JPS62102173U - - Google Patents

Info

Publication number
JPS62102173U
JPS62102173U JP19294085U JP19294085U JPS62102173U JP S62102173 U JPS62102173 U JP S62102173U JP 19294085 U JP19294085 U JP 19294085U JP 19294085 U JP19294085 U JP 19294085U JP S62102173 U JPS62102173 U JP S62102173U
Authority
JP
Japan
Prior art keywords
circuit pattern
conductive circuit
electrical
electrical testing
testing means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19294085U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0421104Y2 (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985192940U priority Critical patent/JPH0421104Y2/ja
Publication of JPS62102173U publication Critical patent/JPS62102173U/ja
Application granted granted Critical
Publication of JPH0421104Y2 publication Critical patent/JPH0421104Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP1985192940U 1985-12-17 1985-12-17 Expired JPH0421104Y2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985192940U JPH0421104Y2 (en:Method) 1985-12-17 1985-12-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985192940U JPH0421104Y2 (en:Method) 1985-12-17 1985-12-17

Publications (2)

Publication Number Publication Date
JPS62102173U true JPS62102173U (en:Method) 1987-06-29
JPH0421104Y2 JPH0421104Y2 (en:Method) 1992-05-14

Family

ID=31148494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985192940U Expired JPH0421104Y2 (en:Method) 1985-12-17 1985-12-17

Country Status (1)

Country Link
JP (1) JPH0421104Y2 (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009264834A (ja) * 2008-04-23 2009-11-12 Hioki Ee Corp 絶縁検査装置および絶縁検査方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode
JPS61115982U (en:Method) * 1985-01-07 1986-07-22
JPS61235766A (ja) * 1985-04-11 1986-10-21 Toppan Printing Co Ltd 翻訳機

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5367878A (en) * 1976-11-29 1978-06-16 Fujitsu Ltd Device for inspecting electrode
JPS61115982U (en:Method) * 1985-01-07 1986-07-22
JPS61235766A (ja) * 1985-04-11 1986-10-21 Toppan Printing Co Ltd 翻訳機

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009264834A (ja) * 2008-04-23 2009-11-12 Hioki Ee Corp 絶縁検査装置および絶縁検査方法

Also Published As

Publication number Publication date
JPH0421104Y2 (en:Method) 1992-05-14

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