JPS62127677A - 部品の温度試験装置 - Google Patents
部品の温度試験装置Info
- Publication number
- JPS62127677A JPS62127677A JP26878085A JP26878085A JPS62127677A JP S62127677 A JPS62127677 A JP S62127677A JP 26878085 A JP26878085 A JP 26878085A JP 26878085 A JP26878085 A JP 26878085A JP S62127677 A JPS62127677 A JP S62127677A
- Authority
- JP
- Japan
- Prior art keywords
- duct
- cover
- parts
- preheating
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010438 heat treatment Methods 0.000 title claims abstract description 11
- 238000012360 testing method Methods 0.000 abstract description 21
- 230000005494 condensation Effects 0.000 abstract description 7
- 238000009833 condensation Methods 0.000 abstract description 7
- 238000002347 injection Methods 0.000 abstract description 2
- 239000007924 injection Substances 0.000 abstract description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26878085A JPS62127677A (ja) | 1985-11-29 | 1985-11-29 | 部品の温度試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26878085A JPS62127677A (ja) | 1985-11-29 | 1985-11-29 | 部品の温度試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62127677A true JPS62127677A (ja) | 1987-06-09 |
JPH0335630B2 JPH0335630B2 (enrdf_load_stackoverflow) | 1991-05-28 |
Family
ID=17463182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26878085A Granted JPS62127677A (ja) | 1985-11-29 | 1985-11-29 | 部品の温度試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62127677A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008142754A1 (ja) * | 2007-05-18 | 2008-11-27 | Advantest Corporation | 電子部品試験装置及び電子部品試験方法 |
JP2013152094A (ja) * | 2012-01-24 | 2013-08-08 | Shibuya Kogyo Co Ltd | 物品検査装置および当該物品検査装置を備えた物品分類装置 |
-
1985
- 1985-11-29 JP JP26878085A patent/JPS62127677A/ja active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008142754A1 (ja) * | 2007-05-18 | 2008-11-27 | Advantest Corporation | 電子部品試験装置及び電子部品試験方法 |
JPWO2008142754A1 (ja) * | 2007-05-18 | 2010-08-05 | 株式会社アドバンテスト | 電子部品試験装置及び電子部品試験方法 |
JP2013152094A (ja) * | 2012-01-24 | 2013-08-08 | Shibuya Kogyo Co Ltd | 物品検査装置および当該物品検査装置を備えた物品分類装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0335630B2 (enrdf_load_stackoverflow) | 1991-05-28 |
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