JPS6154184A - 加熱処理装置 - Google Patents
加熱処理装置Info
- Publication number
- JPS6154184A JPS6154184A JP17341584A JP17341584A JPS6154184A JP S6154184 A JPS6154184 A JP S6154184A JP 17341584 A JP17341584 A JP 17341584A JP 17341584 A JP17341584 A JP 17341584A JP S6154184 A JPS6154184 A JP S6154184A
- Authority
- JP
- Japan
- Prior art keywords
- heat
- temperature
- heat treatment
- treated object
- radiation source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Radiation Pyrometers (AREA)
- Discharge Heating (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17341584A JPS6154184A (ja) | 1984-08-22 | 1984-08-22 | 加熱処理装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17341584A JPS6154184A (ja) | 1984-08-22 | 1984-08-22 | 加熱処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6154184A true JPS6154184A (ja) | 1986-03-18 |
JPH0552445B2 JPH0552445B2 (enrdf_load_stackoverflow) | 1993-08-05 |
Family
ID=15960012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17341584A Granted JPS6154184A (ja) | 1984-08-22 | 1984-08-22 | 加熱処理装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6154184A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0214543A (ja) * | 1988-02-17 | 1990-01-18 | Internatl Standard Electric Corp | ウエハまたは薄層の温度を測定および制御する方法および装置 |
JPH04106782U (ja) * | 1991-02-28 | 1992-09-14 | スタンレー電気株式会社 | 車両用超音波式障害物検出装置 |
JP2000323544A (ja) * | 1999-03-29 | 2000-11-24 | Eaton Corp | 半導体ウエハの放射率決定方法およびその装置 |
JP2015070045A (ja) * | 2013-09-27 | 2015-04-13 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びプログラム |
-
1984
- 1984-08-22 JP JP17341584A patent/JPS6154184A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0214543A (ja) * | 1988-02-17 | 1990-01-18 | Internatl Standard Electric Corp | ウエハまたは薄層の温度を測定および制御する方法および装置 |
JPH04106782U (ja) * | 1991-02-28 | 1992-09-14 | スタンレー電気株式会社 | 車両用超音波式障害物検出装置 |
JP2000323544A (ja) * | 1999-03-29 | 2000-11-24 | Eaton Corp | 半導体ウエハの放射率決定方法およびその装置 |
JP2015070045A (ja) * | 2013-09-27 | 2015-04-13 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びプログラム |
Also Published As
Publication number | Publication date |
---|---|
JPH0552445B2 (enrdf_load_stackoverflow) | 1993-08-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |