JPS6159211A - Automatic measuring and judging apparatus - Google Patents

Abstract

PURPOSE:To enable simultaneous measurement and automatic judgement of many outputs, by installing comparators available for simultaneous multiple inputs and controllers for plural condition settings and measuring analog signals from a specimen apparatus by applying them. CONSTITUTION:A multi-input simultaneous comparator 13 equipped with many comparators 13-1-13-n available for responding to many analog signals 1-n from a specimen apparatus 20 and a controlling unit 11 controlled with a program available for setting a plurality of conditions are installed. Further, the many measuring signals 1-n from the specimen apparatus 20 are applied into the comparator 13 through a detector 17, and here, an automatic judgements in simultaneous and multiple fashion are conducted and further, such inspection becomes possible where a specimen apparatus controlling unit 14 is controlled by a controlling unit 13 with an accumulated program and condition of the specimen inspection apparatus 20 is changed. Thus simultaneous measurement and automatic judgement of many inputs become possible and reduction of inspecting operation and improvement of quality by increased inspection items can be attempted.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a device that measures analog signals and automatically determines the measurement results. In particular, the present invention relates to an automatic measurement/judgment device that can process multiple inputs simultaneously. The device of the present invention is suitable for implementation in a device that performs quality control by monitoring a large number of analog signals output as inspection results in a manufacturing process.

[Conventional technology]

In the conventional automatic determination measuring device, one input out of multiple inputs is selected and measurement and determination are repeated to perform measurement and determination of multiple inputs.

[Problem that the invention seeks to solve]

In the conventional automatic judgment measuring device described above, the time required to measure and judge one input multiplied by the number of inputs is required to measure and judge all multiple inputs, so it is used in the production process for mass-produced products. It is unsuitable as an inspection device. On the other hand, there is a drawback in that the inspection must be limited to items with the minimum required ratio without measuring and determining all of the inputs.

SUMMARY OF THE INVENTION The present invention solves the above-mentioned drawbacks and aims to provide an automatic determination measuring device that can simultaneously measure and determine all inputs.

[Means for solving problems]

The present invention provides a comparator that manually outputs an analog measurement signal and a comparison signal sent from a measurement point of a device under test, a comparison signal generator that changes the value of this comparison signal, and a state and a state of this comparison signal generator. An automatic measurement/judgment device comprising a measuring means for obtaining a measured value corresponding to the analog measurement signal based on the logical output of the comparator, and a judging means for judging the magnitude relationship between this measured value and a set reference value. As a means to solve the above-mentioned problems, a large number of comparators are provided corresponding to the analog measurement means described above, and a program-controlled state controller that can set a plurality of conditions related to the measurement of the device under test is installed. The measuring means and the determining means are characterized in that they include means for responding to the outputs of a plurality of comparators for each measurement condition set by the state controller.

[Effect]

For a device under test where measurements are performed at multiple measurement points under multiple conditions, the state controller applies measurement conditions one by one to the device under test, and performs measurements at multiple measurement points under these measurement conditions. is simultaneously executed by the measuring means, and a determination of the magnitude relationship with the reference value is executed by the determining means.

〔Example〕

DESCRIPTION OF THE PREFERRED EMBODIMENTS A device according to an embodiment of the present invention will be described below with reference to the drawings.

The figure is a block configuration diagram showing the configuration of the apparatus of this embodiment. First, the configuration of an apparatus according to an embodiment of the present invention will be explained based on the drawings. This embodiment device includes a control section 1, a comparison signal generator 12, a multi-input simultaneous comparator 13, and a device under test controller 1.
4, an operation section 15, a display section 16, and a detector 17, where the control section 11 includes a ROM 111 and a RAM.
112 and a CPU 113, and the multi-input simultaneous comparator 13 includes rnJ comparators 13-1 to 13-n.

The rnJ measurement outputs of the device under test 20 are r of the detector 17.
It is connected to each of the nJ measurement inputs, and the rnJ detection outputs of the detector 17 are connected to one input of the rnJ comparators 13-1 to 13-0 of the multi-input simultaneous comparator. The first input/output of the CPU 113 of the control unit 11 is the input of the comparison signal generator 12 and the rnJ comparators 13-1 to 13-.
output of n, input of the device under test controller 14 and operation section 1
5 and the input of the display section 16. It is connected to the input/output of the ROM III of the control unit 11, the input/output of the RAM 112, and the second human output of the CPU 113 so as to send and receive signals. The comparison output of the comparison signal generator 12 is rn
It is connected to each of the second inputs of J comparators 13-1 to 13-n. The rnJ state designation outputs of the device under test controller 14 are connected to the rmJ state designation inputs of the device under test 20.

Next, the operation of this embodiment device will be explained based on the drawings.

The storage program is written to the ROMill, and the RAM
At 112, this accumulated program is temporarily stored. Comparison signal generator 12 generates comparison signal 3, and detector 17
Then, each measurement signal 1 of the device under test 20 is converted from a measurement level detected at high impedance to a low impedance, thereby reducing measurement errors.

Comparators 13-1 to 13-n compare comparison signal 3 and detection output signal 2 to generate comparison signal 4. The device under test controller 4 generates a state designation signal 5 for controlling the state of the device under test 20 .

Now, the state of the device under test 20 is set by the control section 11 via the device under test controller 14 according to the stored program. Next, the control unit 11 generates a comparison signal generator 12.
is controlled, and the value of comparison signal 3 is determined. Comparator 13
Then, the value of the detection output signal 2 matched by the detector 17 is compared with the value of the comparison signal 3 and converted to a logic level, corresponding to the measurement signal of each measurement point of the device under test 20 at that time. A comparison output signal 4 is generated. Based on this comparison output signal 4, the control section 11 calculates a measurement value for each comparison output 3 according to the accumulation program, and the control section 11 calculates a measurement value for each comparison output 3 according to the accumulation program, and a value set in advance in the accumulation program or the operation section 15 corresponds to this measurement signal 1. The measured values and the determination results are compared with the values set in , and a determination of good or bad is made, and all measured values and determination results are displayed on the display unit 16 at the same time. Furthermore, if necessary, the control unit 11 performs control to change the state of the device under test 20 according to the stored program, and performs and displays multiple input simultaneous measurements and determinations.

〔Effect of the invention〕

As explained above, the present invention has a multi-input simultaneous comparator, in which automatic judgment is performed simultaneously, and the device to be tested controller is controlled by a control unit having a storage program to be tested. Since it is possible to inspect even when the state of the device is changed, it is possible to shorten the inspection process time and improve product quality by increasing the number of inspection items.

[Brief explanation of the drawing]

The figure is a block configuration diagram showing the configuration of an apparatus according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1...Measurement signal, 2...Detection output signal, 3...Comparison signal, 4...Comparison output signal, 5...State designation signal, lO...Automatic measurement determination device, 11...・;l1lJ
Control section, 12... Comparison signal generator, 13... Multi-input simultaneous comparator, 14... Device under test control section, 15... Operation section, 16... Display section, 17... Detection unit, 20...
・Device to be inspected.

Claims (1)

[Claims] (1) A comparator that inputs an analog measurement signal sent from a measurement point of the device under test and a comparison signal, a comparison signal generator that changes the value of this comparison signal, and the status of this comparison signal generator and the above. An automatic measurement/judgment device comprising a measuring means for obtaining a measured value corresponding to the analog measurement signal based on the logical output of a comparator, and a judging means for judging the magnitude relationship between this measured value and a set reference value, A plurality of the comparators are provided corresponding to the analog measurement signals, and the comparators are provided with a program-controlled state controller that can set a plurality of conditions related to the measurement of the device under test, and the measuring means and the determining means include: An automatic measurement/judgment device characterized by comprising means for responding to the outputs of the plurality of comparators for each measurement condition set by the state controller.