JPS6162316A - Temperature malfunction processing system of electronic device - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a waste treatment method for mining heavy equipment due to temperature abnormalities caused by failure of a cooling device for electronic equipment.

[Conventional technology]

FIG. 1 is a block diagram showing a conventional temperature abnormality processing method for electronic equipment, where l is the electronic equipment, 2 is a power supply device that supplies power to l, J is an AC input power supply, da is a no-fuse breaker, 5 is a breaker trip circuit that trips the no-fuse breaker, 6 is a sensor that detects abnormally high temperatures that may cause damage to electronic equipment, signal lines that transmit drive signals for Rihase/Sutsuto, and ZA is cooling. It is a device.

Next, the operation of this conventional method will be explained. cooling device t
When the is operating normally, the contact 6a of the sensor 6 is open, so the breaker trip circuit! is not activated and the no-fuse breaker is in the closed state. This state is a case where the heavy child device 1 is operating normally.

However, if the internal temperature of the electronic device 1 becomes abnormally high due to a failure of the cooling device g of the electronic device 1, the temperature sensor 6 detects this temperature abnormality and closes the contact 6a. In response to this, a drive current flows through the signal line 7 and the breaker
trip circuit, tripping the no-fuse breaker and disabling power to the AC input power source and power supply. Therefore, the power supply is shut off and the operation of the electronic device is stopped.

This series of operations prevents the destruction of electronic equipment and the occurrence of disasters.

Since the conventional temperature abnormality processing method is configured and operated as described above, it has the disadvantage that the electronic device suddenly stops operating without issuing a second warning to the operator when the temperature is abnormal. was there.

Furthermore, it has been impossible to restore a malfunctioning cooling device while keeping the electronic equipment in operation.

[Summary of the invention]

This invention was made in order to eliminate the drawbacks of the conventional method as described above, and the internal temperature of electronic equipment is abnormally high.
By installing a sensor that detects the temperature in front of the RX filtration filter and a warning device for the operator, the operator can be informed of abnormally high temperatures in advance. Furthermore, a delay circuit for the temperature sensor output and a no-fuse breaker are combined. This provides a processing method that can protect electronic devices from fatal failures when the cooling system cannot be restored.

[Embodiments of the invention]

A simple embodiment of this invention will be described below. In Figure 2, 9 is a temperature sensor that detects the temperature of electronic equipment l, which detects that the temperature is not high enough to cause fatal damage to the electronic equipment l, but is higher than the normal temperature. It acts as a means. IO is a light emitting diode driven by the temperature sensor and serves as a warning means for the operator. // is the output signal line of the temperature sensor sub. Reference numeral 12 denotes a circuit that delays the output signal fat/ from the temperature sensor by, for example, several minutes to several tens of minutes, that is, a delay means.

Reference numeral 13 denotes an output signal line of the slow-down circuit. /4t is a relay driven by the delay circuit 12.

13 is an output signal of relay 7, which drives breaker trip circuit j. Note that the same reference numerals as in FIG. 1 indicate the same or corresponding parts.

Next, the operation of the above embodiment will be explained.

When the cooling device t is operating normally, the temperature sensor sub detects no temperature abnormality, and neither the light emitting diode 10 nor the delay circuit l is operated.

However, if the cooling device g malfunctions and the internal temperature of the electronic device l begins to rise, the temperature sensor? detects a predetermined high temperature and drives the light emitting diode 10 and the delay circuit l through the signal line //. At this time, the operator becomes aware of the temperature abnormality in the electronic device 1 by turning on the light emitting diode 10, and can recover by replacing the failed cooling system AT while leaving the electronic device 1 in operation. be.

In this case, when the contact point a of the temperature sensor sub changes from closed to open and the abnormality occurrence signal is no longer transmitted from the signal line //, the delay circuit l is reset and no output is output to the signal line /J. Furthermore, if the cooling system cannot be restored due to the absence of an operator, the internal temperature of the electronic device will further rise, and after a certain period of time it will reach a high enough temperature to cause a fatal failure. After a certain period of time, the delay circuit 1 closes the relay 744 through the signal line 13. The output signal /j of relay /e trips the no-fuse breaker, shutting down the power supply and the AC input power source.

This protects the electronic device l from the occurrence of a fatal failure.

In the above embodiment, a light emitting diode io is provided as a warning device, but a bell, a buzzer, or the like may be used as a means to notify the operator of the occurrence of an abnormal situation. Further, when the cooling device t is a fan, the temperature sensor sub may be a rotary sensor which can be attached to the fan. In addition, if the electronic device l in the above embodiment is an electronic computer, the signal line/
By making the signal above / available as an interrupt input for the computer, it is possible to handle temperature abnormalities flexibly according to the installation status, environment, etc. using an appropriate program.

〔Effect of the invention〕

As described above, according to the present invention, a means is provided to give a warning to the operator regarding temperature abnormality processing in electronic equipment, and furthermore, if the cooling system cannot be restored, the system is configured to provide a means for warning the operator after a certain period of time from the occurrence of the warning. Since the electronic equipment is configured to stop operating, it has the effect of achieving extremely high reliability and availability.

[Brief explanation of drawings]

FIG. 1 is a block diagram illustrating a conventional temperature abnormality processing method, and FIG. 4 is a block diagram illustrating an embodiment processing method according to the present invention. In the figure, l...electronic equipment, c...power supply device, J...
AC input power supply, Hiro... No fuse breaker, Yo... Breaker Φ trip circuit, 6... Temperature -4t, 7f, g.
・Cooling device, temperature sensor, l. ...Light-emitting diode, //...Signal line, 12...Delay circuit, Hiro...Relay. In addition, in the figures, the same reference numerals indicate the same or corresponding parts. Atsushi 1 diagram

Claims (2)

[Claims] (1) A temperature abnormality processing method for an electronic device including a power supply device and a cooling device, which comprises: a detection means for detecting the temperature of the electronic device; a warning means for responding to a signal from the detection means; and a warning means for responding to a signal from the detection means; It consists of a damping means for cutting off the power supply device based on a signal with a time delay, and when an abnormal temperature occurs in the electronic device, the warning means is first energized, and then the damping is cut off after a predetermined period of time has elapsed. A temperature abnormality processing method for electronic equipment, characterized in that the means is energized. (2) Claim 1, characterized in that a delay means is provided between the detection means and the shrinking means.
Temperature abnormality processing method for electronic equipment described in Section 2.