 of the contact pins 5 arranged so as to face each other.
【0009】続いてIC4を広げられた接触部8の間の
台座2上に載置する。その後、押え体3の下方向への押
し下げを解除すると、スプリング及び弾性変形部7の付
勢力で押え体3が上方に押し上げられ、同時に広げられ
ていた接触部8が弾性変形部7により狭められてIC4
の外部リード6に接触部8が圧接する。Subsequently, the IC 4 is placed on the pedestal 2 between the expanded contact portions 8. After that, when the downward pressing of the presser body 3 is released, the presser body 3 is pushed upward by the spring and the urging force of the elastically deformable portion 7, and at the same time the contact portion 8 that has been widened is narrowed by the elastically deformable portion 7. IC4
The contact portion 8 comes into pressure contact with the outer lead 6 of.
【0010】しかしながら上記の従来技術においては、
台座2の取付面から複数のコンタクトピン5のリード1
1が下方側に長く延出しており、実装基板12に取り付
ける等するために取り扱っている際に延出しているリー
ド11を曲げてしまう虞があった。そのため取り扱い難
く、リード11を曲げてしまうと、リード11と実装基
板12に形成された貫通孔13のピッチとが合わず、差
し込めなくなったりしてしまうものであった。However, in the above prior art,
Leads 1 of a plurality of contact pins 5 from the mounting surface of the pedestal 2
1 extends to the lower side for a long time, and there is a fear that the lead 11 extending during the handling for attaching to the mounting substrate 12 may be bent. Therefore, it is difficult to handle, and when the lead 11 is bent, the lead 11 and the pitch of the through holes 13 formed in the mounting substrate 12 do not match, and the lead 11 cannot be inserted.
【0011】また、ICソケットを実装基板12に取り
付けるには、ソケット本体1から延出するリード11を
貫通孔13に通しパッド14に半田付けする必要がある
ので、取り付けに時間を要し、また取り外す場合にもリ
ード11を固定している半田付けを外さなければなら
ず、手間が掛かり時間を要するもので簡単に交換ができ
るものではなかった。このため、IC4を数多く着脱す
る例えば製造過程に繰り込まれたIC試験装置等で使用
する場合には、ICソケットの交換が迅速かつ容易に行
えるものであることが強く望まれている。Further, in order to attach the IC socket to the mounting board 12, it is necessary to pass the lead 11 extending from the socket body 1 through the through hole 13 and solder it to the pad 14. Even when detaching, the soldering fixing the lead 11 must be removed, which is troublesome and time consuming, and cannot be easily replaced. For this reason, when a large number of ICs 4 are attached and detached, for example, when used in an IC tester or the like that has been put into the manufacturing process, it is strongly desired that the IC socket can be replaced quickly and easily.
【0012】[0012]
【発明が解決しようとする課題】上記のように従来のも
のでは半田付けによって実装基板に取り付けを行うよう
にしているので、ソケット本体から延出する半田付けを
するためのリードを変形させないよう注意して取り扱わ
なければならず扱い難く、またICソケットの取り付け
取り外しには手間が掛かると共に時間を要するもので、
その交換は簡単に行えるものではない。このような状況
に鑑みて本発明はなされたもので、その目的とするとこ
ろは、取り扱いが容易で、取り付け取り外しに手間や時
間が掛からず、交換が簡単に行えるICソケットを提供
することにある。As described above, since the conventional one is mounted on the mounting board by soldering, be careful not to deform the leads for soldering extending from the socket body. It is difficult to handle because it is difficult to handle, and it takes time and effort to attach and remove the IC socket,
The exchange is not easy. The present invention has been made in view of such circumstances, and an object of the present invention is to provide an IC socket that is easy to handle, does not require labor and time for attachment and detachment, and can be easily replaced. .
【0013】[0013]
【課題を解決するための手段】本発明のICソケット
は、実装基板に取り付けを行うソケット本体と、このソ
ケット本体に設けられた装着ICのリードに対応して配
列され且つ片方側に該ICのリードとの接触部を有し他
方側に実装基板への接続部を有する複数のコンタクトピ
ンとを備えたICソケットにおいて、コンタクトピンは
他方側に弾性変形部とソケット本体から短く突出する接
続部となる接触端部を有していると共に、接触端部が実
装基板に取り付けを行う際に弾性変形部によって該実装
基板の所定部位に圧接されるものであることを特徴とす
るものであり、さらに、コンタクトピンは、他方側に設
けられた接触端部がソケット本体の取付面から突出して
いると共に該接触端部以外の部位が略々突出しないよう
該ソケット本体内に納められていることを特徴とするも
のである。An IC socket according to the present invention is arranged so as to correspond to a socket body for mounting on a mounting board and a lead of a mounted IC provided on the socket body, and the IC body is provided on one side of the socket body. In an IC socket having a plurality of contact pins having a contact portion with a lead and a connecting portion to a mounting substrate on the other side, the contact pin serves as an elastically deforming portion and a connecting portion protruding short from the socket body on the other side. It is characterized in that it has a contact end portion, and the contact end portion is pressed against a predetermined portion of the mounting board by an elastically deformable portion when it is attached to the mounting board. The contact pin has a contact end portion provided on the other side protruding from the mounting surface of the socket body, and the contact pin is provided inside the socket body so that the portions other than the contact end portion do not substantially project. And it is characterized in that has been fit.
【0014】[0014]
【作用】上記のように構成されたICソケットは、ソケ
ット本体に設けられた片方側に装着ICのリードとの接
触部を有するコンタクトピンが、他方側に弾性変形部と
実装基板への接続部となる短く突出する接触端部を有
し、この接触端部が実装基板に取り付けを行う際に弾性
変形部によって実装基板の所定部位に圧接されているの
で、ICソケットを取り扱っている最中にソケット本体
から突出する接触端部を曲げてしまう虞が少なく、また
単にソケット本体の取り付けを行うだけで実装基板の所
定部位と接触端部との位置合わせが行え、さらにその接
続も弾性変形部によって接触端部が付勢され実装基板の
所定部位に圧接することでなされるために手間や時間が
掛からずに取り付けが行える。そして、取り外しも半田
付を伴わないためにソケット本体を実装基板から取り外
すだけで実装基板の所定部位と接触端部との接続が外
せ、手間や時間が掛からずに行える。その結果、ICソ
ケットの交換が簡単かつ容易に行える。In the IC socket constructed as described above, the contact pin having the contact portion with the lead of the mounted IC is provided on one side provided on the socket body, and the elastic deformation portion and the connection portion to the mounting board are provided on the other side. Has a short protruding contact end portion, and this contact end portion is pressed against a predetermined portion of the mounting board by the elastically deforming portion when mounting on the mounting board. There is little risk of bending the contact end protruding from the socket body, and by simply attaching the socket body, the predetermined part of the mounting board and the contact end can be aligned, and the connection is also made by the elastic deformation part. Since the contact end portion is biased and pressed against a predetermined portion of the mounting substrate, the mounting can be performed without trouble and time. Further, since the removal is not accompanied by soldering, it is possible to disconnect the predetermined portion of the mounting board and the contact end portion by simply removing the socket body from the mounting board, which can be done without trouble and time. As a result, the IC socket can be replaced easily and easily.
【0015】[0015]
【実施例】以下、本発明の一実施例を図1乃至図3を参
照して説明する。図1は断面図であり、図2は上面図で
あり、図3はIC試験装置の基板に取り付けた状態を示
す断面図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS. 1 is a cross-sectional view, FIG. 2 is a top view, and FIG. 3 is a cross-sectional view showing a state where the IC test apparatus is attached to a substrate.
【0016】図1乃至図3において、21はソケット本
体であり、これは第1及び第2の台座22,23と、こ
れらの第1及び第2の台座22,23の上方に、図示し
ないスプリングに付勢された上下方向に進退可能な枠状
の押え体24を備えて略直方体状に構成されている。そ
して、直方体状のパッケージ25の側面から延出しJ形
状に成形された複数の外部リード26を有する被試験物
であるIC27を、押え体24の装着開口部24a内の
第2の台座23の上部に装着し得るようになっている。In FIGS. 1 to 3, reference numeral 21 denotes a socket body, which is composed of first and second pedestals 22 and 23, and a spring (not shown) above the first and second pedestals 22 and 23. It is provided with a frame-shaped pressing body 24 that can be moved back and forth in the vertical direction and is configured to have a substantially rectangular parallelepiped shape. Then, the IC 27, which is a DUT having a plurality of external leads 26 formed in a J shape and extending from the side surface of the rectangular parallelepiped package 25, is attached to the upper portion of the second pedestal 23 in the mounting opening 24 a of the pressing body 24. It can be attached to.
【0017】また第2の台座23には、断面がL字形状
の揺動片28が揺動中心Zを中心に押え体24が上下に
進退することで、押え体24に片端部が係合して揺動す
るように取り付けられている。On the second pedestal 23, a swinging piece 28 having an L-shaped cross section moves up and down around the swing center Z, so that one end of the pusher 24 is engaged. It is attached so as to swing.
【0018】さらにソケット本体21には複数のコンタ
クトピン29が、装着するIC27の外部リード26に
対応して両長辺にそれぞれ沿って所定間隔で相対するよ
うに2列に配列され、第1の台座22と第2の台座23
とに挟持されている。すなわち、コンタクトピン29は
中間部に、第1の台座22の嵌合部30に嵌合する切欠
き31が形成された固定部32を有し、この固定部32
は第1の台座22に第2の台座23を固定する際に嵌合
部30に切欠き31が嵌合するようにして同時に固定さ
れる。Further, in the socket body 21, a plurality of contact pins 29 are arranged in two rows corresponding to the external leads 26 of the IC 27 to be mounted so as to face each other at predetermined intervals along both long sides, Pedestal 22 and second pedestal 23
It is sandwiched between and. That is, the contact pin 29 has a fixing portion 32 having a notch 31 that fits in the fitting portion 30 of the first pedestal 22 in the middle portion.
When the second pedestal 23 is fixed to the first pedestal 22, the notch 31 fits into the fitting portion 30 and is fixed at the same time.
【0019】また、コンタクトピン29はその片端側で
ある上方側にS字状に形成された上側弾性変形部33が
形成され、その先端部にIC27の外部リード26に接
触し電気的に導通する接触部34が形成されている。さ
らに上側弾性変形部33の中間部には、揺動片28の他
端部に係合する係合片35が設けられており、押え体2
4を上下に進退させることで揺動片28が揺動し、係合
片35が左右方向に移動して上側弾性変形部33が変形
する。これにより、相対するように配列された2列の接
触部34がそれぞれ左右方向反対向きに進退するように
なっている。Further, the contact pin 29 has an upper elastic deforming portion 33 formed in an S shape on the upper side which is one end side thereof, and the tip end thereof is brought into contact with the external lead 26 of the IC 27 to be electrically conducted. The contact portion 34 is formed. Further, an engaging piece 35 that engages with the other end of the swinging piece 28 is provided in the middle portion of the upper elastically deforming portion 33, and the pressing body 2 is provided.
By moving 4 up and down, the rocking piece 28 rocks, the engaging piece 35 moves in the left-right direction, and the upper elastic deformation portion 33 deforms. As a result, the two rows of contact portions 34 arranged so as to face each other advance and retreat in opposite lateral directions.
【0020】一方、コンタクトピン29は他端側である
下方側に下側弾性変形部36が、挟持されている第1の
台座22の下面の取付面22aに沿うように形成されて
おり、この下側弾性変形部36の小さくL状に折曲され
た先端には接触端部37が設けられている。また接触端
部37は、常時は第1の台座22の取付面22aから下
方向に先端部分だけが短く突出したものとなっており、
下側弾性変形部36を弾性変形させて接触端部37を取
付面22aと面一もしくは取付面22aよりも内側に引
っ込まれた状態にすると、この接触端部37には取付面
22aから突出する方向に所定の力が付勢されるように
なっている。On the other hand, the contact pin 29 has a lower elastic deformation portion 36 formed on the lower side which is the other end side so as to extend along the attachment surface 22a of the lower surface of the first pedestal 22 which is clamped. A contact end portion 37 is provided at the tip of the lower elastically deformable portion 36 that is bent in a small L shape. Further, the contact end portion 37 is always one in which only the front end portion is shortly projected downward from the mounting surface 22a of the first pedestal 22,
When the lower elastically deformable portion 36 is elastically deformed to bring the contact end 37 flush with the mounting surface 22a or retracted inward of the mounting surface 22a, the contact end 37 projects from the mounting surface 22a. A predetermined force is applied in the direction.
【0021】そしてICソケットを、例えばIC試験装
置の実装基板38に取り付ける際には、ソケット本体2
1の第1及び第2の台座22,23に形成された孔3
9,40によって両台座を組み合わせて出来た貫通孔4
1と実装基板38の取付孔42とに固定ボルト43とナ
ット44によって行われる。この固定ボルト43とナッ
ト44による固定がなされたときに、ソケット本体21
の取付面22aが実装基板38に当接し、接触端部37
が実装基板38の表面に設けられた対応するパッド45
に、下側弾性変形部36の弾性変形により付勢されて圧
接し、接触端部37とパッド45とが電気的に接続され
る。なお、実装基板38からのICソケットの取り外し
は、固定ボルト43とナット44の固定状態を解除する
ことにより行えるようになっている。When the IC socket is attached to the mounting board 38 of the IC tester, for example, the socket body 2
Hole 3 formed in the first and second pedestals 22 and 23
Through hole 4 made by combining both pedestals with 9, 40
1 and the mounting hole 42 of the mounting substrate 38 by fixing bolts 43 and nuts 44. When the fixing bolts 43 and the nuts 44 are fixed, the socket body 21
The mounting surface 22a of the abutting contact the mounting substrate 38, and the contact end 37
Is a corresponding pad 45 provided on the surface of the mounting substrate 38.
Then, the lower elastically deformable portion 36 is elastically deformed to be pressed into contact therewith, so that the contact end portion 37 and the pad 45 are electrically connected. The IC socket can be removed from the mounting board 38 by releasing the fixing state of the fixing bolt 43 and the nut 44.
【0022】以上のように構成されているので、ソケッ
ト本体21の取付面22aからの接触端部37の突出寸
法が短く、実装基板38への取り付け等のためにICソ
ケットを取り扱う際にも接触端部37を曲げてしまう虞
が少なく、取り扱いに格別の配慮を必要とせず取り扱い
が容易である。また接触端部37が曲がってその位置が
ずれてしまう虞も少ないことから、ICソケットを固定
ボルト43及びナット44により実装基板38に固定す
る際にも、実装基板38に設けられた対応する所定のパ
ッド45に確実に接触させることができる。With the above structure, the contact end portion 37 of the socket body 21 has a short projecting dimension from the mounting surface 22a, so that it can be contacted when handling the IC socket for mounting on the mounting substrate 38 or the like. There is little risk of bending the end portion 37, and no special consideration is required for handling, and handling is easy. Further, since there is little possibility that the contact end portion 37 is bent and its position is displaced, when the IC socket is fixed to the mounting board 38 by the fixing bolts 43 and the nuts 44, the corresponding predetermined positions provided on the mounting board 38 are fixed. The pad 45 can be surely contacted.
【0023】また、実装基板38のパッド45との電気
的な接続を行うのも半田付けが不要で、固定ボルト43
及びナット44によりICソケットを実装基板12に取
り付け固定するだけで対応する接触端部37とパッド4
5との接続が、取り付けに時間を要することなく簡単に
行える。さらにICソケットを実装基板12から取り外
すのも、固定ボルト43とナット44の固定状態を解除
するだけでよく、簡単かつ速やかに行うことができる。Moreover, soldering is not required to electrically connect to the pad 45 of the mounting substrate 38, and the fixing bolt 43 is used.
The corresponding contact end portion 37 and pad 4 can be obtained by simply attaching and fixing the IC socket to the mounting substrate 12 with the nut 44.
The connection with the 5 can be easily made without requiring time for installation. Further, the IC socket can be removed from the mounting substrate 12 simply by releasing the fixed state of the fixing bolt 43 and the nut 44, which can be easily and quickly performed.
【0024】このためIC試験装置等で使用する場合、
ICソケットの交換が迅速かつ容易に行え、ICソケッ
トに不具合が発生した時などのメンテナンス性も優れて
いる。またコンタクトピン29は略全体がソケット本体
21内に略収納され、接触端部37の先端部分が僅かに
ソケット本体21から突出するだけであるから、ICソ
ケットに外部から加わる力が要因となってコンタクトピ
ン29が変形し使用できなくなるのが低減される。Therefore, when it is used in an IC tester, etc.,
The IC socket can be replaced quickly and easily, and the maintainability is excellent when a failure occurs in the IC socket. Further, since the contact pin 29 is substantially entirely housed in the socket body 21 and the tip end portion of the contact end portion 37 only slightly projects from the socket body 21, the force applied from the outside to the IC socket becomes a factor. It is reduced that the contact pin 29 is deformed and cannot be used.
【0025】[0025]
【発明の効果】以上の説明から明らかなように、本発明
は、ソケット本体に設けられた片方側に装着ICのリー
ドとの接触部を有するコンタクトピンが、他方側に弾性
変形部と実装基板への接続部となる短く突出する接触端
部を有し、この接触端部が実装基板に取り付けを行う際
に弾性変形部によって実装基板の所定部位に圧接される
構成としたことにより、取り扱いが容易で、取り付け取
り外しに手間や時間が掛からず、交換が簡単に行える等
の効果が得られる。As is apparent from the above description, according to the present invention, the contact pin having the contact portion with the lead of the mounted IC is provided on one side of the socket body, and the elastic deformation portion and the mounting board are provided on the other side. It has a short projecting contact end that becomes a connection part to the mounting board, and this contact end is pressed against a predetermined part of the mounting board by the elastically deforming part when the mounting board is mounted, so that the handling is easy. The advantages are that it is easy, it does not take time and effort to attach and detach, and it can be easily replaced.
【図1】本発明の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.
【図2】本発明の一実施例の平面図である。FIG. 2 is a plan view of one embodiment of the present invention.
【図3】本発明の一実施例に係るIC試験装置の基板に
取り付けた状態を示す断面図である。FIG. 3 is a cross-sectional view showing a state in which the IC test apparatus according to the embodiment of the present invention is attached to a substrate.
【図4】従来例を示す断面図である。FIG. 4 is a cross-sectional view showing a conventional example.
【図5】従来例の平面図である。FIG. 5 is a plan view of a conventional example.
【図6】従来例に係るIC試験装置の基板に取り付けた
状態を示す断面図である。FIG. 6 is a cross-sectional view showing a state in which the IC test apparatus according to the conventional example is attached to a substrate.
21…ソケット本体 22…第1の台座 22a…取付面 23…第2の台座 24…押え体 26…外部リード 27…IC 29…コンタクトピン 33…上側弾性変形部 34…接触部 36…下側弾性変形部 37…接触端部 38…実装基板 45…パッド 21 ... Socket main body 22 ... First pedestal 22a ... Mounting surface 23 ... Second pedestal 24 ... Presser body 26 ... External lead 27 ... IC 29 ... Contact pin 33 ... Upper elastic deformation part 34 ... Contact part 36 ... Lower elasticity Deformation part 37 ... Contact end part 38 ... Mounting board 45 ... Pad
Claims (2)
と、このソケット本体に設けられた装着ICのリードに
対応して配列され且つ片方側に該ICのリードとの接触
部を有し他方側に前記実装基板への接続部を有する複数
のコンタクトピンとを備えたICソケットにおいて、前
記コンタクトピンは他方側に弾性変形部と前記ソケット
本体から短く突出する前記接続部となる接触端部を有し
ていると共に、前記接触端部が前記実装基板に取り付け
を行う際に前記弾性変形部によって該実装基板の所定部
位に圧接されるものであることを特徴とするICソケッ
ト。1. A socket body to be mounted on a mounting board, and a socket body arranged in correspondence with the leads of a mounting IC provided on the socket body, and having a contact portion with the lead of the IC on one side and the other side. In an IC socket provided with a plurality of contact pins having a connecting portion to the mounting board, the contact pin has an elastically deforming portion on the other side and a contact end portion to be the connecting portion protruding from the socket body for a short time. In addition, the IC socket is characterized in that the contact end portion is pressed against a predetermined portion of the mounting board by the elastically deformable portion when the mounting end is mounted on the mounting board.
接触端部がソケット本体の取付面から突出していると共
に該接触端部以外の部位が略々突出しないよう該ソケッ
ト本体内に納められていることを特徴とする請求項1記
載のICソケット。2. The contact pin is housed in the socket body such that a contact end portion provided on the other side projects from the mounting surface of the socket body and a portion other than the contact end portion does not substantially project. The IC socket according to claim 1, wherein:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3227195A JPH08227769A (en) | 1995-02-21 | 1995-02-21 | Ic socket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3227195A JPH08227769A (en) | 1995-02-21 | 1995-02-21 | Ic socket |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH08227769A true JPH08227769A (en) | 1996-09-03 |
Family
ID=12354337
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3227195A Withdrawn JPH08227769A (en) | 1995-02-21 | 1995-02-21 | Ic socket |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH08227769A (en) |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20020507 |