JPS6214033A - Water leak tester - Google Patents
Water leak testerInfo
- Publication number
- JPS6214033A JPS6214033A JP60151264A JP15126485A JPS6214033A JP S6214033 A JPS6214033 A JP S6214033A JP 60151264 A JP60151264 A JP 60151264A JP 15126485 A JP15126485 A JP 15126485A JP S6214033 A JPS6214033 A JP S6214033A
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- water
- valve
- test
- workpiece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明はワークに対して低圧と高圧の2種の水漏れ試験
を行なうことのできる装置に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an apparatus that can perform two types of water leakage tests, low pressure and high pressure, on a workpiece.
(従来の技術)
湯沸器その他のワークは低圧と高圧の2種の水漏れ試験
を要求される場合がしばしばあり、これを行なう場合、
低圧、高圧の順で行なうを一般とする。(Prior art) Water heaters and other workpieces are often required to undergo two types of water leakage tests: low pressure and high pressure.
It is generally done in the order of low pressure and high pressure.
従来の低圧水漏れ試験は、第4図Aに承りように、水を
圧送するポンプ(a)とワーク(b)とを接続する管路
(C)に第1開閉弁(d)を介設し、該管路(C)の該
ワーク(b)と該第1開閉弁(d)との間に低圧試験用
の圧力ut (e)を接続して、先ず該ワーク(b)の
先止式の止水弁(f)と該第1開閉弁(d)とを開弁状
態にし、該ポンプ(a)によりタンク(0)内の水をス
トレーナ−(鴎、低圧試験用の調圧するガバナ(i>、
該ワーク(b)を順に介して循環させる。次いで該ワー
ク(b)の止水弁(Dを閉弁し、該ワーク(b)内に流
入され充満される水の圧力が低圧の所定の試験圧に達す
るのを該圧力計(e)により確認した後、該第1開閉弁
(d)を開弁する。そして一定時間後、該圧力11(e
)の値を肉眼で読み取り、その値と該試験圧との差から
ワーク(b)の良・不良を決定して終了する。In the conventional low-pressure water leak test, as shown in Figure 4A, a first on-off valve (d) is inserted in the pipe line (C) that connects the pump (a) that pumps water and the workpiece (b). Then, a low pressure test pressure ut (e) is connected between the workpiece (b) and the first on-off valve (d) of the pipe line (C), and the workpiece (b) is first stopped. The water stop valve (f) of the formula and the first on-off valve (d) are opened, and the water in the tank (0) is pumped by the pump (a) into the strainer (Koh), a governor that regulates the pressure for low pressure tests. (i>,
The workpieces (b) are circulated in sequence. Next, the water stop valve (D) of the workpiece (b) is closed, and the pressure gauge (e) is used to check that the pressure of the water flowing into and filling the workpiece (b) reaches a predetermined low test pressure. After checking, the first on-off valve (d) is opened.Then, after a certain period of time, the pressure 11 (e
) is read with the naked eye, and based on the difference between that value and the test pressure, it is determined whether the workpiece (b) is good or bad, and the process ends.
また、従来の高圧水漏れ試験は、上記低圧試験において
良品であると決定されたワーク(b)について行なうも
ので、上記低圧試験の終了後、その装置から圧力計(e
)を外し、第4図Bに示すように、管路(C)の第1開
閉弁(d)とガバナ(i>との間に第2開閉弁(、l)
を介設し、該第1開閉弁(d)と該第2開閉弁O)との
間に高圧発生用の水圧発生器(k)を接続し、ワーク(
b)と該第1開閉弁(d)との間に高圧試験用の圧力計
ωを接続して、先ず、該ワーク(b)の止水弁(「)を
閉弁し、該第1・第2開閉弁(d) (j)を開弁じた
状態で、ポンプ(a)によりタンク(IJ)内の水を該
ワーク(b)内に流入させる。In addition, the conventional high-pressure water leakage test is conducted on the workpiece (b) that was determined to be good in the low-pressure test, and after the low-pressure test is completed, the pressure gauge (e
), and as shown in Figure 4B, insert the second on-off valve (, l) between the first on-off valve (d) of the conduit (C) and the governor (i>).
A water pressure generator (k) for generating high pressure is connected between the first on-off valve (d) and the second on-off valve (O), and the workpiece (
A pressure gauge ω for high pressure testing is connected between the workpiece (b) and the first on-off valve (d), and the water stop valve (') of the workpiece (b) is first closed. With the second on-off valve (d) (j) open, water in the tank (IJ) is caused to flow into the workpiece (b) by the pump (a).
次いで、該第2聞閉弁O)を閉弁し、該水圧発生器(k
)を作動させて該ワーク(b)内の充満された水の圧力
が高圧の所定の試験圧に達するのを該圧力計(至)によ
り確認する。確認後直ちに該第1開閉弁(d>を閉弁し
、一定時間経過後に該圧力計ωの値を読み取り、その伯
と該試験圧との差からワーク(b)の良・不良を決定し
て終了する。Next, the second shutoff valve O) is closed, and the water pressure generator (k
), and confirm with the pressure gauge that the pressure of the water filled in the workpiece (b) reaches a high predetermined test pressure. Immediately after confirmation, close the first on-off valve (d), read the value of the pressure gauge ω after a certain period of time, and determine whether the workpiece (b) is good or bad based on the difference between the value and the test pressure. and exit.
(発明が解決しようとする問題点)
上記従来の水漏れ試験においては、高圧試験を行なう際
、試験装置を低圧試験用から高圧試験用に組み変えなt
ノればならず、その作業に部間がかかり、またワークに
充満された水の圧力を所定の試験圧に正しく調整するこ
とが実際上困難であるため測定が不正確になる等の不都
合を伴う。(Problems to be Solved by the Invention) In the conventional water leak test described above, when performing a high pressure test, the test equipment must be changed from a low pressure test to a high pressure test.
The work must be done in a time-consuming manner, and it is actually difficult to correctly adjust the pressure of the water filling the workpiece to the specified test pressure, resulting in inconveniences such as inaccurate measurements. Accompany.
(問題点を解決するための手段)
本発明は上記点に鑑み、低圧試験と高圧試験との間に組
み変え作業を伴なうことなく、直ちに高圧試験を行なう
ことができ、しがちワークに充満された水の圧力を前記
従来試験のように所定の試験圧に正しく調整することな
くその近傍の圧力に調整することにより正確な水漏れ試
験を行なうことのできる装置を提供しようとするもので
あって、湯沸器その他のワークを水を圧送するポンプに
接続する管路に、第1開閉弁とその上流側の第2開閉弁
とを介設し、該管路の該第1・第2開閉弁間に水圧発生
器を接続すると共に、該管路の該ワークと該第1開閉弁
との間に、高圧用の第1圧力計と第3問1″j1弁を介
した低圧用の第2圧力計とを互いに並列に接続し、さら
に該第1・第2・第3開閉弁を開口υ制御し且つ該第1
・第2圧力計の実a111if!を一定時間読み込み、
該一定時間内の圧力減少値を内部で設定された低圧試験
時の圧力減少値及び高圧試験時の圧力減少値と比較して
該ワークの良・不良を判定する判定器を設けたことを特
徴とする。(Means for Solving the Problems) In view of the above points, the present invention makes it possible to perform a high pressure test immediately without reassembling work between a low pressure test and a high pressure test. The purpose of the present invention is to provide a device that can conduct an accurate water leakage test by adjusting the pressure of filled water to a pressure in the vicinity of the predetermined test pressure, instead of adjusting it to a predetermined test pressure as in the conventional test. A first on-off valve and a second on-off valve on the upstream side thereof are interposed in a pipe line that connects a water heater or other work to a pump that pumps water. A water pressure generator is connected between the two on-off valves, and a first pressure gauge for high pressure and a water pressure generator for low pressure are connected between the workpiece of the pipeline and the first on-off valve. and a second pressure gauge are connected in parallel with each other, and the first, second, and third on-off valves are controlled to open υ, and the first, second, and third on-off valves are
・Actual a111if of the second pressure gauge! Load for a certain period of time,
It is characterized by being equipped with a judgment device that compares the pressure reduction value within the certain period of time with an internally set pressure reduction value during a low pressure test and a pressure reduction value during a high pressure test to determine whether the work is good or bad. shall be.
(実施例) 次に本発明を図示の実施例に基づいて説明する。(Example) Next, the present invention will be explained based on illustrated embodiments.
第1図において、(1)はタンク(2)内の水をポンプ
(3)により管路(4)を介して循環させる循環系を示
し、該管路(4)には該ポンプ(3)から遠い順にワー
クたる止水弁(5) (=J潟湯沸(6)、第1開閉弁
(7)、第2開閏弁(8)、低圧試験用に調圧するガバ
ナ(9)、ストレーナ(IOが介設される。In FIG. 1, (1) shows a circulation system in which water in a tank (2) is circulated through a pipe (4) by a pump (3), and the pipe (4) is connected to the pump (3). Workpieces in order of distance from the water stop valve (5) (=J lagoon water boiler (6), first on-off valve (7), second on-off valve (8), governor for regulating pressure for low pressure tests (9), strainer (IO is interposed.
該管路(4)は該湯沸器(6)と該第1開閉弁〈7)と
の間で分岐され、第1分岐管avには、その先端に高圧
用の第1圧力計aつが接続され、第2分岐管(13には
、その中間に第3開閉弁(’lのが介設され、その先端
に低圧用の第2圧力計a9が接続される。The pipe line (4) is branched between the water heater (6) and the first on-off valve (7), and the first branch pipe av has a first pressure gauge a for high pressure at its tip. A third on-off valve ('l) is interposed in the middle of the second branch pipe (13), and a second pressure gauge a9 for low pressure is connected to the tip thereof.
さらに、該管路(4)は該第1開閉弁(7)と該第2開
閉弁(8)との間で分岐され、第3分岐管(1Gには、
その先端に高圧発生用の水圧発生器(171が接続され
る。Further, the pipe line (4) is branched between the first on-off valve (7) and the second on-off valve (8), and the third branch pipe (1G has a
A water pressure generator (171) for generating high pressure is connected to its tip.
該水圧発生器(+7)としては、従来公知の例えばエア
ーシリンダ式のものを用いる。As the water pressure generator (+7), a conventionally known type, for example, an air cylinder type is used.
(′lF!jは判定器を示し、該判定器0aは第1・第
2・第3開閉弁(7) (8) (’lΦを開閉制御す
ると共に、第1・第2・圧力計OaSの実311Viを
読み込み、低圧及び高圧水漏れ試験において前記湯沸器
(6)が良品が否かを判定するものである。('lF!j indicates a judger, and the judger 0a controls the opening/closing of the first, second, and third on-off valves (7) (8) ('lF! 311Vi is read and it is determined whether the water heater (6) is a good product or not in the low pressure and high pressure water leakage tests.
第2図は、該判定器(1&の内容をブロックで示したも
ので、a9はワークたる湯沸器(6)の通水路に設けら
れ、水圧を検知する圧力センサを示し、該j出力t”ン
リ・19からのアフログ出力は補正回路のと、へ7′D
コンバータのとを介してディジタル出力としてバッファ
・レジスタのに刻々送られる。FIG. 2 shows the contents of the judgment device (1 & ”The aflog output from Henri 19 is connected to the correction circuit and 7'D.
The output signal is sent to the buffer register as a digital output via the converter and the buffer register.
29はメモリ・レジスタを示し、該メモリ・レジスタ■
はホールド信号発生時の該バッファ・レジスタのの水圧
値Hsを一定時間記憶保持する。29 indicates a memory register, and the memory register ■
stores the water pressure value Hs in the buffer register for a certain period of time when the hold signal is generated.
のは比較回路を示し、該比較回路QΦは該メモリ・レジ
スタ■の水圧ViMsと、該バッファ・レジスタ■に送
られてくる該メモリ・レジスタ■の一定時間終了時の水
圧値M〔との差(Ms−M E )を、内部の上下限設
定値N1.N2と比較して、差(Ms−Ms)が上下限
設定値N1、N2内に収まるときは良品信号を、上限設
定値N、を越えたときは不良品信号を、下限設定値N2
未満のときは試験不良信号を出力する。indicates a comparison circuit, and the comparison circuit QΦ calculates the difference between the water pressure ViMs in the memory register ■ and the water pressure value M at the end of a certain period of time in the memory register ■, which is sent to the buffer register ■. (Ms-M E ) with the internal upper and lower limit set values N1. Compared with N2, when the difference (Ms - Ms) falls within the upper and lower limit set values N1 and N2, a good product signal is output, and when it exceeds the upper limit set value N, a defective product signal is output, and the lower limit set value N2
If the value is less than 1, a test failure signal is output.
咎は低圧試験用の−F限設定値NILをセットする上限
設定器、■は低圧試験用の下限設定値N2[をセットす
る下限設定器、■は高圧試験用の上限設定値NIHをセ
ットする上限設定器、■は高圧試験用の下限設定値N2
Mをセットする下限設定器、■は低圧と高圧の設定値切
換器を夫々示す。The symbol is the upper limit setter that sets the -F limit set value NIL for low pressure tests, ■ is the lower limit setter that sets the lower limit set value N2 for low pressure tests, and ■ is the upper limit set value NIH for high pressure tests. Upper limit setting device, ■ is lower limit setting value N2 for high pressure test
A lower limit setter sets M, and ■ indicates a set value switch for low pressure and high pressure, respectively.
図中、■はバッファ・レジスタのの給を刻々表示する表
示器、■はメモリ・レジスタ■の値Msを表示する表示
器、■は前記第1・第2・第3開閉弁(7) (8)
(Iのを開閉刺部する開閉弁制御回路を夫々示す。In the figure, ■ is a display that momentarily displays the supply of the buffer register, ■ is a display that displays the value Ms of the memory register ■, and ■ is the first, second, and third on-off valve (7) ( 8)
(The opening/closing valve control circuits for opening/closing the opening/closing part of I are shown respectively.
(作 用)
次いでその作動を第3図と共に説明すると、先ず、判定
器■内の開閉弁制御回路■により第1・第2・第3開閉
弁(7) (8) I′lΦを開弁すると共に、ワーク
たる先止式湯沸器(6)の止水弁(5)を開弁じ、且つ
ポンプ(3)を作動させて、タンク(2)内の水を5乃
至6秒間管路(4)を介して循環させる。次いで該止水
弁(5)を閉弁し、該湯沸器(6)内に充満される水の
圧力が低圧の所定の試験圧に達するまで1.5乃至2秒
間持つ。そして試験圧に達したことを第2圧力計119
により確認したとき、該開閉弁υis回路■により第1
開閉弁(7)をa1弁し、該湯沸器(6)内の水圧が該
試験圧の近傍の検査圧に落らイ4くまで5秒間待つ。(Function) Next, the operation will be explained with reference to Fig. 3. First, the first, second, and third on-off valves (7) (8) I'lΦ are opened by the on-off valve control circuit (■) in the determiner (■). At the same time, the water shut-off valve (5) of the first-stop water heater (6), which is the workpiece, is opened, and the pump (3) is operated to drain the water in the tank (2) into the pipe (2) for 5 to 6 seconds. 4). Then, close the water stop valve (5) and hold for 1.5 to 2 seconds until the pressure of the water filling the water heater (6) reaches a predetermined low test pressure. Then, the second pressure gauge 119 indicates that the test pressure has been reached.
When confirmed by the on-off valve υis circuit ■, the first
Turn the on-off valve (7) to the a1 valve and wait for 5 seconds until the water pressure in the water heater (6) drops to the test pressure near the test pressure.
この5秒間の経過後、直ちにホールド信号が発生され、
メモリ・レジスタのに安定した検査圧MSLが一定時間
ここでは5秒間記憶される。After this 5 seconds has elapsed, a hold signal is immediately generated,
The stable test pressure MSL is stored in the memory register for a certain period of time, here 5 seconds.
この検査圧MSLが記憶されている間にも、第2圧力計
(′lSにより検出された湯沸器(6)内の水圧は時時
刻へ11バツフア・レジスタ■に送られてくる。While this test pressure MSL is being stored, the water pressure in the water heater (6) detected by the second pressure gauge ('lS) is sent to the 11 buffer register (2) at the time.
そして、該メモリ・レジスタ■の記憶時間の終了時にJ
3いて、該メモリ・レジスタ■の検査圧Ms[と該バッ
ファ・レジスタ■の実測圧M「Lとが比較回路Q@に人
力され、両者の差(MSt−MEL)と低1丁の上下限
設定値Net、N2Lとが比較されて、該比較回路C!
Φからは、N2L≦(MSL−MEL)≦Netのとき
は良品信号が出力され、(MS L−ME t ) >
N、Lのときは不良品信号が出力され、(MSL−ME
L ) <N2 tのときは試験不良信号が出力され
、湯沸器(6)の低圧の水漏れ試験は終了する。Then, at the end of the storage time of the memory register ■, J
3, the test pressure Ms of the memory register ■ and the actual measured pressure M of the buffer register ■ are input to the comparator circuit Q@, and the difference between the two (MSt-MEL) and the upper and lower limits of the low The set values Net and N2L are compared, and the comparison circuit C!
A good signal is output from Φ when N2L≦(MSL-MEL)≦Net, and (MS L-ME t ) >
When N or L, a defective product signal is output and (MSL-ME
L) <N2 When t, a test failure signal is output, and the low pressure water leak test of the water heater (6) is completed.
上記低圧試験が終了すると、直ちに高圧試験が開始され
、先ず、開閉弁υ11i11回路■により第1開閉弁(
7)を開弁すると共に第2・第3間m弁(8) (lΦ
を閉弁する。次いで水圧発生器面を作!71ざぜて、湯
沸器(6)内の水圧を上昇させ、その圧力が高圧の所定
の試験圧に達するまで6乃至12秒間持つ。Immediately after the low-pressure test is completed, the high-pressure test starts. First, the first on-off valve (
7) Open the valve and open the second and third m valve (8) (lΦ
Close the valve. Next, create the water pressure generator surface! 71 to increase the water pressure in the water heater (6) and hold for 6 to 12 seconds until the pressure reaches the high predetermined test pressure.
そして試験圧に達したことを第1圧力計(′lzにより
確認したとき、該開閉弁制御回路■により該第1開閉弁
(7)を閉弁し、該湯沸器(6)内の水圧が該試験圧の
近傍の検査圧に落ち付くまで5秒間待つ。When it is confirmed by the first pressure gauge ('lz) that the test pressure has been reached, the first on-off valve (7) is closed by the on-off valve control circuit (■), and the water pressure in the water heater (6) is Wait 5 seconds until the test pressure settles to a test pressure near the test pressure.
その後の試験過程は、前記低圧試験の場合と特に異なる
ことはなく、比較回路■からは、N211≦(MS)I
−MEI−1)≦N1)1のときは良品信号が出力され
(Ms 11−M[H) >N+ uのときは不良品信
号が出力され、(MsuME)l)<N211のときは
試験不良信号が出力され、湯沸器(6)の低圧の水漏れ
試験は終了する。The subsequent test process is not particularly different from the low voltage test described above, and from the comparator circuit
-MEI-1)≦N1) When 1, a good product signal is output, when (Ms 11-M[H) >N+ u, a defective product signal is output, and when (MsuME)l)<N211, a test failure is detected. A signal is output, and the low pressure water leak test of the water heater (6) is completed.
(発明の効果)
このように本発明によるときは、試験装置に、第1・第
2・第3開閉弁を開閉制御し且つ第1・第2圧力翳iの
値を読み込み、その値が一定値に落ちついた時ワークの
良・不良を判定する判定器を備えて、低圧試験用にも高
圧試験用にも直ちに使用できるようにしたので、高圧試
験を行なう際、前記従来の試験装置のように低圧試験用
から高圧試験用に組み変える必要がなくなり、試験の能
率が向上する効果を有する。(Effect of the invention) According to the present invention, the test device controls the opening and closing of the first, second, and third on-off valves, reads the values of the first and second pressure i, and maintains the values constant. Equipped with a decision device that determines whether the workpiece is good or bad when the value has settled down, it can be used immediately for both low-pressure tests and high-pressure tests. There is no need to change the configuration from low-pressure tests to high-pressure tests, which has the effect of improving test efficiency.
また、本発明によるときは、水漏れ試験の際、前記従来
装2のように、ワーク内の水圧を所定の試験圧に正確に
調整しなくても、その近傍の検査圧に落ち付いたことを
確認しさえずれば正確な試験を行なうことができる効果
を有する。Furthermore, when performing a water leak test, the water pressure inside the workpiece does not need to be accurately adjusted to a predetermined test pressure as in the conventional system 2, but the test pressure settles to a test pressure in the vicinity of the predetermined test pressure. This has the effect of making it possible to perform accurate tests by confirming and chirping.
第1図は本発明装置の実施の1例を示す説明線図、第2
図は本発明装置の判定器の実施の1例を示すブロック図
、第3図は本発明装置の作動の1例を示す説明図、第4
図は従来装置の説明線図である。FIG. 1 is an explanatory diagram showing one example of implementation of the device of the present invention, and FIG.
The figure is a block diagram showing an example of implementation of the determiner of the device of the present invention, FIG. 3 is an explanatory diagram showing an example of the operation of the device of the present invention, and FIG.
The figure is an explanatory diagram of a conventional device.
Claims (1)
管路に、第1開閉弁とその上流側の第2開閉弁とを介設
し、該管路の該第1・第2開閉弁間に水圧発生器を接続
すると共に、該管路の該ワークと該第1開閉弁との間に
、高圧用の第1圧力計と第3開閉弁を介した低圧用の第
2圧力計とを互いに並列に接続し、さらに該第1・第2
・第3開閉弁を開閉制御し且つ該第1・第2圧力計の実
測値を一定時間読み込み、該一定時間内の圧力減少値を
内部で設定された低圧試験時の圧力減少値及び高圧試験
時の圧力減少値と比較して該ワークの良・不良を判定す
る判定器を設けたことを特徴とする水漏れ試験装置。A first on-off valve and a second on-off valve on the upstream side thereof are interposed in a pipe line that connects a water heater or other workpiece to a pump that pumps water, and the first and second on-off valves of the pipe line are provided with a first on-off valve and a second on-off valve on the upstream side thereof. A water pressure generator is connected in between, and a first pressure gauge for high pressure and a second pressure gauge for low pressure are connected between the workpiece of the pipeline and the first on-off valve. are connected in parallel with each other, and the first and second
・Control the opening and closing of the third on-off valve, read the actual measured values of the first and second pressure gauges for a certain period of time, and calculate the internally set pressure reduction value during the low pressure test and the high pressure test. 1. A water leakage testing device characterized by being provided with a determining device that determines whether the workpiece is good or bad by comparing it with a pressure reduction value at the time of the test.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60151264A JPS6214033A (en) | 1985-07-11 | 1985-07-11 | Water leak tester |
KR1019860002653A KR890004368B1 (en) | 1985-07-11 | 1986-04-08 | Checking of leakage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60151264A JPS6214033A (en) | 1985-07-11 | 1985-07-11 | Water leak tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6214033A true JPS6214033A (en) | 1987-01-22 |
JPH0263175B2 JPH0263175B2 (en) | 1990-12-27 |
Family
ID=15514860
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60151264A Granted JPS6214033A (en) | 1985-07-11 | 1985-07-11 | Water leak tester |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS6214033A (en) |
KR (1) | KR890004368B1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01184281A (en) * | 1988-01-14 | 1989-07-21 | Tanaka Kikinzoku Kogyo Kk | Chemical etching method with iodine |
JPH01253628A (en) * | 1988-04-01 | 1989-10-09 | Takachiho Seiki Kk | Method and apparatus for measuring leak from package |
US5757344A (en) * | 1991-09-30 | 1998-05-26 | Kabushiki Kaisha Kobe Seiko Sho | Cold cathode emitter element |
-
1985
- 1985-07-11 JP JP60151264A patent/JPS6214033A/en active Granted
-
1986
- 1986-04-08 KR KR1019860002653A patent/KR890004368B1/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01184281A (en) * | 1988-01-14 | 1989-07-21 | Tanaka Kikinzoku Kogyo Kk | Chemical etching method with iodine |
JPH01253628A (en) * | 1988-04-01 | 1989-10-09 | Takachiho Seiki Kk | Method and apparatus for measuring leak from package |
US5757344A (en) * | 1991-09-30 | 1998-05-26 | Kabushiki Kaisha Kobe Seiko Sho | Cold cathode emitter element |
Also Published As
Publication number | Publication date |
---|---|
KR890004368B1 (en) | 1989-10-31 |
JPH0263175B2 (en) | 1990-12-27 |
KR870001462A (en) | 1987-03-13 |
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