JPS6153743B2 - - Google Patents
Info
- Publication number
- JPS6153743B2 JPS6153743B2 JP54030256A JP3025679A JPS6153743B2 JP S6153743 B2 JPS6153743 B2 JP S6153743B2 JP 54030256 A JP54030256 A JP 54030256A JP 3025679 A JP3025679 A JP 3025679A JP S6153743 B2 JPS6153743 B2 JP S6153743B2
- Authority
- JP
- Japan
- Prior art keywords
- output
- circuit
- logic
- flip
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 38
- 108010076504 Protein Sorting Signals Proteins 0.000 claims description 15
- 238000009795 derivation Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 description 9
- 229920000747 poly(lactic acid) Polymers 0.000 description 7
- 239000011159 matrix material Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000003491 array Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025679A JPS55123745A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
| FR8005815A FR2451672A1 (fr) | 1979-03-15 | 1980-03-14 | Circuit logique integre pour l'execution de tests |
| GB8008774A GB2049958B (en) | 1979-03-15 | 1980-03-14 | Integrated logic circuit adapted to performance tests |
| DE3009945A DE3009945C2 (de) | 1979-03-15 | 1980-03-14 | Funktionsprüfbarer, integrierter Schaltkreis |
| US06/130,687 US4366393A (en) | 1979-03-15 | 1980-03-17 | Integrated logic circuit adapted to performance tests |
| GB08311223A GB2125170B (en) | 1979-03-15 | 1983-04-25 | Integrated logic circuit adapted to performance tests |
| US06/545,608 US4536881A (en) | 1979-03-15 | 1983-10-27 | Integrated logic circuit adapted to performance tests |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025679A JPS55123745A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55123745A JPS55123745A (en) | 1980-09-24 |
| JPS6153743B2 true JPS6153743B2 (cg-RX-API-DMAC10.html) | 1986-11-19 |
Family
ID=12298618
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3025679A Granted JPS55123745A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55123745A (cg-RX-API-DMAC10.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4513418A (en) * | 1982-11-08 | 1985-04-23 | International Business Machines Corporation | Simultaneous self-testing system |
| US4503537A (en) * | 1982-11-08 | 1985-03-05 | International Business Machines Corporation | Parallel path self-testing system |
-
1979
- 1979-03-15 JP JP3025679A patent/JPS55123745A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55123745A (en) | 1980-09-24 |
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