JPS6154266U - - Google Patents

Info

Publication number
JPS6154266U
JPS6154266U JP14000384U JP14000384U JPS6154266U JP S6154266 U JPS6154266 U JP S6154266U JP 14000384 U JP14000384 U JP 14000384U JP 14000384 U JP14000384 U JP 14000384U JP S6154266 U JPS6154266 U JP S6154266U
Authority
JP
Japan
Prior art keywords
probe
tube
tilted
respect
vertical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14000384U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14000384U priority Critical patent/JPS6154266U/ja
Publication of JPS6154266U publication Critical patent/JPS6154266U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本案装置の全体構造を示す一部破砕模
式的正面図、第2図は探触子ユニツトの平面断面
図、第3図は探傷器本体の信号処理回路を示すブ
ロツク図、第4図は本案装置の探傷波形図、第5
図は本案装置の効果を比較説明するための探傷波
形図である。 1……SAW鋼管、4……探傷器本体、10…
…探触子ホルダ、14……垂直探触子、15……
斜角探触子、18……シユー、41……発振器、
44……ゲート信号発生回路、141a,151
a……送信振動子、142a,152a……受信
振動子、A……探触子ユニツト。
Fig. 1 is a partially fragmented schematic front view showing the overall structure of the proposed device, Fig. 2 is a plan sectional view of the probe unit, Fig. 3 is a block diagram showing the signal processing circuit of the flaw detector main body, and Fig. 4 is a schematic front view showing the overall structure of the proposed device. The figure is a flaw detection waveform diagram of the proposed device, No. 5
The figure is a flaw detection waveform diagram for comparing and explaining the effects of the present device. 1... SAW steel pipe, 4... Flaw detector body, 10...
...Probe holder, 14...Vertical probe, 15...
Angle probe, 18... Shu, 41... Oscillator,
44...Gate signal generation circuit, 141a, 151
a... Transmitting transducer, 142a, 152a... Receiving transducer, A... Probe unit.

Claims (1)

【実用新案登録請求の範囲】 管の疵検査を内面側から行う超音波探傷装置に
おいて、 管内表面の法線に対して管の周方向に同角度傾
斜させた送信振動子及び受信振動子を備えた垂直
探触子と、 管内表面の法線に対して管の軸長方向に同角度
傾斜させ、また、管の周方向に超音波を伝播させ
、また、その反射波を受信すべく管内周面に対し
て傾斜させた送振動子及び受信振動子を備えた斜
角探触子と、 これら垂直探触子及び斜角探触子を収納し、ま
た、前記管の内面の曲率に整合する形状のシユー
を備えた探触子ホルダと、 前記垂直探触子及び斜角探触子夫々の送信振動
子に高周波を印加する発振器と、 前記垂直探触子及び斜角探触子夫々の受信振動
子にて検出される反射エコーを信号処理する信号
処理回路と、 前記垂直探触子及び斜角探触子夫々が捉える欠
陥からの反射エコー弁別のためのゲートを設定す
るゲート回路と を具備することを特徴とする超音波探傷装置。
[Scope of Claim for Utility Model Registration] An ultrasonic flaw detection device that inspects pipes for defects from the inner surface, comprising a transmitting transducer and a receiving transducer tilted at the same angle in the circumferential direction of the pipe with respect to the normal to the inner surface of the pipe. The vertical probe is tilted at the same angle in the axial direction of the tube with respect to the normal to the inner surface of the tube, and the ultrasonic wave is propagated in the circumferential direction of the tube, and the ultrasonic wave is propagated around the inner circumference of the tube in order to receive the reflected wave. A bevel probe having a transmitting transducer and a receiving transducer tilted with respect to the surface, and housing the vertical probe and the bevel probe, and also matching the curvature of the inner surface of the tube. a probe holder having a shaped shoe; an oscillator that applies a high frequency to a transmitting transducer of each of the vertical probe and the angle probe; and a receiver of the vertical probe and the angle probe, respectively. A signal processing circuit that processes reflected echoes detected by the vibrator, and a gate circuit that sets gates for distinguishing reflected echoes from defects captured by the vertical probe and the oblique probe, respectively. An ultrasonic flaw detection device characterized by:
JP14000384U 1984-09-13 1984-09-13 Pending JPS6154266U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14000384U JPS6154266U (en) 1984-09-13 1984-09-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14000384U JPS6154266U (en) 1984-09-13 1984-09-13

Publications (1)

Publication Number Publication Date
JPS6154266U true JPS6154266U (en) 1986-04-11

Family

ID=30698363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14000384U Pending JPS6154266U (en) 1984-09-13 1984-09-13

Country Status (1)

Country Link
JP (1) JPS6154266U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002257794A (en) * 2001-03-02 2002-09-11 Sumitomo Metal Ind Ltd Ultrasonic flaw detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002257794A (en) * 2001-03-02 2002-09-11 Sumitomo Metal Ind Ltd Ultrasonic flaw detection method
JP4524937B2 (en) * 2001-03-02 2010-08-18 住友金属工業株式会社 Ultrasonic flaw detection method

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