JPS62140313U - - Google Patents
Info
- Publication number
- JPS62140313U JPS62140313U JP2702286U JP2702286U JPS62140313U JP S62140313 U JPS62140313 U JP S62140313U JP 2702286 U JP2702286 U JP 2702286U JP 2702286 U JP2702286 U JP 2702286U JP S62140313 U JPS62140313 U JP S62140313U
- Authority
- JP
- Japan
- Prior art keywords
- gauge
- light beam
- mirror
- test piece
- position sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 3
Description
第１図は本考案の１実施例をあらわす構成説明
図、第２図は計測部の構成を示すブロツク図、第
３図は従来例をあらわす構成説明図である。
１……標点間距離測定装置、２……試験片、３
，６……全反射ミラー、４……ハーフミラー、７
……光源、８……位置センサ、１０……計測装置
。
FIG. 1 is a configuration explanatory diagram showing one embodiment of the present invention, FIG. 2 is a block diagram showing the configuration of a measuring section, and FIG. 3 is a configuration explanatory diagram showing a conventional example. 1... Gauge distance measuring device, 2... Test piece, 3
, 6... Total reflection mirror, 4... Half mirror, 7
...Light source, 8...Position sensor, 10...Measuring device.
Claims (1)
して設置されるミラーと、他方の標点に該ミラー
と平行して設置されるハーフミラーと、該ハーフ
ミラーの透過若しくは反射光を１８０度折返すよ
うに設置される全反射ミラーと、標点のどちらか
一方に直角に光ビームを照射する光源と、該光源
から一方の標点に入射され前記各ミラーを経て他
方の標点から出射される光ビームが入射する位置
センサと、該位置センサの出力から光源と位置セ
ンサへの入射位置との間隔を求めて標点間距離と
して出力する計測装置とを備えてなる試験片の標
点間距離測定装置。 A mirror installed at one gauge point of the test piece at an angle of 45 degrees with respect to the test piece, a half mirror installed parallel to the mirror at the other gauge point, and a mirror that transmits or reflects light from the half mirror. A total reflection mirror installed to turn back 180 degrees, a light source that irradiates a light beam perpendicularly to one of the gauge points, and a light beam that is incident from the light source to one gauge point and passes through each of the mirrors to the other gauge point. A test piece comprising a position sensor into which a light beam emitted from the light beam enters, and a measuring device that calculates the distance between the light source and the position of incidence on the position sensor from the output of the position sensor and outputs it as the gauge distance. Gauge distance measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2702286U JPH0439522Y2 (en) | 1986-02-25 | 1986-02-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2702286U JPH0439522Y2 (en) | 1986-02-25 | 1986-02-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62140313U true JPS62140313U (en) | 1987-09-04 |
| JPH0439522Y2 JPH0439522Y2 (en) | 1992-09-16 |
Family
ID=30828663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2702286U Expired JPH0439522Y2 (en) | 1986-02-25 | 1986-02-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0439522Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6435203A (en) * | 1987-06-19 | 1989-02-06 | Schenck Ag Carl | Method and apparatus for measuring deformation of test piece for material tester |
| JPH01167635A (en) * | 1987-11-27 | 1989-07-03 | Carl Schenck Ag | Method and apparatus for measuring deformation of test piece or object to be inspected for tester |
| WO2016129052A1 (en) * | 2015-02-10 | 2016-08-18 | 中国電力株式会社 | Strain measurement method and strain measurement system |
-
1986
- 1986-02-25 JP JP2702286U patent/JPH0439522Y2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6435203A (en) * | 1987-06-19 | 1989-02-06 | Schenck Ag Carl | Method and apparatus for measuring deformation of test piece for material tester |
| JPH01167635A (en) * | 1987-11-27 | 1989-07-03 | Carl Schenck Ag | Method and apparatus for measuring deformation of test piece or object to be inspected for tester |
| WO2016129052A1 (en) * | 2015-02-10 | 2016-08-18 | 中国電力株式会社 | Strain measurement method and strain measurement system |
| JP6090538B2 (en) * | 2015-02-10 | 2017-03-08 | 中国電力株式会社 | Strain measuring method and strain measuring system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0439522Y2 (en) | 1992-09-16 |
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