JPS62112324A - Manufacture of x-ray mask - Google Patents
Manufacture of x-ray maskInfo
- Publication number
- JPS62112324A JPS62112324A JP60250849A JP25084985A JPS62112324A JP S62112324 A JPS62112324 A JP S62112324A JP 60250849 A JP60250849 A JP 60250849A JP 25084985 A JP25084985 A JP 25084985A JP S62112324 A JPS62112324 A JP S62112324A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- holding
- ray mask
- ring
- support ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
この発明は、X線露光に使用されるX線マスクの製作方
法に関し、特にマスク基板と基板支持リングとの接着方
法に関するものでおる。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for manufacturing an X-ray mask used for X-ray exposure, and particularly to a method for bonding a mask substrate and a substrate support ring.
(従来の技術)
一般に、X線マスクは、シリコン基板(Xmマスク基板
)上にBN膜あるいはStN膜などのベース膜を形成し
、このペース膜上にX線吸収体の・々ターンを形成して
製作されるが、当然のごとく、シリコン基板は、枠部を
残して、X線露光領域のシリコンがエツチング除去され
る。この時、始めにシリコン基板を基板支持リングに貼
υ付け、その後シリコンのエツチング除去が行われる。(Prior art) In general, an X-ray mask consists of forming a base film such as a BN film or an StN film on a silicon substrate (Xm mask substrate), and forming turns of an X-ray absorber on this pace film. However, as a matter of course, the silicon substrate in the X-ray exposed area is etched away, leaving the frame. At this time, the silicon substrate is first attached to the substrate support ring, and then the silicon is removed by etching.
これは(基板を支持リングに貼り付けることは)、X線
吸収体のベース膜が厚さ数μmのメンプランであるので
、補強並びに平面精度の向上を目的にしてである。This (attaching the substrate to the support ring) is for the purpose of reinforcement and improvement of planar accuracy, since the base film of the X-ray absorber is a membrane with a thickness of several μm.
従来、上記のようにシリコン基板を基板支持リングに貼
り付けるには、感光性樹脂などの液体接着剤を支持リン
グに単に滴下または塗布した状態で、単なる貼p付けを
行っていた。Conventionally, in order to attach a silicon substrate to a substrate support ring as described above, a liquid adhesive such as a photosensitive resin was simply dropped or applied onto the support ring, and the silicon substrate was simply pasted.
(発明が解決しようとする問題点)
しかるに、このような方法では、感光性樹脂(液体接着
剤)の盈りむらとシリコン基板自身の反りにより、貼り
付け、シリコン不要部分エツチング除去後のベース膜平
面精度が向上しないという技術的欠点がちった。(Problems to be Solved by the Invention) However, in such a method, unevenness of the photosensitive resin (liquid adhesive) and warping of the silicon substrate itself may cause the base film to deteriorate after pasting and etching away unnecessary parts of the silicon substrate. The technical drawback was that the plane accuracy did not improve.
この発明は、以上述べた塗りむらと反りの問題点を除去
し、ベース膜平面精度の浸れたX線マスク製作の方法を
提供することを目的とする。It is an object of the present invention to provide a method of manufacturing an X-ray mask that eliminates the above-mentioned problems of uneven coating and warpage and that improves the plane accuracy of the base film.
(問題点を解決するための手段)
この発明は、X線マスク製作におけるX線マスク基板と
基板支持リングの貼υ付は工程において、X線マスク基
板と基板支持リングを2つの保持回転機構体に吸着して
、同心的に等速度で別々に回転させながら、基板支持リ
ング上に塗布した液体接着剤が遠心力で均一になった後
に、片方の保持回転機構体を移動させてX線マスク基板
と基板支持リングを貼シ付けるようにしたものである。(Means for Solving the Problems) This invention provides a method for attaching an X-ray mask substrate and a substrate support ring in the manufacturing process of an X-ray mask using two holding and rotating mechanisms. After the liquid adhesive applied to the substrate support ring becomes uniform due to centrifugal force while rotating separately concentrically at the same speed, one holding rotation mechanism is moved to remove the X-ray mask. The board and board support ring are pasted together.
(作用)
このようなこの発明の方法では、塗布された液体接着剤
は遠心力で均一になっておシ、またX線マスク基板は保
持回転機構体に吸着されて反シは矯正されている。そし
て、この状態で貼り付けが行われるので、平面精度の良
いxlマスク基板貼υ付けを行うことができる。(Function) In the method of the present invention, the applied liquid adhesive becomes uniform due to centrifugal force, and the X-ray mask substrate is attracted to the holding rotation mechanism, so that the unevenness is corrected. . Since the pasting is performed in this state, the XL mask substrate can be pasted with good planar accuracy.
(実施例) 以下この発明の実施例を図面を参照して説明する。(Example) Embodiments of the present invention will be described below with reference to the drawings.
第1図は、この発明の第1の実施例に用いられる貼シ伺
は装置を示す断面図である。この図において、1.2は
内・外に同軸状に設けられた第1゜第2の保持回転機構
体であシ、各々は、それぞれの中心軸1m、2aに連結
された図示しない駆動機構により別個に回転駆動される
ようになっている。また、内側の第1の保持回転機構体
1は昇降可能であ勺、さらにシリコン基板3(X線マス
ク基板)を、その周辺部を外側に鍔状に突出させた状態
で真空吸着保持できるようになっている。これに対して
、外側の第2の保持回転機構体2は、前記第1の保持回
転機構体】上のシリコン基板3と同心的に基板支持リン
グ4を真空吸着保持できるものであゃ、この第2の保持
回転機構体2土に基板支持リング4を保持した時、該基
板支持リング4は、前記第1の保持回転機構体l上のシ
リフン基板3の周辺部(第1の保持回転機構体1の外側
に鍔状に突出している)と上下に重なる位置関係にある
。FIG. 1 is a sectional view showing a pasting device used in a first embodiment of the present invention. In this figure, reference numeral 1.2 denotes a first and a second holding and rotating mechanism body provided coaxially on the inside and outside. It is designed to be rotated separately by. In addition, the first holding rotation mechanism 1 on the inside can be raised and lowered, and furthermore, it can hold the silicon substrate 3 (X-ray mask substrate) by vacuum suction with its peripheral portion protruding outward in the form of a brim. It has become. On the other hand, if the outer second holding/rotating mechanism 2 is capable of holding the substrate support ring 4 by vacuum suction concentrically with the silicon substrate 3 above the first holding/rotating mechanism. When the substrate support ring 4 is held on the second holding/rotating mechanism 2, the substrate supporting ring 4 is attached to the peripheral part of the silicon substrate 3 on the first holding/rotating mechanism 1 (first holding/rotating mechanism 2). (projecting like a brim to the outside of the body 1) and are in a vertically overlapping positional relationship.
このような装置を用いて実施されるこの発明の第1の実
施例について述べる。まず、基板支持リング4を第2の
保持回転機構体2に、またシリコン基板3を第1の保持
回転機構体1にそれぞれ真空吸着で保持させる。この時
、第1の保持回転機構体lは上昇した状態にあり、した
がって、シリコン基板3と基板支持リング4は、シIJ
、Iン基板3が上、基板支持リング4が下で距離を隔
てて上下に重なって同心的に位置する。その後、図示し
ない駆動機構を動作させることによシ、第1.第2の保
持回転機構体1.2すなわちシリコン基板3と基板支持
リング4を等速度で回転させる。そして、このように等
速度で回転させながら、基板支持リング4上に感光性樹
脂5(液体接着剤)を塗布する。すると、塗布された感
光性樹脂5は遠心力で均一となる。そして、感光性樹脂
5が均一となったならば、第1の保持回転機構体lを下
降させ、シリコン基板30周辺部を基板支持リング4に
重ねることにより、シリコン基板3と基板支持リング4
との貼p付けを行う。この時、感光性樹脂5は、前述の
ように遠心力で均一になっている。また、シリコン基板
3は、第1の保持回転機構体IK真空吸着されているた
め、反シは矯正されている。したがって、平面精度の良
いシリコン基板貼シ付けが行われることになる。A first embodiment of the present invention implemented using such an apparatus will be described. First, the substrate support ring 4 is held by the second holding/rotating mechanism 2, and the silicon substrate 3 is held by the first holding/rotating mechanism 1 by vacuum suction. At this time, the first holding/rotating mechanism l is in a raised state, and therefore the silicon substrate 3 and the substrate support ring 4 are
, the I-in board 3 is on the top, and the board support ring 4 is on the bottom, which are vertically stacked and concentrically located with a distance between them. Thereafter, by operating a drive mechanism (not shown), the first. The second holding/rotating mechanism 1.2, that is, the silicon substrate 3 and the substrate support ring 4 are rotated at a constant speed. Then, the photosensitive resin 5 (liquid adhesive) is applied onto the substrate support ring 4 while rotating at a constant speed in this manner. Then, the applied photosensitive resin 5 becomes uniform due to centrifugal force. When the photosensitive resin 5 becomes uniform, the first holding and rotating mechanism 1 is lowered and the peripheral portion of the silicon substrate 30 is overlapped with the substrate support ring 4.
Paste the page. At this time, the photosensitive resin 5 is made uniform by centrifugal force as described above. Further, since the silicon substrate 3 is vacuum-adsorbed by the first holding and rotating mechanism IK, the warp is corrected. Therefore, the silicon substrate can be pasted with good planar accuracy.
第2図は、この発明の第2の実施例に使用される貼り付
は装置を示す断面図である。この装置では、第1の保持
回転機構体1の真空吸着部層面に発熱体6、中心軸1a
上部に断熱材7が取付けられておシ、その他は第1図の
装置と同一である。FIG. 2 is a cross-sectional view of a pasting device used in a second embodiment of the invention. In this device, a heating element 6 is provided on the layer surface of the vacuum suction part of the first holding/rotating mechanism 1, and a central axis 1a
A heat insulating material 7 is attached to the top, and the rest is the same as the device shown in FIG.
この装置を用いて実施する第2の実施例においでは、第
1の保持回転機構体l上のシリコン基板3を予め発熱体
6によ9加熱膨張させる。そして、その状態で、第1の
実施例と同様にして、シリコン基板3と基板支持リング
4との貼り付けを行う。In the second embodiment carried out using this apparatus, the silicon substrate 3 on the first holding/rotating mechanism 1 is heated and expanded by a heating element 6 in advance. Then, in this state, the silicon substrate 3 and the substrate support ring 4 are attached in the same manner as in the first embodiment.
すると、貼夛付は後、室温に戻った時、シリコン基板3
には残留応力が発生している。そのため、シリコン不要
部分のエツチング除去後のベース膜平面精度のより一層
の向上が期待できる。Then, after pasting, when the temperature returned to room temperature, the silicon substrate 3
Residual stress is generated. Therefore, it is expected that the plane precision of the base film will be further improved after the unnecessary silicon portions are removed by etching.
なお、上記第2の実施例では、シリコン基板3を加熱膨
張させたが、冷却収縮させてもよい5また、シリコン基
板3の代わ勺に、基板支持リング4を加熱または冷却し
てもよい。このように、シリコン基板3または基板支持
リング4を選択的に加熱または冷却できるのは、シリコ
ン基板3と基板支持リング4をそれぞれ別々の回転機構
体に保持されているからである。In the second embodiment, the silicon substrate 3 is heated and expanded, but may be cooled and contracted.Furthermore, the substrate support ring 4 may be heated or cooled instead of the silicon substrate 3. The reason why the silicon substrate 3 or the substrate support ring 4 can be selectively heated or cooled in this way is that the silicon substrate 3 and the substrate support ring 4 are each held by separate rotating mechanisms.
(発明の効果)
以上詳細に説明したように、この発明のX線マスク製作
方法によれば、塗布された液体接着剤は遠心力で均一化
され、またX線マスク基板は保持回転機構体に吸着され
て反りは矯正されておシ、そして、その状態で貼り付け
が行われるので、平面精度の良いシリコン基板貼夛付け
を行うことができる。(Effects of the Invention) As explained in detail above, according to the X-ray mask manufacturing method of the present invention, the applied liquid adhesive is made uniform by centrifugal force, and the X-ray mask substrate is held by the holding rotation mechanism. Since the silicon substrate is adsorbed, the warpage is corrected, and the bonding is performed in that state, the silicon substrate can be bonded with good planar accuracy.
(図面)
第1図はこの発明のX線マスク製作方法の第1の実施例
に使用される貼シ付は装置を示す断面図、第2図はこの
発明の第2の実施例に使用される貼υ付は装置を示す断
面図である。
l・・・第1の保持回転機構体、2・・・第2の保持回
転機構体、3・・・シリコン基板、4・・一基板支持リ
ング、5・・・感光性樹脂。
七〇(Drawings) Fig. 1 is a sectional view showing a device with a sticker used in the first embodiment of the X-ray mask manufacturing method of the present invention, and Fig. 2 is a sectional view showing the device used in the second embodiment of the invention. The attached figure is a sectional view showing the device. l...First holding/rotating mechanism body, 2...Second holding/rotating mechanism body, 3...Silicon substrate, 4...One substrate support ring, 5...Photosensitive resin. seventy
Claims (1)
持回転機構体に吸着して、同心的に等速度で別々に回転
させながら、 (b)前記基板支持リング上に塗布した液体接着剤を遠
心力で均一にした後に、 (c)片方の保持回転機構体を移動させてX線マスク基
板と基板支持リングを貼り付けることを特徴とするX線
マスク製作方法。[Scope of Claims] (a) An X-ray mask substrate and a substrate support ring are attracted to two holding rotation mechanisms, and while rotating them concentrically and separately at the same speed, (b) The X-ray mask substrate and a substrate support ring are An X-ray mask manufacturing method characterized in that after the applied liquid adhesive is made uniform by centrifugal force, (c) one holding rotation mechanism is moved and an X-ray mask substrate and a substrate support ring are attached.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60250849A JPS62112324A (en) | 1985-11-11 | 1985-11-11 | Manufacture of x-ray mask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60250849A JPS62112324A (en) | 1985-11-11 | 1985-11-11 | Manufacture of x-ray mask |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62112324A true JPS62112324A (en) | 1987-05-23 |
Family
ID=17213918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60250849A Pending JPS62112324A (en) | 1985-11-11 | 1985-11-11 | Manufacture of x-ray mask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62112324A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185512A (en) * | 2009-02-12 | 2010-08-26 | Toyota Motor Corp | Wet friction plate |
US7984801B2 (en) | 2007-01-16 | 2011-07-26 | Nsk-Warner Kabushiki Kaisha | Friction plate for wet multi-plate clutch |
US8327992B2 (en) | 2005-12-20 | 2012-12-11 | Nsk-Warner K.K. | Friction plate and wet-type multi-plate clutch having such friction plate |
-
1985
- 1985-11-11 JP JP60250849A patent/JPS62112324A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8327992B2 (en) | 2005-12-20 | 2012-12-11 | Nsk-Warner K.K. | Friction plate and wet-type multi-plate clutch having such friction plate |
US8714333B2 (en) | 2005-12-20 | 2014-05-06 | Nsk-Warner K.K. | Friction plate and wet-type multi-plate clutch having such friction plate |
US7984801B2 (en) | 2007-01-16 | 2011-07-26 | Nsk-Warner Kabushiki Kaisha | Friction plate for wet multi-plate clutch |
JP2010185512A (en) * | 2009-02-12 | 2010-08-26 | Toyota Motor Corp | Wet friction plate |
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