JPS62111548U - - Google Patents
Info
- Publication number
- JPS62111548U JPS62111548U JP20178085U JP20178085U JPS62111548U JP S62111548 U JPS62111548 U JP S62111548U JP 20178085 U JP20178085 U JP 20178085U JP 20178085 U JP20178085 U JP 20178085U JP S62111548 U JPS62111548 U JP S62111548U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- detection device
- rotating
- probe
- probe holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 18
- 238000001514 detection method Methods 0.000 claims description 14
- 239000003990 capacitor Substances 0.000 claims description 2
- 230000008878 coupling Effects 0.000 claims description 2
- 238000010168 coupling process Methods 0.000 claims description 2
- 238000005859 coupling reaction Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims 3
- 238000003780 insertion Methods 0.000 claims 3
- 239000004020 conductor Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20178085U JPS62111548U (enrdf_load_stackoverflow) | 1985-12-27 | 1985-12-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20178085U JPS62111548U (enrdf_load_stackoverflow) | 1985-12-27 | 1985-12-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62111548U true JPS62111548U (enrdf_load_stackoverflow) | 1987-07-16 |
Family
ID=31165552
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20178085U Pending JPS62111548U (enrdf_load_stackoverflow) | 1985-12-27 | 1985-12-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62111548U (enrdf_load_stackoverflow) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57103048A (en) * | 1980-12-18 | 1982-06-26 | Tokyo Keiki Co Ltd | Signal transmitter of probe revolution type flaw detector |
| JPS6097262A (ja) * | 1983-11-02 | 1985-05-31 | Olympus Optical Co Ltd | 超音波顕微鏡 |
-
1985
- 1985-12-27 JP JP20178085U patent/JPS62111548U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57103048A (en) * | 1980-12-18 | 1982-06-26 | Tokyo Keiki Co Ltd | Signal transmitter of probe revolution type flaw detector |
| JPS6097262A (ja) * | 1983-11-02 | 1985-05-31 | Olympus Optical Co Ltd | 超音波顕微鏡 |
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