JPS62106619A - Liquid epitaxial growing process - Google Patents

Liquid epitaxial growing process

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Publication number
JPS62106619A
JPS62106619A JP24666085A JP24666085A JPS62106619A JP S62106619 A JPS62106619 A JP S62106619A JP 24666085 A JP24666085 A JP 24666085A JP 24666085 A JP24666085 A JP 24666085A JP S62106619 A JPS62106619 A JP S62106619A
Authority
JP
Japan
Prior art keywords
substrate
gaas
epitaxial growth
liquid reservoir
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24666085A
Other languages
Japanese (ja)
Inventor
Katsuji Yoshida
勝治 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP24666085A priority Critical patent/JPS62106619A/en
Publication of JPS62106619A publication Critical patent/JPS62106619A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To perform the titled epitaxial growing process while protecting the epitaxial layer forming material by a method wherein source frames with openings in the central positions are provided along inner walls of solution reservoirs. CONSTITUTION:Solution reservoirs 14 provided with source frames 17 are filled with specified amount of weighed Ga while an epitaxial growing jig comprising a fixed member 13 with a GaAs substrate 11 arranged on a cavity 12 of the fixed member 13 and a slide member 15 is led in a reaction tube and then the epitaxial growing jig is heated up at a specified temperature using a heating furnace provided around the reaction tube to melt Ga in the solution reservoirs 14 at controlled heating temperature so that the constituent GaAs in the source frames 17 may be melted in the Ga in melted solution up to the saturated amount corresponding to the temperature of melted Ga. In such a state, while further lowering the temperature in the heating furnace, the slide member 15 is shifted in the arrow A direction to coat the substrate 11 with the Ga containing the melted GaAs in the solution reservoirs 14 for epitaxial growing process.

Description

【発明の詳細な説明】 〔概要〕 ガリウム砒素(GaAs)等の化合物半導体の液相エピ
タキシャル成長法の改良であって、エピタキシャル層を
成長すべき基板の周囲に異常成長するエツジグロースの
現象を除去できるようにした液相エピタキシャル成長方
法。
[Detailed Description of the Invention] [Summary] This is an improved liquid phase epitaxial growth method for compound semiconductors such as gallium arsenide (GaAs), which can eliminate the phenomenon of edge growth in which an epitaxial layer is abnormally grown around the substrate on which it is grown. A liquid phase epitaxial growth method.

〔産業上の利用分野〕[Industrial application field]

本発明はGaAsのような化合物半導体の液相エピタキ
シャル成長方法に関する。
The present invention relates to a method for liquid phase epitaxial growth of compound semiconductors such as GaAs.

GaAsのような化合物半導体の結晶を成長する場合、
化合物半導体基板を設置する凹部を有する直方体形状の
カーボンよりなる固定部材と、この固定部材上をスライ
ドして移動し、基板上に形成すべきエピタキシャル層形
成材料の溶液を充填する貰通礼状の液溜めを有する直方
体形状のスライド部材を用意する。そしてこの固定部材
とスライド部材とからなるエピタキシャル成長用治具を
反応管内に設置し、このエピタキシャル成長用治具を加
熱することで、液溜め内のエピタキシャル成長用材料を
溶融し、この液溜めを基板上にスライドして移動させ、
加熱炉の温度を低下させて基板上にエピタキシャル層を
形成するボートスライド法による液相エピタキシャル成
長方法が用いられている。
When growing compound semiconductor crystals such as GaAs,
A fixing member made of carbon having a rectangular parallelepiped shape and having a concave portion in which a compound semiconductor substrate is placed, and a liquid solution that slides on the fixing member and fills it with a solution of an epitaxial layer forming material to be formed on the substrate. A rectangular parallelepiped-shaped slide member having a reservoir is prepared. Then, an epitaxial growth jig consisting of this fixing member and a slide member is installed in the reaction tube, and by heating this epitaxial growth jig, the epitaxial growth material in the liquid reservoir is melted, and this liquid reservoir is transferred onto the substrate. Slide and move
A liquid phase epitaxial growth method using a boat slide method is used in which an epitaxial layer is formed on a substrate by lowering the temperature of a heating furnace.

この方法は気相エピタキシャル成長方法に比して簡単な
装置を用いて行うことができ、また成長されるエピタキ
シャル結晶に発生する結晶欠陥も少なく、また結晶成長
速度も大きいため、半導体レーザ素子や、発光ダイオー
ド等の材料の化合物半導体結晶の成長に多く利用されて
いる。
This method can be performed using simpler equipment than the vapor phase epitaxial growth method, has fewer crystal defects in the grown epitaxial crystal, and has a high crystal growth rate, so it is suitable for use in semiconductor laser devices and light emitting devices. It is often used to grow compound semiconductor crystals for materials such as diodes.

このような液相エピタキシャル成長方法に於いては、エ
ピタキシャル層を形成すべき基板の周囲にエピタキシャ
ル層が異常成長するエツジグロースの現象が発生し易く
、この現象を除去できる液相エピタキシャル成長方法が
要望されている。
In such a liquid phase epitaxial growth method, the phenomenon of edge growth, in which the epitaxial layer grows abnormally around the substrate on which the epitaxial layer is to be formed, tends to occur, and there is a need for a liquid phase epitaxial growth method that can eliminate this phenomenon. There is.

〔従来の技術〕[Conventional technology]

このような液相エピタキシャル成長の従来の方法に付い
て第3図の断面図、および第3図の要部を示す平面図の
第4図、並びに第3図の要部を示す断面図の第5図を用
いて説明する。
Regarding such a conventional method of liquid phase epitaxial growth, the cross-sectional view shown in FIG. 3, FIG. 4 which is a plan view showing the main part of FIG. 3, and FIG. This will be explained using figures.

第3図乃至第5図に示すように直方体形状のカーボンよ
りなる固定部材1に凹部2を設けてその中にGaAs等
の化合物半導体基板3を設置する。一方この固定部材l
上を矢印A方向に沿ってスライドして移動し、直方体形
状の貫通孔状の液溜め4を設けた直方体形状のカーボン
よりなるスライド部材5を設けている。
As shown in FIGS. 3 to 5, a recess 2 is provided in a rectangular parallelepiped-shaped fixing member 1 made of carbon, and a compound semiconductor substrate 3 such as GaAs is placed in the recess 2. As shown in FIGS. On the other hand, this fixing member l
A slide member 5 made of carbon and having a rectangular parallelepiped shape is provided, which slides on the top in the direction of arrow A and has a liquid reservoir 4 in the form of a through hole in the shape of a rectangular parallelepiped.

この液溜め4の内壁に沿うように板状のGaAsよりな
る4枚の結晶板6A、6B、6C,6Dが設置され、こ
れ等4枚の結晶板6A、6B、6C,6Dで囲まれた内
部にはガリウム(Ga) 7が充填されている。
Four crystal plates 6A, 6B, 6C, and 6D made of plate-shaped GaAs are installed along the inner wall of this liquid reservoir 4, and surrounded by these four crystal plates 6A, 6B, 6C, and 6D. The inside is filled with gallium (Ga) 7.

このような固定部材lとスライド部材5とよりなる液相
エピタキシャル成長用治具を石英等で形成された反応管
(図示せず)の内部に導入し、この反応管8内を水素ガ
スの雰囲気とした状態で、この反応管の周囲に設けられ
ている加熱炉(図示せず)を用いて約900℃の温度に
エピタキシャル成長用治具を加熱することで、治具の液
溜め4の内部に充填されているGa7を溶融する。
A liquid phase epitaxial growth jig consisting of the fixing member 1 and the slide member 5 is introduced into a reaction tube (not shown) made of quartz or the like, and the inside of the reaction tube 8 is made into an atmosphere of hydrogen gas. In this state, the epitaxial growth jig is heated to a temperature of approximately 900°C using a heating furnace (not shown) provided around the reaction tube, thereby filling the inside of the liquid reservoir 4 of the jig. Melt the Ga7.

この熔融したGaの熔融温度を調節することで、液溜め
4の内壁に沿って設けられているGaAsの結晶板6八
、 6B、 6C,6DからGaAsが、溶融したGa
に溶解する量を決定し、この熔融GaにGaAsを熔解
して基板3上にエピタキシャル成長すべきGaAsのソ
ースを形成している。
By adjusting the melting temperature of this molten Ga, GaAs is transferred from the GaAs crystal plates 68, 6B, 6C, and 6D provided along the inner wall of the liquid reservoir 4 to the molten Ga.
A source of GaAs to be epitaxially grown on the substrate 3 is formed by melting GaAs into the molten Ga.

次いで加熱炉の温度を900℃より所定の温度勾配で低
下させ、所定の温度に到達した時にスライド部材5を矢
印A方向に沿って移動させ、基板3上に液溜め4が位置
する状態となし、基板3上にGaAsが飽和状態に溶融
したGaを設置し、更に加熱炉の温度を所定の温度にな
る迄低下させ、この低下したエピタキシャル成長温度で
、基板3上にGaAsを液相エピタキシャル成長させて
いる。
Next, the temperature of the heating furnace is lowered from 900° C. by a predetermined temperature gradient, and when the predetermined temperature is reached, the slide member 5 is moved along the direction of arrow A, so that the liquid reservoir 4 is positioned on the substrate 3. , place Ga in which GaAs is molten in a saturated state on the substrate 3, further lower the temperature of the heating furnace to a predetermined temperature, and grow GaAs on the substrate 3 by liquid phase epitaxial growth at this lowered epitaxial growth temperature. There is.

このようにして貫通孔4の内壁に沿って設置されている
GaAsの結晶板6八、6B、6G、6Dは、熔融した
Ga内にGaAsの成分を供給する役目をすると同時に
、この溶融したGaを内部に有する液溜め4が、基板3
上に設置された時に、基板3の周縁部を覆うような役目
をなし、これによって基板3の周縁部に異常成長するエ
ツジグロースの現象を除去する役目を併せて有している
The GaAs crystal plates 68, 6B, 6G, and 6D thus installed along the inner wall of the through hole 4 serve to supply the GaAs component into the molten Ga, and at the same time serve to supply the GaAs component into the molten Ga. The liquid reservoir 4 having inside the substrate 3
When placed on top, it serves to cover the peripheral edge of the substrate 3, and thereby also serves to eliminate the phenomenon of edge growth that occurs abnormally on the peripheral edge of the substrate 3.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

然し、上記した方法では、GaAsの結晶板6A、6B
However, in the above method, the GaAs crystal plates 6A, 6B
.

6C,6Dを高精度の寸法に加工仕上げする必要があり
、また液溜めの内部の寸法も高精度になるように加工す
る必要がある。
It is necessary to process and finish 6C and 6D to highly accurate dimensions, and it is also necessary to process the internal dimensions of the liquid reservoir to be highly accurate.

更に前記した結晶板6A、6B、6C,6Dを液溜め4
の内壁に沿って設置する作業が煩雑である。更に折角こ
の結晶板を液溜め4の内部に長時間を要して設置しても
結晶成長時の液溜め内の溶液の揺らぎに依って結晶板が
倒れる場合、エピタキシャル成長作業を中断する不都合
を生じる。
Further, the crystal plates 6A, 6B, 6C, and 6D described above are placed in the liquid reservoir 4.
The installation work along the inner wall is complicated. Furthermore, even if it takes a long time to install this crystal plate inside the liquid reservoir 4, if the crystal plate falls down due to fluctuations of the solution in the liquid reservoir during crystal growth, the epitaxial growth operation may be interrupted. .

また−回エビタキシャル成長をする毎に、その結晶板6
A、68.6C,6Dは溶解されるため、寸法が貫通孔
4の内壁に精度良く沿わなく成っているため、成長する
度に廃棄しているのが現状で、エピタキシャル成長をす
るコストが高くなり、形成されるエピタキシャル成長し
た基板が高価なものとなる欠点がある。
In addition, each time the crystal plate 6 undergoes repeated epitaxial growth,
Since A, 68.6C, and 6D are melted, their dimensions do not precisely match the inner wall of the through hole 4, so they are currently discarded every time they are grown, which increases the cost of epitaxial growth. However, the disadvantage is that the epitaxially grown substrate formed is expensive.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は上記した欠点を除去し、前記した結晶板が多数
回のエピタキシャル成長に使用でき、かつ貫通孔の内壁
に簡単に設置できるようにした液相エピタキシャル成長
方法を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a liquid phase epitaxial growth method that eliminates the above-mentioned drawbacks, allows the above-described crystal plate to be used for multiple epitaxial growths, and can be easily installed on the inner wall of a through hole.

本発明の液相エピタキシャル成長方法は、第1図に示す
ように、液溜め14の内壁に沿って、基板11と同一材
料で形成され、中央部に開口部16を有する枠状のソー
ス枠17を設置し、このソース枠17で液溜め14内の
エピタキシャル層形成材料を保護しながらエピタキシャ
ル成長をする。
In the liquid phase epitaxial growth method of the present invention, as shown in FIG. The source frame 17 protects the epitaxial layer forming material in the liquid reservoir 14 while epitaxial growth is performed.

〔作用〕[Effect]

本発明の液相エピタキシャル成長方法は、液溜め14内
に、基板11と同一の材料で形成された枠状のソース枠
17を設置し、この枠状のソース枠17を用いることで
スライド部材15に設ける液溜め14の寸法を厳密に加
工する必要を無(し、かつソース枠17を液溜め14内
に設置する作業を容易にし、更にこの枠状のソース枠1
7を用いることで多数回のエピタキシャル成長にも使用
できるようにし、低コストのエピタキシャル成長基板を
得るようにしたものである。
In the liquid phase epitaxial growth method of the present invention, a frame-shaped source frame 17 made of the same material as the substrate 11 is installed in the liquid reservoir 14, and by using this frame-shaped source frame 17, the slide member 15 is It is not necessary to strictly process the dimensions of the liquid reservoir 14 to be provided, and the work of installing the source frame 17 in the liquid reservoir 14 is facilitated.
By using No. 7, it can be used for multiple epitaxial growths, and a low-cost epitaxial growth substrate can be obtained.

〔実施例〕〔Example〕

以下、図面を用いて本発明の一実施例につき詳細に説明
する。
Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

第1図は本発明の液相エピタキシャル成長方法に用いる
装置の断面図で、第2図は第1図の要部を示す平面図で
ある。
FIG. 1 is a sectional view of an apparatus used in the liquid phase epitaxial growth method of the present invention, and FIG. 2 is a plan view showing the main parts of FIG. 1.

第1図および第2図に示すように本発明の方法に用いる
エピタキシャル成長用治具は、GaAs等の化合物半導
体基板11を設置する凹部12を有し、カーボンより成
り直方体形状の固定部材13と、固定部材13上を矢印
六方向に沿ってスライドして移動し、基板11上に形成
すべきエピタキシャル層形成用材料を充填する言通孔状
の液溜め14を有し、直方体形状のカーボンよりなるス
ライド部材15とよりなる。
As shown in FIGS. 1 and 2, the epitaxial growth jig used in the method of the present invention has a recess 12 in which a compound semiconductor substrate 11 such as GaAs is placed, a rectangular parallelepiped-shaped fixing member 13 made of carbon, It slides on the fixing member 13 in the six directions of arrows, has a through-hole-shaped liquid reservoir 14 filled with the epitaxial layer forming material to be formed on the substrate 11, and is made of rectangular parallelepiped carbon. It consists of a slide member 15.

更に本発明の方法に用いるエピタキシャル成長用治具に
は、第2図に示すように液溜め14の内壁に沿うような
形で中央部に開口部16を有し、基板11と同一材料で
形成された枠状のソース枠17が設置されている。この
ソース枠17は厚さが21m程度のGaAsの結晶板の
中央部を超音波カッターを用いて削り言いて加工形成す
る。
Furthermore, as shown in FIG. 2, the epitaxial growth jig used in the method of the present invention has an opening 16 in the center along the inner wall of the liquid reservoir 14, and is made of the same material as the substrate 11. A frame-shaped source frame 17 is installed. This source frame 17 is formed by cutting the center part of a GaAs crystal plate with a thickness of about 21 m using an ultrasonic cutter.

このようなソース枠17を設置した液溜め14内にG(
1を所定の分量だけ秤量して充填し、固定部材13の凹
部12内にGaAsの基板11を設置した状態で、固定
部材13とスライド部材15よりなるエピタキシャル成
長用治具を反応管(図示せず)内に導入後、反応管の周
囲に設けた加熱炉(図示せず)を用いてエピタキシャル
成長用治具を所定の温度で加熱して液溜め14内のGa
を溶融し、その加熱温度を調節してこの溶液状のGaの
内部にソース枠17のGaAsの成分をこのGaの温度
に見合う飽和量だけ溶融する。
G(
1 is weighed and filled in a predetermined amount, and with the GaAs substrate 11 installed in the recess 12 of the fixing member 13, an epitaxial growth jig consisting of the fixing member 13 and the slide member 15 is placed in a reaction tube (not shown). ), the epitaxial growth jig is heated to a predetermined temperature using a heating furnace (not shown) provided around the reaction tube, and the Ga in the liquid reservoir 14 is heated.
is melted, and the heating temperature is adjusted to melt the GaAs component of the source frame 17 into the solution of Ga in an amount corresponding to the temperature of the Ga.

この状態で更に加熱炉の温度を下降させながらスライド
部材15を矢印A方向に沿って移動させ、液溜め14を
基板11上に設置し、更に温度を降下させて基板11上
に液溜め14内のGaAsが熔解したGaを被着させて
エピタキシャル成長を行う。
In this state, the slide member 15 is moved along the direction of arrow A while further lowering the temperature of the heating furnace, and the liquid reservoir 14 is installed on the substrate 11. molten GaAs is deposited and epitaxial growth is performed.

このようにすれば、基イFj、11の周縁部には、Ga
Asのソース枠17が設置されているため、基板110
周縁部に異常にGaAsの結晶がエピタキシャル成長す
るエンジグロースの現象が防止される。
In this way, the peripheral edge of the base Fj, 11 will have Ga
Since the As source frame 17 is installed, the substrate 110
The phenomenon of edge growth, in which GaAs crystals abnormally grow epitaxially on the periphery, is prevented.

またこの使用後のソース枠17を塩酸(Hα)を用いて
エツチングすれば、容易にその周囲に付着しているGa
AsのGa成分が除去でき、数回のエピタキシャル成長
にこのソース枠17を使用することができる。
Furthermore, if the used source frame 17 is etched using hydrochloric acid (Hα), Ga attached around it can be easily etched.
The Ga component of As can be removed, and this source frame 17 can be used for several epitaxial growths.

更にこのソース枠17は従来のように結晶板の状態でな
く枠状に成っているため、液溜め内に容易に設置でき、
このソース枠の加工精度並びに液溜め14の内部の寸法
を従来程厳密に加工する必要がない。
Furthermore, since the source frame 17 is not in the form of a crystal plate as in the conventional case but in the form of a frame, it can be easily installed in the liquid reservoir.
It is not necessary to process the source frame with precision and the internal dimensions of the liquid reservoir 14 as strictly as in the past.

またエピタキシャル成長時の、液溜め内の溶液の揺らぎ
によってこのソース枠が倒れることがなく安定したエピ
タキシャル成長が行い得る。
Further, during epitaxial growth, the source frame does not collapse due to fluctuations of the solution in the liquid reservoir, and stable epitaxial growth can be performed.

また以上の実施例ではGaAs基板の上にGaAsのエ
ピタキシャル層を形成する場合に例を用いて説明したが
、その他本発明はGaAs基板の上にGaAsAlのよ
うな化合物半導体を形成するヘテロエピタキシャル成長
にも適用でき、更にGaAs基板上にこれらエピタキシ
ャル層を多層構造に形成する場合にも適用できるのは熱
論である。
Furthermore, although the above embodiments have been explained using an example in which a GaAs epitaxial layer is formed on a GaAs substrate, the present invention is also applicable to heteroepitaxial growth in which a compound semiconductor such as GaAsAl is formed on a GaAs substrate. It is a thermal theory that can be applied and further applied to the case where these epitaxial layers are formed in a multilayer structure on a GaAs substrate.

〔発明の効果〕〔Effect of the invention〕

以上述べたように本発明のエピタキシャル成長方法によ
れば、スライド部材の液溜めを従来程、高精度に形成す
る必要がない。
As described above, according to the epitaxial growth method of the present invention, it is not necessary to form the liquid reservoir of the slide member with high precision as in the conventional method.

またソース枠が数回のエピタキシャル成長に用いられる
ため、経済的である。
Moreover, since the source frame is used for several epitaxial growths, it is economical.

またソース枠が従来の結晶板を用いた場合に比して液溜
めの内壁に沿って設置されるため、ソース枠と液溜めの
内壁の間の隙間に溶融したエピタキシャル成長用材料が
入り込んで形成されるエピタキシャル層の結晶性が悪く
なる現象が避けられる。
In addition, since the source frame is installed along the inner wall of the liquid reservoir compared to the case where a conventional crystal plate is used, molten epitaxial growth material may enter the gap between the source frame and the inner wall of the liquid reservoir. The phenomenon in which the crystallinity of the epitaxial layer deteriorates can be avoided.

更にソース枠に付着した液溜め内の成分が容易にエツチ
ングにより除去できるため、ソース枠が清浄に保たれ結
晶性の良いエピタキシャル成長ができる。
Furthermore, since components in the liquid reservoir adhering to the source frame can be easily removed by etching, the source frame can be kept clean and epitaxial growth with good crystallinity can be achieved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の液相エピタキシャル成長方法に用いる
エピタキシャル成長用治具の断面図、第2図は第1図の
要部を示す斜視図、 第3図は従来の液相エピタキシャル成長方法に用いるエ
ピタキシャル成長用治具の断面図、第4図は第3図の要
部を示す平面図、 第5図は第3図の要部を示す断面図である。 図に於いて、 11は基板、12は凹部、13は固定部材、14は液溜
め、15はスライド部材、16は開口部、17はソース
枠を示す。 第 1 図 第 2 図 e/1方址、−、rfI\・シンヂ臭のf牟向図第3図
Figure 1 is a cross-sectional view of an epitaxial growth jig used in the liquid phase epitaxial growth method of the present invention, Figure 2 is a perspective view showing the main parts of Figure 1, and Figure 3 is an epitaxial growth jig used in the conventional liquid phase epitaxial growth method. A sectional view of the jig, FIG. 4 is a plan view showing the main part of FIG. 3, and FIG. 5 is a sectional view showing the main part of FIG. 3. In the figure, 11 is a substrate, 12 is a recess, 13 is a fixing member, 14 is a liquid reservoir, 15 is a slide member, 16 is an opening, and 17 is a source frame. Figure 1 Figure 2 Figure e/1 direction, -, rfI\ Shinji odor f direction Figure 3

Claims (1)

【特許請求の範囲】 基板(11)を設置する固定部材(13)と、該固定部
材(13)上をスライドして移動し、基板(11)上に
成長すべき溶液状のエピタキシャル層形成材料を収容す
る液溜め(14)を有するスライド部材(15)とより
成り、前記液溜め(14)を基板(11)上に設置して
基板(11)上にエピタキシャル層を形成する方法に於
いて、 前記液溜め(14)の内壁に沿って、基板(11)と同
一の材料で形成され、中央に開口部(16)を有する枠
状のソース枠(17)を設置し、該ソース枠(17)で
液溜め(14)内のエピタキシャル層形成材料を保護し
ながら、エピタキシャル成長することを特徴とする液相
エピタキシャル成長方法。
[Claims] A fixing member (13) on which the substrate (11) is installed, and a solution-form epitaxial layer forming material that slides on the fixing member (13) and is to be grown on the substrate (11). a slide member (15) having a liquid reservoir (14) for accommodating the liquid reservoir (14), the method for forming an epitaxial layer on the substrate (11) by installing the liquid reservoir (14) on the substrate (11). , A frame-shaped source frame (17) made of the same material as the substrate (11) and having an opening (16) in the center is installed along the inner wall of the liquid reservoir (14), and the source frame ( 17) A liquid phase epitaxial growth method characterized in that epitaxial growth is performed while protecting the epitaxial layer forming material in the liquid reservoir (14).
JP24666085A 1985-11-01 1985-11-01 Liquid epitaxial growing process Pending JPS62106619A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24666085A JPS62106619A (en) 1985-11-01 1985-11-01 Liquid epitaxial growing process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24666085A JPS62106619A (en) 1985-11-01 1985-11-01 Liquid epitaxial growing process

Publications (1)

Publication Number Publication Date
JPS62106619A true JPS62106619A (en) 1987-05-18

Family

ID=17151720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24666085A Pending JPS62106619A (en) 1985-11-01 1985-11-01 Liquid epitaxial growing process

Country Status (1)

Country Link
JP (1) JPS62106619A (en)

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