JPS62137571A - 布線検査方式 - Google Patents

布線検査方式

Info

Publication number
JPS62137571A
JPS62137571A JP60279716A JP27971685A JPS62137571A JP S62137571 A JPS62137571 A JP S62137571A JP 60279716 A JP60279716 A JP 60279716A JP 27971685 A JP27971685 A JP 27971685A JP S62137571 A JPS62137571 A JP S62137571A
Authority
JP
Japan
Prior art keywords
patterns
resistors
pattern
circuit
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60279716A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0548866B2 (enrdf_load_stackoverflow
Inventor
Nobuyuki Naruo
成尾　信之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60279716A priority Critical patent/JPS62137571A/ja
Publication of JPS62137571A publication Critical patent/JPS62137571A/ja
Publication of JPH0548866B2 publication Critical patent/JPH0548866B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP60279716A 1985-12-11 1985-12-11 布線検査方式 Granted JPS62137571A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60279716A JPS62137571A (ja) 1985-12-11 1985-12-11 布線検査方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60279716A JPS62137571A (ja) 1985-12-11 1985-12-11 布線検査方式

Publications (2)

Publication Number Publication Date
JPS62137571A true JPS62137571A (ja) 1987-06-20
JPH0548866B2 JPH0548866B2 (enrdf_load_stackoverflow) 1993-07-22

Family

ID=17614884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60279716A Granted JPS62137571A (ja) 1985-12-11 1985-12-11 布線検査方式

Country Status (1)

Country Link
JP (1) JPS62137571A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0242368A (ja) * 1988-08-02 1990-02-13 Nec Corp 布線検査方式
JPH0391720A (ja) * 1989-09-04 1991-04-17 Sharp Corp 異方性導電膜の貼付装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0242368A (ja) * 1988-08-02 1990-02-13 Nec Corp 布線検査方式
JPH0391720A (ja) * 1989-09-04 1991-04-17 Sharp Corp 異方性導電膜の貼付装置

Also Published As

Publication number Publication date
JPH0548866B2 (enrdf_load_stackoverflow) 1993-07-22

Similar Documents

Publication Publication Date Title
JP2630846B2 (ja) 電気回路の試験
JPS62137571A (ja) 布線検査方式
JPH0242368A (ja) 布線検査方式
JP4417762B2 (ja) 回路配線検査方法およびその装置
JP3145506B2 (ja) ４線式抵抗測定の接続試験方法及びその方法が実施できる４線式抵抗測定器
JP3566205B2 (ja) 電気構成群のテスト方法
JPH0333665A (ja) プリント配線板の導体欠陥検査装置
JP3950713B2 (ja) 回路配線検査方法およびその装置
JPS63314475A (ja) 導通検査装置
KR0179093B1 (ko) 테스트 어댑터 보드 체크기
JP4107897B2 (ja) 回路配線検査方法
RU94032784A (ru) Способ контроля работоспособности цепей сбора измерительной информации
JPS63252271A (ja) 半導体検査装置
KR20010061435A (ko) 다중심선케이블점검장치
JPH10300823A (ja) プローバの点検方法
JPH01199173A (ja) 静電容量測定式基板検査装置
JPH0411180Y2 (enrdf_load_stackoverflow)
JPH0534583U (ja) 四端子測定回路
JPS6317015Y2 (enrdf_load_stackoverflow)
JPH01242973A (ja) 回路基板パターンのオープン・ショート検査方法
JPH04355378A (ja) コンタクトプローブ接触確認法
JPS63256872A (ja) ２点間測定式導通試験器
JPH0277666A (ja) 配線の試験方法
JPH0650785Y2 (ja) Ｌａｎ用ケーブルの検査装置
JP3268848B2 (ja) メータの異常検出装置