JPS62127677A - 部品の温度試験装置 - Google Patents

部品の温度試験装置

Info

Publication number
JPS62127677A
JPS62127677A JP26878085A JP26878085A JPS62127677A JP S62127677 A JPS62127677 A JP S62127677A JP 26878085 A JP26878085 A JP 26878085A JP 26878085 A JP26878085 A JP 26878085A JP S62127677 A JPS62127677 A JP S62127677A
Authority
JP
Japan
Prior art keywords
duct
cover
parts
preheating
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26878085A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0335630B2 (enrdf_load_stackoverflow
Inventor
Takuya Hosoda
細田　卓谷
Masayuki Ishii
政幸 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP26878085A priority Critical patent/JPS62127677A/ja
Publication of JPS62127677A publication Critical patent/JPS62127677A/ja
Publication of JPH0335630B2 publication Critical patent/JPH0335630B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP26878085A 1985-11-29 1985-11-29 部品の温度試験装置 Granted JPS62127677A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26878085A JPS62127677A (ja) 1985-11-29 1985-11-29 部品の温度試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26878085A JPS62127677A (ja) 1985-11-29 1985-11-29 部品の温度試験装置

Publications (2)

Publication Number Publication Date
JPS62127677A true JPS62127677A (ja) 1987-06-09
JPH0335630B2 JPH0335630B2 (enrdf_load_stackoverflow) 1991-05-28

Family

ID=17463182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26878085A Granted JPS62127677A (ja) 1985-11-29 1985-11-29 部品の温度試験装置

Country Status (1)

Country Link
JP (1) JPS62127677A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008142754A1 (ja) * 2007-05-18 2008-11-27 Advantest Corporation 電子部品試験装置及び電子部品試験方法
JP2013152094A (ja) * 2012-01-24 2013-08-08 Shibuya Kogyo Co Ltd 物品検査装置および当該物品検査装置を備えた物品分類装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008142754A1 (ja) * 2007-05-18 2008-11-27 Advantest Corporation 電子部品試験装置及び電子部品試験方法
JPWO2008142754A1 (ja) * 2007-05-18 2010-08-05 株式会社アドバンテスト 電子部品試験装置及び電子部品試験方法
JP2013152094A (ja) * 2012-01-24 2013-08-08 Shibuya Kogyo Co Ltd 物品検査装置および当該物品検査装置を備えた物品分類装置

Also Published As

Publication number Publication date
JPH0335630B2 (enrdf_load_stackoverflow) 1991-05-28

Similar Documents

Publication Publication Date Title
US7084655B2 (en) Burn-in test apparatus for BGA packages using forced heat exhaust
KR101183713B1 (ko) 캡슐 생성
JPS62127677A (ja) 部品の温度試験装置
JP2017041642A (ja) 半導体ウェーハの検査装置及び半導体ウェーハの検査方法
KR940003238B1 (ko) 역류 납땜장치
KR950015683A (ko) 와이어 본딩장치
FI90044B (fi) Foerfarande foer boejning och haerdning av glasskiva
KR920702179A (ko) 열처리장치 및 이것을 사용한 기능성 박막의 건조방법
JPH06335655A (ja) 熱処理炉
JPS62132328A (ja) ウエハ搬送装置
JP6011900B1 (ja) プローバ
JPH02137691A (ja) リフロー装置
JPS5844974B2 (ja) 破断用等の材料試験装置
SE8300968D0 (sv) Improved load handling apparatus
JP2531024Y2 (ja) セラミック基板の共晶加熱ボンディング装置
JP2018530746A (ja) 試験接触子構成の試験接触子を除去するための装置
TR23995A (tr) Giyecek esyalarini uetueleme usulue ve bu usulue tat- bik etmek icin cihaz
KR101633962B1 (ko) 온도제어기능을 갖는 시편홀더장치, 이를 이용한 시편 열처리 및 표면분석 장치
CN221465642U (zh) 一种用于合金电阻的温漂测试装置
SE0003297L (sv) Sätt och anordning för presshärdning
FR2402629A1 (fr) Procede et appareil de sechage d'articles de ceramique
JPH0737309Y2 (ja) 拡散炉
JPH0435814Y2 (enrdf_load_stackoverflow)
JPS59140231A (ja) 貫通孔を有する樹脂成形品の塗装乾燥方法
JPH021561U (enrdf_load_stackoverflow)