JPS61766A - 回路基板の布線試験方法およびその装置 - Google Patents
回路基板の布線試験方法およびその装置Info
- Publication number
- JPS61766A JPS61766A JP59121402A JP12140284A JPS61766A JP S61766 A JPS61766 A JP S61766A JP 59121402 A JP59121402 A JP 59121402A JP 12140284 A JP12140284 A JP 12140284A JP S61766 A JPS61766 A JP S61766A
- Authority
- JP
- Japan
- Prior art keywords
- information
- circuit board
- wiring
- section
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 23
- 239000000758 substrate Substances 0.000 title abstract description 15
- 239000000523 sample Substances 0.000 claims abstract description 42
- 238000005259 measurement Methods 0.000 claims description 41
- 238000005553 drilling Methods 0.000 claims description 17
- 238000010998 test method Methods 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000006243 chemical reaction Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59121402A JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59121402A JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61766A true JPS61766A (ja) | 1986-01-06 |
| JPH0426435B2 JPH0426435B2 (enrdf_load_stackoverflow) | 1992-05-07 |
Family
ID=14810288
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59121402A Granted JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61766A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6352019B1 (en) | 1998-07-31 | 2002-03-05 | Nok Corporation | Diaphragm actuator |
-
1984
- 1984-06-13 JP JP59121402A patent/JPS61766A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6352019B1 (en) | 1998-07-31 | 2002-03-05 | Nok Corporation | Diaphragm actuator |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0426435B2 (enrdf_load_stackoverflow) | 1992-05-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3723867A (en) | Apparatus having a plurality of multi-position switches for automatically testing electronic circuit boards | |
| EP0840130B1 (en) | Standard- and limited-access hybrid test fixture | |
| JPH02224259A (ja) | 集積回路用プローブカードを検査する方法及び装置 | |
| CN107038697A (zh) | 用于诊断半导体晶圆的方法和系统 | |
| GB2146849A (en) | Electrical test probe head assembly | |
| JPS61766A (ja) | 回路基板の布線試験方法およびその装置 | |
| JP4667679B2 (ja) | プローブカード用基板 | |
| US6194906B1 (en) | Inspection adapter board for printed board, method for inspecting printed board, and method and apparatus for producing information for fabricating the inspection adapter board | |
| US6252414B1 (en) | Method and apparatus for testing circuits having different configurations with a single test fixture | |
| JP2001235505A (ja) | 回路基板検査装置 | |
| US4328264A (en) | Method for making apparatus for testing traces on a printed circuit board substrate | |
| JP2638556B2 (ja) | プローブカードチェッカー | |
| US4734980A (en) | Printed circuit board wiring method | |
| JPH0360192B2 (enrdf_load_stackoverflow) | ||
| JPS6122268A (ja) | プリント基板検査機 | |
| JPH0333061Y2 (enrdf_load_stackoverflow) | ||
| JPH0142387B2 (enrdf_load_stackoverflow) | ||
| JPS648793B2 (enrdf_load_stackoverflow) | ||
| JP2000227451A (ja) | 回路基板検査装置 | |
| JP3047361B2 (ja) | プローブニードルの位置検出方法 | |
| JPS6042915B2 (ja) | 回路基板の布線試験方法 | |
| US20020105348A1 (en) | Electronically measuring pin-to-pad alignment using resistive pads | |
| JPH0513047U (ja) | 半導体素子検査装置 | |
| JPS638432B2 (enrdf_load_stackoverflow) | ||
| JPH0333022Y2 (enrdf_load_stackoverflow) |